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Proceedings Papers

ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis

IPFA Best Paper

Advanced Techniques

Failure Analysis Process


Sample Preparation

Reverse Engineering

System Level Analysis

Circuit Edit

Package Level Failure Analysis

Scanning Probe Analysis


Test, Diagnostics, and Yield Enhancement

Detecting and Preventing Counterfeit Microelectronics

Volume Information

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