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transmission Kikuchi diffraction

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... electron microscope and describes transmission Kikuchi diffraction. It begins with a discussion on the origins of EBSD and the collection of EBSD patterns. This is followed by sections providing information on EBSD spatial resolution and system operation of EBSD. Various factors pertinent to perform...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
...) and the wavelength (λ) of light or electrons, which is called the diffraction-limited intensity distribution. The center circle is called the Airy disk, and its diameter is expressed as: Fig. 1 Various transmission electron microscopy instruments. (a) JEOL JEM-ARM300F Grand ARM. Courtesy of JEOL. (b) Thermo...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... diffraction pattern, termed a Kikuchi pattern, is analogous to the x-ray Kossel pattern, but is made up of straight lines that are easier to index. These Kikuchi patterns can be used to identify crystalline phases (similar to x-ray powder diffraction but based on a different diffraction geometry), as well...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... in which diffraction occurs simultaneously from many grains with different orientations relative to the incident beam; (2) spot patterns in which diffraction occurs from a single-crystal region of the specimen; and (3) Kikuchi line patterns in which diffraction occurs from a single-crystal region...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... arrows). STEM, scanning transmission electron microscopy; DF, dark field; BF, bright field Another common method for BE detection in this geometry is using semiconductor-based solid-state detectors, which are often segmented so the BE signal to different regions of the detector can be isolated...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... chromatography; LC-MS: liquid chromatography-mass spectrometry; XRD: x-ray diffraction; TEM: transmission electron microscopy; OM: optical microscopy; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 22A
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.hb.v22a.a0005418
EISBN: 978-1-62708-196-2
..., the principle is still the same, with the sample being rotated through every symmetric angle. The ODF is then reconstructed as for lab x-ray measurements but without the problem of ghosts. A more direct method is electron backscatter diffraction (EBSD). Here, the Kikuchi lines obtained from backscattered...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003744
EISBN: 978-1-62708-177-1
... family of planes, but do not uniquely determine the in-plane component of the orientation. The full information is only obtained after several pole figures are measured, and the ODF is calculated. Electron diffraction measurements of orientations commonly include Kikuchi patterns or spot patterns...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
...-of-field resolution more dramatically, by a factor of approximately 300. The first portion of this article explains how the scanning electron microscope functions and how it is able to provide these improvements over the optical microscope. Commercial scanning transmission electron microscopes became...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.9781627081771
EISBN: 978-1-62708-177-1
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003742
EISBN: 978-1-62708-177-1
... (e.g., GNB or IDB), and complete distributions of the angles are necessary. This procedure is possible in the TEM using a semiautomatic technique that measures the Kikuchi diffraction pattern in the TEM to obtain the crystallite orientation ( Ref 48 ). The misorientation across a dislocation boundary...
Series: ASM Handbook
Volume: 4E
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.hb.v04e.a0006268
EISBN: 978-1-62708-169-6
... or the individual precipitates visible. Light optical microscopy, scanning electron microscopy, transmission electron microscopy (TEM, such as scanning transmission electron microscopy, high-resolution transmission electron microscopy, energy-filtered transmission electron microscopy, and high-angle annular dark...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... and travel to a depth from which the probability of their reescape is small. Dark lines, forming patterns similar to Kikuchi lines in the transmission electron microscope, are thus formed ( Fig. 14 ). When the direction of the primary beam deviates from these channeling directions, the proportion...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
..., acuity, and fidelity that help to define our current usage of the term focused . The population of FIB instrumentation has grown steadily, and it now represents a substantial fraction of the wider “charged particle beam” family that includes scanning electron microscopes (SEMs) and transmission...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003711
EISBN: 978-1-62708-182-5
... (backscattered electron detection), quantitative and qualitative chemical analysis using energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS), and even rudimentary x-ray diffraction analysis (backscattered Kikuchi line analysis). The phase of a material is defined as a region...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003052
EISBN: 978-1-62708-200-6
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002400
EISBN: 978-1-62708-193-1
... of the temperature gradients induced by quenching ( Ref 70 ), which in turn are dependent on specimen size and geometry, the hardenability of the steel, the carbon gradient, and the case depth. The residual stresses as a function of case depth are routinely measured by x-ray diffraction ( Ref 71 ), and considerable...
Series: ASM Handbook
Volume: 2A
Publisher: ASM International
Published: 30 November 2018
DOI: 10.31399/asm.hb.v02a.a0006509
EISBN: 978-1-62708-207-5
... in transmission electron micrographs. Spherical solute-rich zones usually form when the sizes of the solvent and solute atoms are nearly equal, as in the aluminum-silver and aluminum- zinc systems. If there is a large difference in atom sizes, as in the aluminum-copper system, the GP zones usually form as disks...