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Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006472
EISBN: 978-1-62708-190-0
... Abstract Time-of-flight diffraction (TOFD) is an ultrasonic technique used to detect diffracted waves from crack tips and to size the cracks from the arrival times of those waves. This article discusses the basic considerations and provides information on probe selection, gain setting...
Abstract
Time-of-flight diffraction (TOFD) is an ultrasonic technique used to detect diffracted waves from crack tips and to size the cracks from the arrival times of those waves. This article discusses the basic considerations and provides information on probe selection, gain setting, and instrumentation of TOFD. It describes the numerous effects that result from modifying the probe characteristics. The article provides the American Society of Mechanical Engineers (ASME), the European Committee for Standardization (CEN), and the International Standardization Organization (ISO) recommendations for the reference blocks according to applicable codes and standards. It also provides the ASME, CEN, and ISO recommendations for examination of welds. The article concludes with information on the interpretation and analysis of TOFD images with an aid of sizing algorithms.
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Published: 01 August 2018
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Published: 01 August 2018
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B-scan image obtained by application of the time-of-flight diffraction tech...
Available to PurchasePublished: 01 August 2018
Fig. 2 B-scan image obtained by application of the time-of-flight diffraction technique. Source: Ref 2
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Published: 01 August 2018
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Published: 01 August 2018
Fig. 5 Time-of-flight diffraction two-zone reference block. T 1 , upper-zone thickness; T 2 , lower-zone thickness. Source: Ref 6
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Time-of-flight diffraction offset scans. PCS, probe center separation. Sour...
Available to PurchasePublished: 01 August 2018
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Time-of-flight diffraction image showing hyperbolic “tails” from the ends o...
Available to PurchasePublished: 01 August 2018
Fig. 7 Time-of-flight diffraction image showing hyperbolic “tails” from the ends of a flaw image used to measure flaw length. Source: Ref 6
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Time-of-flight diffraction image showing top and bottom diffracted signals ...
Available to PurchasePublished: 01 August 2018
Fig. 8 Time-of-flight diffraction image showing top and bottom diffracted signals from midwall flaw and A-scan interpretation. Source: Ref 6
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Time-of-flight diffraction image showing top and bottom diffracted signals ...
Available to PurchasePublished: 01 August 2018
Fig. 9 Time-of-flight diffraction image showing top and bottom diffracted signals from centerline crack and A-scan interpretation. Source: Ref 6
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Typical defects and their corresponding time-of-flight diffraction (TOFD) d...
Available to PurchasePublished: 01 August 2018
Fig. 11 Typical defects and their corresponding time-of-flight diffraction (TOFD) displays. (a) For a toe crack, the lateral wave is disrupted, and the bottom of the crack is visible. This can be characterized as a surface-breaking crack, and the depth can be measured. (b) For incomplete root
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Typical defects and their corresponding time-of-flight diffraction (TOFD) d...
Available to PurchasePublished: 01 August 2018
Fig. 11 Typical defects and their corresponding time-of-flight diffraction (TOFD) displays. (a) For a toe crack, the lateral wave is disrupted, and the bottom of the crack is visible. This can be characterized as a surface-breaking crack, and the depth can be measured. (b) For incomplete root
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Satisfactory time-of-flight diffraction image displaying undisturbed latera...
Available to PurchasePublished: 01 August 2018
Fig. 12 Satisfactory time-of-flight diffraction image displaying undisturbed lateral wave (amplitude between 40 and 80% full screen height), four indications of notches in different depths, straight back wall reflection, and mode-converted signals from notches and back wall
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Time-of-flight diffraction image showing a too-low gain setting with a late...
Available to PurchasePublished: 01 August 2018
Fig. 13 Time-of-flight diffraction image showing a too-low gain setting with a lateral wave amplitude ≪ 40% full screen height
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Time-of-flight diffraction image showing a too-high gain setting with a lat...
Available to PurchasePublished: 01 August 2018
Fig. 14 Time-of-flight diffraction image showing a too-high gain setting with a lateral wave amplitude ≫ 80% full screen height (saturated)
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Time-of-flight diffraction image that is missing scan lines caused by a too...
Available to PurchasePublished: 01 August 2018
Fig. 15 Time-of-flight diffraction image that is missing scan lines caused by a too-high scanning speed
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Time-of-flight diffraction image influenced by variation of couplant layer ...
Available to PurchasePublished: 01 August 2018
Fig. 17 Time-of-flight diffraction image influenced by variation of couplant layer thickness (which may be straightened by software)
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(a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry...
Available to PurchasePublished: 01 August 2018
Fig. 21 (a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry across a weld. PCS, probe center separation. (b) Portable system with manual TOFD yoke and transducers. Used with permission of Olympus
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Example of time-of-flight diffraction cursor sizing of defect height. Used ...
Available to PurchasePublished: 01 August 2018
Fig. 22 Example of time-of-flight diffraction cursor sizing of defect height. Used with permission of Olympus
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(a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry...
Available to PurchasePublished: 15 January 2021
Fig. 12 (a) Schematic showing time-of-flight diffraction (TOFD) inspection geometry across a weld. PCS, probe center separation. (b) Portable system with manual TOFD yoke and transducers. Used with permission of Olympus
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