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transmitted-light microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
... of fiber-reinforced polymeric composites for examination by transmitted light microscopy. It provides information on the contrast-enhancement methods used by transmitted-light microscopy and optimization of microscope conditions. Examples of composite ultrathin sections analyzed using transmitted-light...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi-fluorescence. The article also provides information on transmitted light microscopy. References References 1. Mallick P.K. , Fiber-Reinforced Composites, Materials...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009082
EISBN: 978-1-62708-177-1
... illumination, 25× objective Fig. 7 An area in Fig. 5 viewed using reflected-light phase contrast with the same magnification as Fig. 6 . Notice the shading on the outer edges of the micrograph due to this contrast technique. Fig. 8 Transmitted-light microscopy of the natural fiber...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009094
EISBN: 978-1-62708-177-1
..., “Special Sample Preparation and Polishing,” D. Jean Ray for her contributions to the article, “Thin-Section Preparation and Transmitted Light Microscopy,” and Anthony Falcone for his contributions to the article “The Effects of Lightning Strikes on Polymeric Composites.” ...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical microscopy. References References 1. Abromowitz M. , Contrast Methods in Microscopy: Transmitted Light , Basics and Beyond , Olympus Corp., Lake Success, NY...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009083
EISBN: 978-1-62708-177-1
... composite part to be able to use all of the contrast techniques of transmitted-light microscopy. Figure 1 shows an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. The 3k-70 plain weave carbon fibers are visible as a black mass...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
.... In the following figures, ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast techniques to determine the phases. Figure 1 shows a cross section of a carbon-fiber-reinforced composite that has a very small dispersed-rubber phase in the matrix...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... requirements. For example, reflected light microscopy is common in the imaging of metallic microstructures, while transmitted light microscopy can be more effectively used in the microstructural imaging of polymers (where specimens may allow more light transmission). The choice of method also depends...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009072
EISBN: 978-1-62708-177-1
... life. For producing samples for transmitted-light analysis (see the article “Thin-Section Preparation and Transmitted-Light Microscopy” ), this mold geometry is necessary. Fig. 16 Preparation steps for the development of a manual polishing mount. (a) Backup sides with three specimens...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009081
EISBN: 978-1-62708-177-1
...-matrix composite. Transmitted polarized light, full wave plate, 20× objective Abstract Abstract This article describes methods for analyzing impact-damaged composites in the aircraft industry. These include C-scan and x-radiography methods and optical microscopy. The article reviews brittle...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009071
EISBN: 978-1-62708-177-1
... or crack identification. If reflected techniques do not yield the required information, transmitted-light optical microscopy can provide insights into the microstructures of these materials that would otherwise remain hidden when using standard bulk metallographic preparation techniques and reflected...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... light and dark contrast in the image. Grains that transmitted a high percentage of the incident beam appear bright, and those that diffracted more of the incident beam appear dark. Figure 17 shows an example of this type of grain contrast. Fig. 17 Transmission electron microscopy grain...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... microscopy are covered in the Section “Metallography” and will not be repeated here. While light microscopy is an important metallurgical tool, it has a number of limitations: Spatial resolution: Conventional light microscopes cannot resolve features smaller than ∼1 μm. Depth of field: Light...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... Diffraction , Adv. Imag. Electron Phys. , Vol 170 , 2012 , p 1 – 63 10.1016/B978-0-12-394396-5.00001-4 Microstructure observation is an essential approach for materials characterization, which is primarily performed by using light optical microscopy and then scanning electron microscopy (SEM...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... to the visible light ray path through the ground glass lenses in an optical microscope configured to operate in the transmitted-light mode (except that the electron follows a spiral path through the lens as it is focused, while light is focused through the lens in a plane in an optical microscope). Consequently...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... of the three Faraday effect geometries identified by the relative orientation of the incident polarized light transmitted compared to the magnetization direction. (a) Longitudinal Faraday effect: oblique incidence of polarized light transmitted through a material with magnetization in the plane of the sample...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009085
EISBN: 978-1-62708-177-1
... of the reflected-light sample to an ultrathin-section sample revealed more information about the heat generation created by the lightning strike. The vaporized and degraded matrix in the first ply can easily be seen by using transmitted-light optical microscopy. Deeper under the damage zone, areas of matrix...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
.... Source: Ref 32 Fig. 28 Three-dimensional isosurface view of the reconstructed degenerate ferrite sheaf. This rendering of the three-dimensional body highlights the sidewalls as different shades of gray, depending on their orientation with respect to the light source (emanating from the top...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... polarized light reveals the packet size by contrast differences. Tint etched in 10% Na 2 S 2 O 5 . 100× Fig. 35 Principles of phase contrast microscopy Fig. 16 Relationship between the resolution possible with an incident-light microscope and the numerical aperture of the objective lens...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... components generally refers to reflected light microscopy. In this method, light is reflected from the sample surface through the microscope objective to an eyepiece, view screen, or camera. Transmitted light is occasionally used for transparent and translucent materials. For low-magnification work...