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time-of-flight secondary ion mass spectrometry

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Published: 15 January 2021
Fig. 8 Time-of-flight secondary ion mass spectrometry total positive ion mass spectrum of polyethylene terephthalate More
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Published: 01 January 2002
Fig. 8 Time-of-flight secondary ion mass spectrometry positive ion spectrum of stainless steel surface More
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Published: 01 January 2002
Fig. 15 Time-of-flight secondary ion mass spectrometry negative ion spectrum of stainless steel surface. Postive ion spectrum is in Fig. 8 . More
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Published: 15 December 2019
Fig. 16 Time-of-flight secondary ion mass spectrometry positive ion spectra of stainless steel surface More
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Published: 15 January 2021
Fig. 10 Time-of-flight secondary ion mass spectrometry total ion image of polypropylene surface with suspected contamination present More
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Published: 01 January 2002
Fig. 16 Time-of-flight secondary ion mass spectrometry spectrum showing mass separation of Cu and C 5 H 3 peaks, both at a nominal mass of 63 More
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Published: 15 January 2021
Fig. 9 Time-of-flight secondary ion mass spectrometry total positive ion spectrum of polypropylene surface showing unexpected peaks at 304 and 481 Daltons More
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Published: 01 January 2002
Fig. 17 Time-of-flight secondary ion mass spectrometry images of 50 by 50 μm stainless steel surface area. (a) Map of Cr (b) Map of Fe, (c) Map of Na More
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Published: 15 January 2021
Fig. 15 Time-of-flight secondary ion mass spectrometry spectra showing MS 2 spectra for mass-to-charge ( m / z ) ratios of 304 and 481 precursor ions More
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Published: 15 January 2021
Fig. 16 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 304 compared to National Institute of Standards and Technology (NIST) database spectrum for benzalkonium, a polymer additive More
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Published: 15 January 2021
Fig. 17 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 481 compared to National Institute of Standards and Technology (NIST) database spectrum for Tinuvin 770, a polymer additive More
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Published: 15 January 2021
Fig. 18 Time-of-flight secondary ion mass spectrometry spectra for polypropylene (PP) and peaks at 304 and 481 Daltons, and ion maps corresponding to these peaks More
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
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Published: 15 December 2019
Fig. 5 Qualitative depth profiles of CdTe photovoltaic cells obtained by using (a) pulsed radio-frequency glow discharge time-of-flight mass spectrometry, (b) time-of-flight secondary ion mass spectrometry, and (c) laser ablation inductively coupled plasma mass spectrometry. Source: Ref 85 More
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Published: 15 December 2019
Fig. 17 Total positive ion image of stainless steel surface (50 × 50 μm) revealed by time-of-flight secondary ion mass spectrometry More
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Published: 15 May 2022
Fig. 63 Schematic diagrams. (a) Reflection time-of-flight secondary ion mass spectrometry (ToF-SIMS) system. Courtesy of ION-TOF GmbH, Munster, Germany. (b) TRIFT ToF-SIMS system. SED, secondary electron detector. Courtesy of Physical Electronics Inc., Chanhassen, MN More
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Published: 15 May 2022
Fig. 1 Depth of analysis, depth of profiling, and length scale presentation in surface examination and analysis of polymers. AFM, atomic force microscopy; SEM, scanning electron microscopy; XPS, x-ray photoelectron spectroscopy; ToF-SIMS, time-of-flight secondary ion mass spectrometry; EDS More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... of time-of-flight SIMS are covered. Instrumental features required for secondary ion imaging are presented and the differences between quadrupole and high-resolution magnetic mass filters are described. The article also reviews the optimum method for analysis of nonmetallic samples and high detection...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006651
EISBN: 978-1-62708-213-6
... to ionization methods, namely glow discharge mass spectrometry and secondary ion mass spectrometry. It concludes with a section on various examples of applications and interpretation of MS for various materials. time-of-flight mass spectrometer mass spectrometry Overview Introduction Since its...