1-20 of 62 Search Results for

wavelength-dispersive spectrometry

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... Abstract This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... a microscopic part of a solid specimen bombarded by a beam of accelerated electrons. It provides information on the various aspects of energy-dispersive spectrometry (EDS) and wavelength-dispersive spectrometry (WDS), and elucidates the qualitative analysis of the major constituents of EDS and WDS. The article...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... spectrometry, and wavelength-dispersive spectrometry. The article concludes with information on specimen handling. backscattered electron imaging economy test elemental composition analysis energy-dispersive spectrometry failure analysis metals microchemical analysis referee test specimen...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
... Abstract This article provides an introduction to x-ray spectrometry, and discusses the role of electromagnetic radiation, x-ray emission, and x-ray absorption. It focuses on the instrumentation of wavelength-dispersive x-ray spectrometers, and energy dispersive x-ray spectrometers (EDS...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... electron microscopy; XRF, x-ray fluorescence; XPS, x-ray photoelectron spectroscopy; WDS, wavelength dispersion spectrometry; Z , atomic number; TEM, transmission electron microscopy. Source: Ref 8 X-Ray Fluorescence Spectrometry (XRFS) X-ray fluorescence spectrometry (XRFS) is an instrumental...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... fracture of the bolt. Wavelength-dispersive spectrometry was readily able to quantify the phosphorus in the steel and show the depth of diffusion from the surface. Fig. 12 Wavelength-dispersive spectrometer (WDS) analysis results showing diffusion of phosphorus from the outer surface...
Image
Published: 01 November 1995
Fig. 1 Typical configuration for wavelength-dispersion x-ray fluorescence spectrometry More
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... scattering energy-dispersive spectrometry wavelength-dispersive spectrometry Overview Introduction X-ray spectroscopy, or x-ray fluorescence (XRF) spectrometry, is an emission spectroscopic technique that has found wide application in elemental identification and determination. The technique...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006647
EISBN: 978-1-62708-213-6
... in spectroscopic sources, such as the ICP-OES, correspond to wavelengths in the ultraviolet and visible region of the electromagnetic spectrum. The radiation is collected and dispersed by a spectrometer into characteristic component wavelengths, allowing the element by element analysis of the sample analyte...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... is concerned with the precise mea- aromatic. In organic chemistry, pertaining to transmits light without dispersing it into its surement of amount. A variety of physical or characterized by the presence of at least component wavelengths. See also achro- measurements are used, including methods one benzene ring...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001729
EISBN: 978-1-62708-178-8
... wavelength: (Eq 3) Δ E = h c λ The energies of the photons emitted by excited atoms in spectroscopic sources, such as the inductively coupled plasma, correspond to wavelengths in the ultraviolet and visible region of the electromagnetic spectrum. A spectrometer is used to disperse...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... of field that transmits light without dispersing it tural units; quantitative analysis is con- and can result from design or execution, into its component wavelengths. See also cerned with the precise measurement of or both. achromatic lens, apochromatic lens. amount. A variety of physical measure- ments...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... ratio Γ magnetic resonance linewidth Δ change in quantity; an increment; a range θ diffraction angle λ wavelength μ linear absorption coefficient μA microampere μin. microinch μL microliter μm micron (micrometer) μ M...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
... Absorption Spectrometry” in this Volume). The spectral region of interest extends from 200 to 800 nm. The short-wavelength (200 nm) high-energy end of this spectral region is defined by the fact that below 200 nm oxygen and nitrogen in the atmosphere begin to absorb the radiant energy. The region below...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
... scattering angles, the difference between the refractive indexes of the particle sphere and the continuum, the wavelength of the incident radiation, and the diameter of the sphere. As sphere or particle size increases from 1/10; to 10 times the size of incident light (0.63 μm, or 0.025 mil, for a helium-neon...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... in the mid-1800s, yet they remain some of the most useful and flexible means of performing elemental analysis. See the article “Optical Emission Spectroscopy” in this Volume for detailed discussion. Free atoms, when placed in an energetic environment, emit light at a series of narrow wavelength intervals...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... Electron Microscopy Scanning electron microscopy (SEM) is a method for high-resolution imaging of surfaces. The SEM uses electrons for imaging, much as a light microscope uses visible light. The much shorter wavelength of an electron beam compared with visible light results in the improvement...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... of metal particles. If the instrument is calibrated with known standards, the analysis is semiquantitative. Should quantification be required, the scanning electron microprobe, a scanning electron microscope equipped with wavelength-dispersive detectors (WDS), enables quantitative analysis of samples...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... vacancies in electron microprobes and some scanning electron microscopes. Particle-induced x-ray emission uses beams of energetic ions, normally protons of a few mega electron volts, to create inner electron shell vacancies. Regarding detection, the most widely used methods involve wavelength dispersion...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... characteristic of elements present at the surface. Elemental identification of the surface species Wavelength dispersive x-ray spectroscopy (WDS) The principle is the same as that for EDS except the emitted x-rays are measured one wavelength at a time. Elemental identification of the surface species...