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transmission electron microscopy
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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... Abstract Transmission electron microscopy (TEM) approach enables essentially simultaneous examination of microstructural features through imaging from lower magnifications to atomic resolution and the acquisition of chemical and crystallographic information from small regions of the thin...
Abstract
Transmission electron microscopy (TEM) approach enables essentially simultaneous examination of microstructural features through imaging from lower magnifications to atomic resolution and the acquisition of chemical and crystallographic information from small regions of the thin specimen. This article discusses fundamentals of the technique, especially for solving materials problems. Background information is provided to help understand basic operations and principles, including instrumentation, the physics of signal generation and detection, image formation, electron diffraction, and spectrometry techniques with data analysis.
Book Chapter
Book: Fractography
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... fractographs with illustrations. cleaning fractograph fracture surface scanning electron microscopy specimen replication transmission electron microscopy THE APPLICATION of the transmission electron microscope to the study of fracture surfaces and related phenomena made it possible to obtain...
Abstract
The application of transmission electron microscope to the study of fracture surfaces and related phenomena has made it possible to obtain magnifications and depths of field much greater than those possible with light (optical) microscopes. This article reviews the methods for preparing single-stage, double-stage, and extraction replicas of fracture surfaces. It discusses the types of artifacts and their effects on these replicas, and provides information on shadowing of replicas. The article concludes with a comparison of the transmission electron and scanning electron fractographs with illustrations.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... Abstract Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information...
Abstract
Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics, electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can be solved, at least in part, with AEM.
Image
Published: 01 December 1998
Fig. 8 Light microscopy and transmission electron microscopy (thin foil) views of AISI 8620 alloy steel after tempering at various temperatures. All specimens were water quenched from 900 °C (1650 °F) prior to tempering. Light microscopy: 2% nital, 500×; TEM: 25,000×
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Published: 01 December 1998
Fig. 9 Light microscopy and transmission electron microscopy (thin foil) views of AISI 5160 alloy steel after tempering at various temperatures. All specimens were oil quenched from 803 °C (1525 °F) prior to tempering. Light microscopy: 2% nital, 500×; TEM: 25,000×
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Image
Published: 01 June 2016
Fig. 4 (a) Transmission electron microscopy and (b) high-resolution transmission electron microscopy images of β″ precipitates in Al-0.64Mg-0.69Si alloy after 36 h of artificial aging at 175 °C (350 °F). Both images were taken along a ⟨001⟩ α direction. The mean particle cross section is 5.3
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Image
Published: 01 June 2016
Fig. 24 Bright-field transmission electron microscopy image in the ⟨110⟩ α direction of Al-4Cu-0.1Mg-0.62Ag alloy aged for 1000 h at 250 °C (480 °F). It features Ω and θ′ precipitates. Source: Ref 174
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Published: 01 June 2016
Fig. 28 High-angle annular dark-field scanning transmission electron microscopy age of η′ precipitate in a 7449 alloy in the T6 state. Courtesy of S.J. Andersen and C.D. Marioara. For further explanation, see Ref 202 .
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Image
Published: 01 October 2014
Fig. 6 Plan view thin-foil bright-field transmission electron microscopy image showing grains A, B, and C of expanded austenite and their respective selected-area electron diffraction patterns. Some phase-decomposition regions are indicated on the B grain surface (white arrows
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Published: 01 October 2014
Fig. 30 Transmission electron microscopy studies performed on plasma-nitrided specimens at 400 °C (750 °F) for 20 h and then annealed at 400 °C for 20 h (a and b) and 600 °C (1110 °F) for 20 h (c and d) showed that low-temperature annealing at 400 °C maintained the S-phase layer precipitate
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Published: 31 October 2011
Fig. 9 (a) Transmission electron microscopy image of titanium/steel interface. Titanium and steel both exhibit wrought grain structures on either side of a narrow interface region (∼200 nm wide). (b) Titanium and steel compositions across the interface region
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Image
Published: 31 October 2011
Fig. 6 Transmission electron microscopy (TEM) images. (a) Bright-field TEM image taken from an interface location with apparent good bonding. The interface cannot be determined easily, indicating potential recrystallization across the interface. Small, white Al-Mn-Fe intermetallics can be seen
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Published: 01 January 2005
Fig. 20 Transmission electron microscopy micrographs of (a) cracks and (b) faceted wear debris following room-temperature sliding of an Al 2 O 3 -SiC w whisker-reinforced ceramic composite. Source: Ref 134
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Published: 01 June 2016
Fig. 5 (a) High-angle annular dark-field scanning transmission electron microscopy image of a β″ precipitate in a 6016-type alloy low in copper (0.05 wt%) and aged for 5 h at 185 °C (365 °F) after T4, as viewed in the ⟨001⟩ α direction parallel to the needle axis. The unit cell is given
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Image
Published: 01 June 2016
Fig. 6 High-angle annular dark-field transmission electron microscopy images of the cross sections of various precipitates in an Al-0.63Mg-0.77Si alloy. All samples were heated to an end temperature ( T e ) at 10 K/min and were then quenched. (a) T e = 375 °C (700 °F). (b, c) T e = 400
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Image
Published: 01 June 2016
Fig. 8 Bright-field transmission electron microscopy images of a 6060 alloy aged for 5 h at 190 °C (375 °F). (a) Undeformed alloy. (b) Alloy with 10% deformation before artificial aging. The precipitates in (a) are approximately half as long and 1 3 as thick, 5 times more numerous
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Published: 01 June 2016
Fig. 15 High-angle annular dark-field transmission electron microscopy image along the ⟨001⟩ α direction showing θ′ precipitates and monolayer Guinier-Preston (GP)-I zones in Al-4Cu-0.05Sn alloy subjected to interrupted aging for 10 min at 200 °C (390 °F), followed by 30 days at 65 °C (150 °F
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in Dispersion-Strengthened Nickel-Base and Iron-Base Alloys
> Properties and Selection: Nonferrous Alloys and Special-Purpose Materials
Published: 01 January 1990
Fig. 4 Transmission electron microscopy (TEM) photomicrograph of alloy MA 754 microstructure showing uniform distribution of fine oxides and scattered coarser carbonitrides
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Published: 01 August 2013
Fig. 11 Transmission electron microscopy images showing influence of carbon content on microstructure after electron beam hardening. (a) Lathlike and (b) platelike martensite
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in Localization Parameter for the Prediction of Interface Structures and Reactions
> Fundamentals of Modeling for Metals Processing
Published: 01 December 2009
Fig. 12 High-resolution transmission electron microscopy image of the surface of a Raney nickel catalyst showing the small crystallite size and large number of corner and edge atoms. Courtesy of U. Hörmann, Ulm University, by personal communication
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