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Book Chapter

Sizing with Time-of-Flight Diffraction

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By Luis A. Ganhao
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006472
EISBN: 978-1-62708-190-0
... Abstract Time-of-flight diffraction (TOFD) is an ultrasonic technique used to detect diffracted waves from crack tips and to size the cracks from the arrival times of those waves. This article discusses the basic considerations and provides information on probe selection, gain setting...
Abstract
Time-of-flight diffraction (TOFD) is an ultrasonic technique used to detect diffracted waves from crack tips and to size the cracks from the arrival times of those waves. This article discusses the basic considerations and provides information on probe selection, gain setting, and instrumentation of TOFD. It describes the numerous effects that result from modifying the probe characteristics. The article provides the American Society of Mechanical Engineers (ASME), the European Committee for Standardization (CEN), and the International Standardization Organization (ISO) recommendations for the reference blocks according to applicable codes and standards. It also provides the ASME, CEN, and ISO recommendations for examination of welds. The article concludes with information on the interpretation and analysis of TOFD images with an aid of sizing algorithms.
View PDF for content titled, Sizing with <span class="search-highlight">Time</span>-of-<span class="search-highlight">Flight</span> <span class="search-highlight">Diffraction</span>
Image

Time-of-flight diffraction scan showing time-based triggering problems

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 16 Time-of-flight diffraction scan showing time-based triggering problems More
Image

Typical arrangement for the time-of-flight diffraction technique. Source: ...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 1 Typical arrangement for the time-of-flight diffraction technique. Source: Ref 1 More
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B-scan image obtained by application of the time-of-flight diffraction tech...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 2 B-scan image obtained by application of the time-of-flight diffraction technique. Source: Ref 2 More
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Time-of-flight diffraction reference block. Source: Ref 6

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 4 Time-of-flight diffraction reference block. Source: Ref 6 More
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Time-of-flight diffraction two-zone reference block. T 1 , upper-zone thi...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 5 Time-of-flight diffraction two-zone reference block. T 1 , upper-zone thickness; T 2 , lower-zone thickness. Source: Ref 6 More
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Time-of-flight diffraction offset scans. PCS, probe center separation. Sour...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 6 Time-of-flight diffraction offset scans. PCS, probe center separation. Source: Ref 6 More
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Time-of-flight diffraction image showing hyperbolic “tails” from the ends o...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 7 Time-of-flight diffraction image showing hyperbolic “tails” from the ends of a flaw image used to measure flaw length. Source: Ref 6 More
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Time-of-flight diffraction image showing top and bottom diffracted signals ...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 8 Time-of-flight diffraction image showing top and bottom diffracted signals from midwall flaw and A-scan interpretation. Source: Ref 6 More
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Time-of-flight diffraction image showing top and bottom diffracted signals ...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 9 Time-of-flight diffraction image showing top and bottom diffracted signals from centerline crack and A-scan interpretation. Source: Ref 6 More
Image

Typical defects and their corresponding time-of-flight diffraction (TOFD) d...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 11 Typical defects and their corresponding time-of-flight diffraction (TOFD) displays. (a) For a toe crack, the lateral wave is disrupted, and the bottom of the crack is visible. This can be characterized as a surface-breaking crack, and the depth can be measured. (b) For incomplete root More
Image

Typical defects and their corresponding time-of-flight diffraction (TOFD) d...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 11 Typical defects and their corresponding time-of-flight diffraction (TOFD) displays. (a) For a toe crack, the lateral wave is disrupted, and the bottom of the crack is visible. This can be characterized as a surface-breaking crack, and the depth can be measured. (b) For incomplete root More
Image

Satisfactory time-of-flight diffraction image displaying undisturbed latera...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 12 Satisfactory time-of-flight diffraction image displaying undisturbed lateral wave (amplitude between 40 and 80% full screen height), four indications of notches in different depths, straight back wall reflection, and mode-converted signals from notches and back wall More
Image

Time-of-flight diffraction image showing a too-low gain setting with a late...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 13 Time-of-flight diffraction image showing a too-low gain setting with a lateral wave amplitude ≪ 40% full screen height More
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Time-of-flight diffraction image showing a too-high gain setting with a lat...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 14 Time-of-flight diffraction image showing a too-high gain setting with a lateral wave amplitude ≫ 80% full screen height (saturated) More
Image

Time-of-flight diffraction image that is missing scan lines caused by a too...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 15 Time-of-flight diffraction image that is missing scan lines caused by a too-high scanning speed More
Image

Time-of-flight diffraction image influenced by variation of couplant layer ...

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in Sizing with Time-of-Flight Diffraction > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 17 Time-of-flight diffraction image influenced by variation of couplant layer thickness (which may be straightened by software) More
Image

(a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry...

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in Ultrasonic Imaging and Sizing[1] > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 21 (a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry across a weld. PCS, probe center separation. (b) Portable system with manual TOFD yoke and transducers. Used with permission of Olympus More
Image

Example of time-of-flight diffraction cursor sizing of defect height. Used ...

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in Ultrasonic Imaging and Sizing[1] > Nondestructive Evaluation of Materials
Published: 01 August 2018
Fig. 22 Example of time-of-flight diffraction cursor sizing of defect height. Used with permission of Olympus More
Image

(a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry...

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in Nondestructive Testing in Failure Analysis > Failure Analysis and Prevention
Published: 15 January 2021
Fig. 12 (a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry across a weld. PCS, probe center separation. (b) Portable system with manual TOFD yoke and transducers. Used with permission of Olympus More