1-20 of 438 Search Results for

transmission electron microscopes

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 01 January 1994
Fig. 10 Plan-view transmission electron microscope images of sputtered titanium nitride coatings. (a) Bright-field image. (b) Dark-field image obtained by putting an aperture over two bright {200} diffraction spots. (c) Corresponding diffraction pattern More
Image
Published: 01 December 1998
Fig. 12 Schematic of transmission electron microscope, shown operating in the conventional parallel beam mode. The beam can also be focused to a small spot and rastered over the sample. Courtesy of Tom Headley, Sandia National Laboratories More
Image
Published: 31 December 2017
Fig. 8 (a, b) Transmission electron microscope imaging and (c) energy-dispersive spectroscopy element mapping on the cross section of the near-surface zone of a cast iron worn surface lubricated by SAE 5W-30 engine oil. (b) and (c) correspond to the dash line box and dot line box, respectively More
Image
Published: 31 December 2017
Fig. 19 Transmission electron microscope images of two-layered tribofilm on ring and liner surfaces. Reprinted from Ref 95 . Copyright 2014, with permission from Elsevier More
Image
Published: 31 December 2017
Fig. 14 High-resolution transmission electron microscope (TEM) images showing atomic wear on the silicon substrate. (a) An ~7.5 nm deep wear scar formed on silicon surface after sliding by a SiO 2 microsphere. Inset shows the AFM image of the wear scar. (b) Representative lattice resolved More
Image
Published: 31 December 2017
Fig. 15 High-resolution transmission electron microscope (HR-TEM) images of a diamondlike-carbon-coated (DLC) silicon tip before AFM imaging and after completing 1, 3, 9, 21, and 45 amplitude modulation (AM)-AFM images on the ultrananocrystalline diamond (UNCD) sample. Source: Ref 16 More
Image
Published: 31 December 2017
Fig. 20 Transmission electron microscope images of netlike wear particles generated tribochemically by sliding between a Si 3 N 4 pin and disk in water at room temperature. (a) Amorphous structure containing silicon. (b) Amorphous structure containing silicon and fine crystalline particles More
Image
Published: 15 December 2019
Fig. 7 Transmission electron microscope thin foil rotated under the beam until the cementite lamellae were parallel to the electron beam to measure the true spacing. Original magnification: 22,000× More
Image
Published: 15 December 2019
Fig. 8 Transmission electron microscope replica of a lightly etched (with 4% picral) specimen. Original magnification: 20,000× More
Image
Published: 15 December 2019
Fig. 43 H-bar geometry for transmission electron microscope (TEM) sample preparation. FIB, focused ion beam. Inset image courtesy of Fibics Incorporated, Ottawa, Canada More
Image
Published: 15 December 2019
Fig. 44 The transmission electron microscope (TEM) lamella is created by a series of steps. (a) Platinum overcoating to protect the lamella and minimize curtaining. Also evident is the fiducial mark used to designate the feature of interest. (b) Ramp-profiled regions milled out in front More
Image
Published: 01 December 2004
Fig. 7 Transmission electron microscope micrograph of an overaged sample of Au-0.2Co-0.3Sb (wt%) alloy showing small antimony-rich precipitates in the matrix. Source: Ref 8 , 9 More
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... Abstract The application of transmission electron microscope to the study of fracture surfaces and related phenomena has made it possible to obtain magnifications and depths of field much greater than those possible with light (optical) microscopes. This article reviews the methods...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... dating back to the sixteenth century to the state-of-the-art work in electron fractography and quantitative fractography. It also describes the applications and limitations of scanning electron microscope and transmission electron microscope. electron fractography fractography microfractography...
Image
Published: 01 December 2004
Fig. 33 A ray diagram illustrating the Foucault imaging of magnetic domains using a transmission electron microscope. The Lorentz force on the electrons passing through the magnetic material causes a deflection of their trajectory. A displacement of the objective aperture allows the electrons More
Image
Published: 15 December 2019
Fig. 23 Transmission Kikuchi diffraction maps of a worn nickel surface obtained at 30 kV by using the conventional arrangement and a 3 nm step size. (a) Scanning transmission electron microscope image of the thin focused-ion-beam-prepared sample. (b) Band contrast image of a small region More
Image
Published: 01 December 2004
Fig. 15 Microstructure of upper bainite as seen in the transmission electron microscope. Note the carbides in the ferrite lath boundaries. Thin foil. Original magnification 5500× More
Image
Published: 15 December 2019
Fig. 11 Plot of the distribution of interlamellar spacing of cementite in as-rolled 1040 carbon steel using tilted transmission electron microscope foils, revealing the true spacing More
Image
Published: 01 December 2004
Fig. 16 Microstructure of lower bainite as seen in the transmission electron microscope. Note the carbides at a discrete angular orientation within the ferrite laths. Thin foil. Original magnification 8000× More
Image
Published: 01 December 2004
Fig. 17 Microstructure of lower bainite as seen in a carbon replica examined in the transmission electron microscope. As in Fig. 16 , the carbides are at a discrete angular orientation within the ferrite laths. Original magnification 8000× More