1-20 of 76 Search Results for

synchrotron radiation

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 01 January 1986
Fig. 1 Experimental EXAFS scan of nickel metal taken using synchrotron radiation above the K-absorption edge of nickel at 8332.8 eV. The energy is labeled regarding the K-edge of nickel as zero. More
Image
Published: 01 January 1986
Fig. 6 Spectral distribution of synchrotron radiation from SPEAR. More
Image
Published: 30 June 2023
Fig. 10 X-ray imaging system at Stanford Synchrotron Radiation Lightsource (SSRL) on a laser powder-bed fusion process for Ti-6Al-4V material. Reprinted from Ref 69 with permission from Springer Nature Limited under the Creative Commons CC BY license More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001764
EISBN: 978-1-62708-178-8
... of synchrotron radiation as the x-ray source for EXAFS experiments. It also describes the typical EXAFS data analysis of pure nickel at 90 K, and explains the near-edge structure analysis of vanadium. The article presents a discussion on the unique features and applications of EXAFS. data analysis...
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005218
EISBN: 978-1-62708-187-0
... morphology evolution, solute transport, and various process phenomena at spatiotemporal resolutions. It discusses the three viable imaging techniques made available by synchrotron radiation for the real-time investigation of solidification microstructures in alloys. These include two-dimensional X-ray...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006665
EISBN: 978-1-62708-213-6
... by a discussion on the use of synchrotron radiation as an X-ray source for EXAFS. Data-reduction procedures used to extract EXAFS signals are then described. The article also provides information on the analysis of x-ray absorption near-edge structure spectrum and ends with a discussion on the unique features...
Image
Published: 01 January 1986
Fig. 2 Experimental EXAFS scan of germanium in GeCl 4 molecule taken using synchrotron radiation above the K-absorption edge of germanium at 11 103.3 eV. Source: Ref 10 More
Image
Published: 01 January 2006
Fig. 37 Tetragonal fraction in oxide formed in Zircaloy-4 tested in pure water, calculated from synchrotron radiation micro-x-ray diffraction, versus distance from the oxide/metal interface. Source: Ref 176 More
Image
Published: 15 December 2019
Fig. 2 Experimental extended x-ray absorption fine structure scan of germanium in GeCl 4 molecule taken by using synchrotron radiation above the K-absorption edge of germanium at 11,103.3 eV. Source: Ref 13 More
Image
Published: 15 December 2019
Fig. 1 Experimental extended x-ray absorption fine structure scan of nickel metal taken by using synchrotron radiation above the K-absorption edge of nickel at 8332.8 eV. The energy is labeled regarding the K-edge of nickel as zero. More
Image
Published: 15 December 2019
Fig. 6 Extended x-ray absorption fine structure experimental apparatus at the Stanford Synchrotron Radiation Laboratory. (a) Transmission mode of detection. (b) Fluorescence mode of detection. SPEAR, Stanford Position Electron Accelerator Ring. Source: Ref 35 More
Image
Published: 01 January 1986
Fig. 7 K-edge EXAFS spectra of arsenic in As 2 Te 3 glass. (a) Taken with a conventional x-ray tube. (b) With synchrotron radiation. The sharp white line in (b) is due to higher resolution (approximately 2 eV) compared with approximately 8 eV for the data taken with the x-ray tube. Source More
Image
Published: 01 November 2010
Polytechnique Fédérale de Lausanne. (b) Equiaxed grains growing in the melt during cooling of an Al-4wt%Cu alloy. Observed by synchrotron x-ray radiography at the European Synchrotron Radiation Facility (Institut Matériaux Microélectronique Nanosciences de Provence, Univ. Paul Cézanne). Equiaxed crystals have More
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006956
EISBN: 978-1-62708-439-0
... from Elsevier Synchrotron X-Ray Imaging System Synchrotron X-Ray Source In synchrotron radiation, charged particles (electrons or protons) are accelerated and moved at a relativistic velocity along a curved trajectory and in a homogeneous magnetic field, leading to a discharge...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... structures of materials to the atomic resolution level. A major advantage of synchrotron XRD over its laboratory counterpart is the super brightness of the synchrotron radiation source, which is many orders of magnitude higher than that of a contemporary laboratory x-ray source ( Ref 1 – 3 ). The brightness...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006644
EISBN: 978-1-62708-213-6
.... ( Ref 9 ) performed the first x-ray topography experiments using synchrotron radiation on silicon samples. While conventional radiation-based x-ray topography techniques continue to be used, the availability of numerous synchrotron radiation facilities providing intense, low-divergent x-ray beams...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001760
EISBN: 978-1-62708-178-8
.... Polycrystal scattering topography is particularly useful for evaluating the development and modification of deformation texture due to mechanical processing. Synchrotron Radiation Synchrotron sources produce intense radiation, tunable to various wavelengths, that is advantageous for x-ray topography...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... Å are commonly employed. A wider range, and some possibility of selecting the working wavelength, is offered by synchrotrons and x-ray free-electron lasers (X-FELs). As electromagnetic radiation, x-rays have wave and particle properties. Derivation of all angle-dependent phenomena is based on their wave...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
... of wavelengths at high intensity results, facilitating angle-dispersive and energy-dispersive measurements. A valuable feature of synchrotron radiation is that angular data can be collected readily at several tunable wavelengths within minutes to hours. Although few synchrotron facilities are available...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
... enough for the x-rays to penetrate. Using laboratory x-rays, metallic samples typically must be less than 0.1 mm (0.004 in.) thick. The use of synchrotron radiation or neutrons can overcome this limitation. Figure 2 shows a back-reflection pinhole camera. If white radiation is used, the camera...