Skip Nav Destination
The International Symposium for Testing and Failure Analysis (ISTFA) is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. The ISTFA conference traces its origins to the 1970s. The conference was acquired by ASM International in 1986 and has been sponsored by ASM ever since.
For information on subscription access to ISTFA Proceedings, contact the ASM Online Database Manager:
All material published by ASM International is protected under United States and international copyright and intellectual property laws. Prior written consent is required to reuse or reproduce any ASM material. Please be aware that there may be fees involved when material held under copyright is reproduced or translated.
Comments and questions about ISTFA Proceedings can be sent to matinfo@asminternational.org.
About ISTFA Proceedings
The International Symposium for Testing and Failure Analysis (ISTFA) is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. The ISTFA conference traces its origins to the 1970s. The conference was acquired by ASM International in 1986 and has been sponsored by ASM ever since.
How to Purchase
For information on subscription access to ISTFA Proceedings, contact the ASM Online Database Manager:
Telephone: +440.338.5151
Email: onlinedbsales@asminternational.org
Rights and Permissions
All material published by ASM International is protected under United States and international copyright and intellectual property laws. Prior written consent is required to reuse or reproduce any ASM material. Please be aware that there may be fees involved when material held under copyright is reproduced or translated.
Provide Feedback
Comments and questions about ISTFA Proceedings can be sent to matinfo@asminternational.org.