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transmission electron microscopes

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Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... of transmission electron microscope to the study of fracture surfaces and related phenomena has made it possible to obtain magnifications and depths of field much greater than those possible with light (optical) microscopes. This article reviews the methods for preparing single-stage, double-stage, and extraction...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... appearance dating back to the sixteenth century to the state-of-the-art work in electron fractography and quantitative fractography. It also describes the applications and limitations of scanning electron microscope and transmission electron microscope. electron fractography fractography...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... be solved, at least in part, with AEM. analytical electron microscopes analytical transmission electron microscopy bright-field microscopy data analysis defect analysis deformation dislocations electron diffraction electron energy loss spectroscopy electron guns grain-boundary segregation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... by using the conventional arrangement and a 3 nm step size. (a) Scanning transmission electron microscope image of the thin focused-ion-beam-prepared sample. (b) Band contrast image of a small region of the sample shown in (a). (c) Orientation map with respect to the horizontal direction or the sliding...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... and Crystallographic Microanalysis Voltage Contrast and Analysis of Microelectronic Devices Electron Probe Microanalysis Transmission Electron Microscopy Scanning Auger Microscopy The electron probe microanalyzer (frequently termed the electron microprobe) is essentially a scanning electron microscope...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
.... 12 Schematic of transmission electron microscope, shown operating in the conventional parallel beam mode. The beam can also be focused to a small spot and rastered over the sample. Courtesy of Tom Headley, Sandia National Laboratories The sample typically consists of a 3 mm diameter disk...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... transmission electron microscope Small area microanalysis of thin films; small area diffraction 2–3 nm (SEM mode, in lens) 5–30 nm (EDS) Samples must be thinned generally also functions as a transmission electron microscope; allows chemical analysis of particles characterized by transmission electron...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... crystallographic information is needed for a particular phase, transmission electron microscopy can be employed. Microanalysis is a method that combines structural (location-specific) and compositional analysis in one operation, providing information about specimen composition on a microscopic scale. Hence...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
...-state welding STA solution treated and aged STEM scanning transmission electron microscope/microscopy STM/S scanning tunneling microscopy/spectroscopy SUS Saybolt universal seconds (viscosity) Sv sievert SW stud arc welding t thickness; time T tesla T temperature...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005749
EISBN: 978-1-62708-171-9
... HP high purity; hot pressed; high pressure HPC high-pressure compressor HPT high-pressure turbine HR Rockwell hardness (requires scale designation, such as HRC for Rockwell C hardness) HRS hot rolled steel HRTEM high-resolution transmission electron microscope HSc...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... SRM Standard Reference Materials ST short transverse (direction) STA solution-treated and aged std standard STEM scanning transmission electron microscope/microscopy STLE Society of Tribologists and Lubrication Engineers (formerly ASLE) STM scanning...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006387
EISBN: 978-1-62708-192-4
... transmission electron microscope (HR-TEM) images of a diamondlike-carbon-coated (DLC) silicon tip before AFM imaging and after completing 1, 3, 9, 21, and 45 amplitude modulation (AM)-AFM images on the ultrananocrystalline diamond (UNCD) sample. Source: Ref 16 Fig. 4 Basic principle of confocal...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003227
EISBN: 978-1-62708-199-3
..., electron microprobe analysis, x-ray diffraction analysis, and Auger spectroscopy. When these investigations are performed by auxiliary equipment on either a scanning or a transmission electron microscope, they may be considered to be fractographic procedures. Brittleness or ductility may be revealed...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003227
EISBN: 978-1-62708-199-3
... by auxiliary equipment on either a scanning or a transmission electron microscope, they may be considered to be fractographic procedures. Brittleness or ductility may be revealed by fractography. In general, a ductile alloy will fracture by microvoid coalescence and a brittle alloy will fracture...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... to a very thin 3 mm (⅛ in.) disk and dimpling the center. Then, a sample is generally ion milled for an extended time to yield a small electron-transparent area that may be suitable for TEM study. The transmission electron microscope is particularly useful for elucidating grain-boundary phases, interfaces...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003763
EISBN: 978-1-62708-177-1
... Microstructure of heat treated low-alloy steel showing bainite. 4% picral + 2% nital etch. Original magnification 500× Fig. 15 Microstructure of upper bainite as seen in the transmission electron microscope. Note the carbides in the ferrite lath boundaries. Thin foil. Original magnification 5500...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001300
EISBN: 978-1-62708-170-2
..., but they are time-consuming and often difficult to prepare for the latter technique. Scanning Electron Microscope (SEM) Transmission Electron Microscope (TEM) Porosity can be measured by the mercury intrusion porosimetry (MIP) technique, tests that use corrosive gases to decorate defects, density bottle...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000600
EISBN: 978-1-62708-181-8
... fractographs is also included in the caption. For example, “TEM p-c replica, 10,000×” indicates a plastic-carbon two-stage replica examined in a transmission electron microscope at a magnification of 10,000×. Replication techniques are discussed in the articles “History of Fractography” and “Transmission...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... will have the ray diagram shown in Fig. 3 . IMAGES of microstructural features are obtained from microscopes that magnify images obtained by the transmission or reflection of either light or electrons. The choice of method depends on several factors, such as the type of specimen and the imaging...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
.... Fig. 32 A ray diagram for the Fresnel imaging of magnetic domains using a transmission electron microscope. (a) When the current to the objective lens is increased above the in-focus condition, the image becomes overfocused and the electrons are deflected toward and away from the domain walls...