Search Results for topography

X-ray topography is a technique that comprises topography and x-ray diffraction. This article provides a description of the kinematical theory and the dynamical theory of diffraction. It provides useful information on the configurations of reflection and transmission topography. The article explains various topographic methods, namely, divergent beam method, polycrystal rocking curve analysis, line broadening analysis, microbeam method, and polycrystal scattering topography, as well as their instrumentation. It also describes the applications of x-ray topography.

Most surfaces have regular and irregular spacings that tend to form a pattern or texture on the surface. This article provides information on the general background of surface topography and discusses the different methods for measuring surface topography, namely, contact and noncontact techniques, and the focus-follow method. Examples of different types of parameters obtained and how they are applied can best be described by discussing the various types of surfaces generated by finishing methods. The surfaces include ground, turned, and milled machined surfaces; surfaces subjected to stress; bearing surfaces; plateau honed and tapped surfaces; and reflective, painted, elastic, and wear-resistant surfaces.

X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.