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void-free structures
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Published: 01 August 2018
of adhesive. (b) Method 4 uses two chamfered aluminum sheets of different thicknesses with drilled holes 9.5 or 13 mm ( 3 8 or 1 2 in.) in diameter (free of adhesive) and edge voids made by inserting Teflon shims of the size shown. Shims must be removed after bonding. This standard can
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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009077
EISBN: 978-1-62708-177-1
... composite cross section having prepreg ply terminations within the part is shown in Fig. 1 . In this figure, the number of prepreg plies and ply terminations can easily be observed, as well as how the adjacent plies accommodate the ply-drops. Where both ply terminations are found, the area is free of voids...
Abstract
Analyzing the structure of composite materials is essential for understanding how the part will perform in service. Assessing fiber volume variations, void content, ply orientation variability, and foreign object inclusions helps in preventing degradation of composite performance. This article describes the optical microscopy and bright-field illumination techniques involved in analyzing ply terminations, prepreg plies, splices, and fiber orientation to provide the insight necessary for optimizing composite structure and performance.
Book Chapter
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006457
EISBN: 978-1-62708-190-0
... the heat-up rate. Thick glue lines occur in a bonded assembly due to inadequate mating of the facing sheets or blocked fixing rivets, and they result mostly in porosity and voids. However, a thick glue line made with added layers of adhesive is usually free of porosity. Porosity has a significant...
Abstract
Adhesive-bonded joints are extensively used in aircraft components and assemblies where structural integrity is critical. This article addresses the problem of how to inspect bonded assemblies so that all discrepancies are identified. It describes several inspection techniques and presents drawbacks and limitations of these techniques. Generic flaw types and flaw-producing mechanisms are listed in a table. The article discusses metal-to-metal defects, adherend defects, honeycomb sandwich defects, repair defects, and in-service defects. It reviews the methods applicable to the inspection of bonded structures, including visual inspection, ultrasonic inspection, X-ray radiography, and neutron radiography. The evaluation and correlation of inspection results are also discussed. The article concludes with information on the effects of ultrasonic wave interference in the ultrasonic inspection of adhesive-bonded joints.
Series: ASM Handbook
Volume: 22A
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.hb.v22a.a0005458
EISBN: 978-1-62708-196-2
... wetting and essentially defect-free interfaces, whereas different sites may contain unsealed nanovoids that can grow in size. Based on the experimental observations, initial void growth thus appears to occur along particle-matrix interfaces in a manner similar to crack propagation, with only slight...
Abstract
Any model that describes the early stage of cavitation must therefore address experimental observations of continuous nucleation, cracklike interface cavities, cavity growth from nanometer-scale sizes, and debonding at particle interfaces and formation of large-faceted cavities. This article summarizes the microstructural details of the early stages of cavitation in metals for understanding the interface-constrained plasticity cavitation model. It discusses formulation, predictions and implications, involved in analysis of cavitation under constrained conditions.
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006827
EISBN: 978-1-62708-329-4
.... The IPC-A-610G standard defines a maximum allowable void rate of 30% projection area under x-ray observation for BGA solder balls ( Ref 25 ). However, for the thermal pad, it is recommended to have a maximum 50% void rate to guarantee thermal conductivity. For solder joints where structural strength...
Abstract
Due to the recent requirement of higher integration density, solder joints are getting smaller in electronic product assemblies, which makes the joints more vulnerable to failure. Thus, the root-cause failure analysis for the solder joints becomes important to prevent failure at the assembly level. This article covers the properties of solder alloys and the corresponding intermetallic compounds. It includes the dominant failure modes introduced during the solder joint manufacturing process and in field-use applications. The corresponding failure mechanism and root-cause analysis are also presented. The article introduces several frequently used methods for solder joint failure detection, prevention, and isolation (identification for the failed location).
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003791
EISBN: 978-1-62708-177-1
... optical microscope and SEM analyses. For example, it is possible to determine positively whether a void is true porosity or the result of pullout by analyzing for encapsulating material in the void ( Ref 7 ). A void free of encapsulating material is the result of pullout during specimen preparation...
Abstract
This article reviews how process variations influence the characteristics of thermal spray coatings. It describes various specimen preparation techniques, which allow accurate microstructural analysis. These techniques include sectioning, cleaning, mounting, planar grinding, fine grinding, rough polishing, and etching. The article provides information on the problems associated with specimen preparation. It concludes with a discussion on the various methods of analysis for thermal spray coatings.
Book: Surface Engineering
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001286
EISBN: 978-1-62708-170-2
... 2 . Growth and coalescence of the nuclei can leave interfacial voids or structural discontinuities at the interface, particularly if there is no chemical interaction between the nuclei and the substrate material and dewetting growth occurs. In cases where there is little chemical interaction...
Abstract
This article describes eight stages of the atomistic film growth: vaporization of the material, transport of the material to the substrate, condensation and nucleation of the atoms, nuclei growth, interface formation, film growth, changes in structure during the deposition, and postdeposition changes. It also discusses the effects and causes of growth-related properties of films deposited by physical vapor deposition processes, including residual film stress, density, and adhesion.