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wavelength-dispersive X-ray fluorescence spectroscopy

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... by information on the operating principles and applications of detectors for x-ray spectroscopy, namely energy-dispersive spectrometers, wavelength-dispersive spectrometers, and handheld x-ray fluorescence systems. The processes involved in x-ray analysis in the SEM and handheld x-ray fluorescence analysis...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... spectroscopy used for elemental identification and determination. It begins with an overview of the operating principles of X-ray fluorescence (XRF) spectrometer, as well as a comparison of the operating principles of wavelength-dispersive spectrometer (WDS) and energy-dispersive spectrometer (EDS...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
...-induced grain-boundary migration. The concentration levels mapped extend down to approximately 0.5% Zn, with a maximum concentration of 10% in the field. Source: Ref 20 Fig. 12 Direct map of the defocusing of a wavelength-dispersive spectrometer during an x-ray area scan across a pure-element...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... up and operate. Only one element can be measured at a time because single wavelength light sources are used for each element, which makes AAS inappropriate for qualitative analysis. X-ray fluorescence spectroscopy (XRF) operates on similar physical principles to OES, but it excites the sample...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... an energy dispersive x-ray detector, but subsequent quantitative analyses are done using the wavelength dispersive crystal spectrometers (WDS). As described in the section on x-ray fluorescence spectroscopy in the article “Bulk Elemental Analysis” and illustrated in Fig. 4–6, wavelength dispersive x-ray...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
... Absorption Interelement Effects Instrumentation Wavelength-Dispersive X-Ray Spectrometers Emission L Lines M Lines Fluorescent Yield K Lines Absorption Edges Relationships Between Elements and X-Rays Absorption Mass Absorption Coefficients Fundamentals of Operation...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
...-ray spectra are excited when a specimen is irradiated with a beam of sufficiently short-wavelength x-ray radiation. Intensities of the resulting fluorescent x-rays are smaller by a factor of roughly 1000 than an x-ray beam obtained by direct excitation from a beam of electrons. Only availability...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
...Abstract Abstract This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006666
EISBN: 978-1-62708-213-6
... (a) Solution standards (b) Ground rock standards (c) Aerosol standards (d) Aerosol samples (e) PIXE 7 1.03 ± 0.16 0.99 ± 0.29 0.99 ± 0.19 0.98 ± 0.08; 1.01 ± 0.16 X-ray fluorescence (XRF) 8 0.97 ± 0.12 1.07 ± 0.20 1.03 ± 0.14 0.97 ± 0.08; 1.08 ± 0.15 Wavelength XRF 3 1.19 ± 0.34...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001734
EISBN: 978-1-62708-178-8
... methods involve wavelength dispersion, which is scattering from a crystal, or energy dispersion, which involves direct conversion of x-ray energy into electronic pulses in silicon or germanium diodes. These methods all provide quantitative analyses of elemental content, yet the differences between...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
...)-traceable standard composition. Equipment used for the analysis must receive proper maintenance, including assurance that adequate calibrations have been upheld. Methods such as x-ray fluorescence (XRF), arc or spark optical emission spectroscopy (OES), and inductively coupled plasma OES (ICP-OES) can...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... width W watt W load; weight of body; abrasive wear resistance; wear volume WDS wavelength-dispersive spectrometer WPC wear particle concentration WRP work removal parameter wt% weight percent XPS x-ray photoelectron spectroscopy XRD x-ray...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... characteristic of elements present at the surface. Elemental identification of the surface species Wavelength dispersive x-ray spectroscopy (WDS) The principle is the same as that for EDS except the emitted x-rays are measured one wavelength at a time. Elemental identification of the surface species...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
.... If this information is not available, rapid, nondestructive, semiquantitative techniques such as energy-dispersive x-ray spectroscopy (EDS) and portable x-ray fluorescence (XRF) tools can be used to estimate the material composition in order to allow the chemical analyst to determine the proper techniques...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... detector (silicon or germanium solid-state detector). Energy-dispersive x-ray spectroscopy enables the qualitative and quantitative chemical analysis of elements with an atomic number ≥5 (boron). x-ray detection may also be carried out by wavelength-dispersive spectrometers, which consist of a crystal...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006063
EISBN: 978-1-62708-172-6
... of KTA-Tator, Inc. Fig. 26 Scanning electron microscope. Courtesy of KTA-Tator, Inc. Fig. 27 Resolved image acquired by scanning electron microscopy-energy dispersive x-ray spectroscopy, with associated spectrum. Courtesy of KTA-Tator, Inc. Fig. 28 Spectrum obtained using...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... electron microscopy; XRF, x-ray fluorescence; XPS, x-ray photoelectron spectroscopy; WDS, wavelength dispersion spectrometry; Z , atomic number; TEM, transmission electron microscopy. Source: Ref 8 X-Ray Fluorescence Spectrometry (XRFS) X-ray fluorescence spectrometry (XRFS) is an instrumental...