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wavelength-dispersive spectrometry

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... Abstract This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... spectrometry, and wavelength-dispersive spectrometry. The article concludes with information on specimen handling. backscattered electron imaging economy test elemental composition analysis energy-dispersive spectrometry failure analysis metals microchemical analysis referee test specimen...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... a microscopic part of a solid specimen bombarded by a beam of accelerated electrons. It provides information on the various aspects of energy-dispersive spectrometry (EDS) and wavelength-dispersive spectrometry (WDS), and elucidates the qualitative analysis of the major constituents of EDS and WDS. The article...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
... Abstract This article provides an introduction to x-ray spectrometry, and discusses the role of electromagnetic radiation, x-ray emission, and x-ray absorption. It focuses on the instrumentation of wavelength-dispersive x-ray spectrometers, and energy dispersive x-ray spectrometers (EDS...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... electron microscopy; XRF, x-ray fluorescence; XPS, x-ray photoelectron spectroscopy; WDS, wavelength dispersion spectrometry; Z , atomic number; TEM, transmission electron microscopy. Source: Ref 8 X-Ray Fluorescence Spectrometry (XRFS) X-ray fluorescence spectrometry (XRFS) is an instrumental...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
.... Diffusion of excessive phosphorus into the steel during heat treatment led to brittle fracture of the bolt. Wavelength-dispersive spectrometry was readily able to quantify the phosphorus in the steel and show the depth of diffusion from the surface. Fig. 12 Wavelength-dispersive spectrometer (WDS...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... scattering energy-dispersive spectrometry wavelength-dispersive spectrometry References 1. Reece R.M. , Reed A.J. , Clark C.S. , Angoff R.C. , Casey K.R. , Challop R.S. , and McCabe E. , Elevated Blood Lead and the In Situ Analysis...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006647
EISBN: 978-1-62708-213-6
... Ultra-Violet Wavelengths , Spectrochim. Acta B, At. Spectrosc. , Vol 37 , 1982 , p 1069 – 1073 , 10.1016/0584-8547(82)80036-0 45. Wu P. , Wu X. , Hou X. , and Young C.G. , Inductively Coupled Plasma/Optical Emission Spectrometry (ICP/OES) , Appl. Spectrosc. Rev. , Vol...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001729
EISBN: 978-1-62708-178-8
... to disperse such emitted radiation into its component wavelengths and to measure the intensity of each component. The ICP as an analytical technique provides the capability of performing simultaneous multielement analysis for as many as 60 elements within 1 to 2 min; applicability to most elements...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... identification Corrosion failure inspection Surface contamination evaluation Scanning electron microscopy (SEM) is a method for high-resolution imaging of surfaces. The SEM uses electrons for imaging, much as a light microscope uses visible light. The much shorter wavelength of an electron beam...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... in an energetic environment, emit light at a series of narrow wavelength intervals. These intervals, termed emission lines, form a pattern—the emission spectrum—that is characteristic of the atom generating it. The energetic environment typically is a type of plasma, and the device used to produce such a plasma...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
.... These lamps are termed white light sources because they emit light at all wavelengths within their spectral ranges. The analytical wavelength may be selected by a filter that allows passage of only those wavelengths near the analytical wavelength or by a monochromator that disperses the white light...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
... of a prescribed wavelength (1.541 Å for copper Kα) is directed at the surface of a specimen at a given angle. In order for the diffracted rays to be detected, they must be in phase with each other. The second wave travels through the additional distance ML + LN (refer to Fig. 2 ); this total length then must...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... be required, the scanning electron microprobe, a scanning electron microscope equipped with wavelength-dispersive detectors (WDS), enables quantitative analysis of samples with closely adjacent spectral peaks. For surface analysis of metal powders, x-ray photoelectron spectroscopy (XPS) and Auger electron...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... ratio Γ magnetic resonance linewidth Δ change in quantity; an increment; a range θ diffraction angle λ wavelength μ linear absorption coefficient μA microampere μin. microinch μL microliter μm micron (micrometer) μ M...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... of elements present at the surface. Elemental identification of the surface species Wavelength dispersive x-ray spectroscopy (WDS) The principle is the same as that for EDS except the emitted x-rays are measured one wavelength at a time. Elemental identification of the surface species with higher...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... of energetic ions, normally protons of a few mega electron volts, to create inner electron shell vacancies. Regarding detection, the most widely used methods involve wavelength dispersion, which is scattering from a crystal, or energy dispersion, which involves direct conversion of x-ray energy into electronic...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001777
EISBN: 978-1-62708-178-8
... phase. The ultraviolet/visible (UV/VIS) absorbance detector is currently the most popular detector of this type because most compounds absorb 190- to 700-nm wavelength radiation, and many other compounds that have no absorption can be chemically reacted to form an absorbing species. There are three...