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Proceedings Papers

ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis

IPFA 2010 Best Paper

Advanced Techniques

Failure Analysis Process

Package Level Failure Analysis

Sample Preparation

In-Line Metrology and Inspection

Energy and Space Applications

System Level Analysis

Photon Based Techniques

Poster Session

Sensors, Discretes, and Optoelectronic Devices

Test, Diagnostics, and Yield Enhancement

Circuit Edit

Detecting and Preventing Counterfeit Microelectronics


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