Metal transparency and interaction with X-rays have been recognized as obvious candidate principles from which methods for in situ monitoring of solidification processes could be developed. This article describes the use of X-ray imaging-based techniques to investigate interface morphology evolution, solute transport, and various process phenomena at spatiotemporal resolutions. It discusses the three viable imaging techniques made available by synchrotron radiation for the real-time investigation of solidification microstructures in alloys. These include two-dimensional X-ray topography, two-dimensional X-ray radiography, and ultra-fast three-dimensional X-ray tomography.

Tungsten, molybdenum, and cemented carbide parts can be produced using several additive manufacturing technologies. This article classifies the most relevant technologies into two groups based on the raw materials used: powder-bed methods, such as selective laser melting, electron beam melting, and binder jet three-dimensional (3-D) printing, and feedstock methods, such as fused-filament fabrication and thermoplastic 3-D printing. It discusses the characteristics, processing steps, properties, advantages, limitations, and applications of these technologies.

This article is intended to provide the reader with a good understanding of the underlying science, technology, and the most common applications of focused ion beam (FIB) instruments. It begins with a survey of the various types of FIB instruments and their configurations, discusses the essential components, and explains their function only to the extent that it helps the operator obtain the desired results. An explanation of how the components of ion optical column shape and steer the ion beam to the desired target locations is then provided. The article also reviews the many diverse accessories and options that enable the instrument to realize its full potential across all of the varied applications. This is followed by a detailed analysis of the physical processes associated with the ion beam interacting with the sample. Finally, a complete survey of the most prominent FIB applications is presented.