1-20 of 37 Search Results for

time-of-flight mass spectrometer

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 15 December 2019
Fig. 2 Schematics of time-of-flight mass spectrometer with (a) linear flight path and (b) reflected flight path, also called a reflectron More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006651
EISBN: 978-1-62708-213-6
... and the time-of-flight mass spectrometer. Inductively coupled plasma and thermal ionization MS provide atomic information, and direct analysis in real-time and matrix-assisted laser-desorption ionization MS are used to analyze molecular compositions. The article describes various factors pertinent...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001772
EISBN: 978-1-62708-178-8
... be analyzed chemically by coupling to the microscope a time-of-flight mass spectrometer of single-particle sensitivity, known as the atom probe (AP). This article describes the principles, sample preparation, and quantitative analysis of FIM. It also provides information on the principles, instrument design...
Image
Published: 01 December 2004
the elemental identity of each atom is determined from its flight time in the time-of-flight mass spectrometer and the applied voltages. More
Image
Published: 15 December 2019
Fig. 3 Enhanced sensitivity achieved for the detection of isotopes that are in the neighborhood of major elements/species when appropriate blanking is applied before entering the time-of-flight mass spectrometer. (a) Isotopes with mass/charge number of ions (m/z) far from More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001776
EISBN: 978-1-62708-178-8
... is located. The light low-mass ions arrive first, and the heavy high-mass ions arrive last. Such a mass spectrometer is called a time-of-flight mass spectrometer. Ions produced in ethyl alcohol during GC/MS analysis Table 1 Ions produced in ethyl alcohol during GC/MS analysis CH 3 CH 2...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006663
EISBN: 978-1-62708-213-6
... technologies for gas mass spectrometry, namely quadrupole mass filters, magnetic sector mass filters, and time-of-flight mass analyzers are covered. Common factors to consider in choosing an analyzer for static or continuous gas measurement are also described. In addition, the article presents some examples...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... the outermost one or two layers of the solid, thus defining TOF-SIMS as an extremely surface-sensitive technique. By applying a potential between the sample surface and the mass analyzer, the desorbed secondary ions are extracted into a time-of-flight mass spectrometer, where their masses are separated...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006664
EISBN: 978-1-62708-213-6
... of the analyzer by the vacuum system ( Ref 2 ). Mass analyzers have also been built based on separation of ions due to their time of flight (TOF) or flight time. Here, ions of similar initial kinetic energy travel down a long field-free flight tube. The smaller ions travel faster and reach the detector before...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... TOF-SIMS as an extremely surface-sensitive technique. By applying a potential between the sample surface and the mass analyzer, the desorbed secondary ions are extracted into a time-of-flight mass spectrometer where their masses are separated in flight time, with very high accuracy, based...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001737
EISBN: 978-1-62708-178-8
... to a power density of 10 9 W/cm 2 on a location 1 μm in diameter coupled to a time-of-flight mass spectrometer with an electron multiplier detector. Each laser pulse produces a burst of ions that are separated in time according to their mass as they traverse the time-of-flight mass spectrometer. All ions...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006648
EISBN: 978-1-62708-213-6
.... Usually, all GDMS systems incorporate a valve to isolate the mass spectrometer from the source, which must be exposed to atmosphere frequently. Different types of mass analyzers—including quadrupole, sector field (also denoted as high resolution), and time of flight—have been combined with low-pressure GD...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... of time-of-flight SIMS are covered. Instrumental features required for secondary ion imaging are presented and the differences between quadrupole and high-resolution magnetic mass filters are described. The article also reviews the optimum method for analysis of nonmetallic samples and high detection...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006641
EISBN: 978-1-62708-213-6
...; dynamic reaction cell, or collision cell, quadrupole; triple quadrupole; high-resolution magnetic sector; and time-of-flight, with quadrupole being the most commonly and widely used. Quadrupole Mass Analyzer In most early ICP-MS instruments, mass separation was performed using a conventional...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... be studied through a variety of techniques, such as secondary ion mass spectrometry (SIMS) (time-of-flight SIMS, for example) or microscopic imaging, such as atomic force microscopy or TEM. The extent of cure can be established through chemical analysis, such as by correlating the disappearance or appearance...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
.... Neutron scattering at steady-state sources is most commonly performed with monochromatic beams and continuous data collection, although polychromatic beam methods can be carried out using choppers to pulse the beam, allowing time-of-flight to differentiate the neutron energy spectrum. Spallation Neutron...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
... 29 ). A primary ion beam of about 0.5 to 15 keV energy causes sputter erosion of the surface by emission of neutrals and ions. The ejected secondary ions are separated in a mass spectrometer (electric quadrupole or magnetic sector or, in time-of-flight SIMS, by flight time measurements of pulse...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
... resulting from the interaction of x-rays and solids reported in 1925 ( Ref 2 ). The spectrum resolutions obtained at that time were not sufficient to observe distinct peaks in spectra for materials. Thus, these phenomena hardly attracted any attention for many years following these discoveries. Modern x...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... of a constantly falling column is measured by continuously scanning the column. Because these techniques miss the fine particles that have a profound effect on forming behavior, newer techniques have been developed to measure submicrometer-sized particles by time-of-flight or interparticle interference...