Skip Nav Destination
Close Modal
By
Ragnvald H. Mathiesen, Lars Arnberg
By
Marwan Haddad, Sarah J. Wolff, Samuel J. Clark, Kamel Fezzaa
By
Wenqian Xu, Saul H. Lapidus, Andrey Y. Yakovenko, Youngchang Kim, Olaf J. Borkiewicz ...
By
J.H. Konnert, J. Karle, P. D'Antonio
Search Results for
synchrotron radiation
Update search
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
NARROW
Format
Topics
Book Series
Date
Availability
1-20 of 77
Search Results for synchrotron radiation
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
1
Sort by
Image
Experimental EXAFS scan of nickel metal taken using synchrotron radiation a...
Available to PurchasePublished: 01 January 1986
Fig. 1 Experimental EXAFS scan of nickel metal taken using synchrotron radiation above the K-absorption edge of nickel at 8332.8 eV. The energy is labeled regarding the K-edge of nickel as zero.
More
Image
Published: 01 January 1986
Image
X-ray imaging system at Stanford Synchrotron Radiation Lightsource (SSRL) o...
Available to Purchase
in In Situ X-Ray Imaging of Metal Additive Manufacturing Processes
> Additive Manufacturing Design and Applications
Published: 30 June 2023
Fig. 10 X-ray imaging system at Stanford Synchrotron Radiation Lightsource (SSRL) on a laser powder-bed fusion process for Ti-6Al-4V material. Reprinted from Ref 69 with permission from Springer Nature Limited under the Creative Commons CC BY license
More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001764
EISBN: 978-1-62708-178-8
... of synchrotron radiation as the x-ray source for EXAFS experiments. It also describes the typical EXAFS data analysis of pure nickel at 90 K, and explains the near-edge structure analysis of vanadium. The article presents a discussion on the unique features and applications of EXAFS. data analysis...
Abstract
This article provides an introduction to extended x-ray absorption fine structure (EXAFS). It describes the fundamentals of EXAFS with an emphasis on the physical mechanism, the single-scattering approximation, and multiple-scattering effects. The article discusses the use of synchrotron radiation as the x-ray source for EXAFS experiments. It also describes the typical EXAFS data analysis of pure nickel at 90 K, and explains the near-edge structure analysis of vanadium. The article presents a discussion on the unique features and applications of EXAFS.
Book Chapter
X-Ray Imaging of Solidification Processes and Microstructure Evolution
Available to PurchaseBook: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005218
EISBN: 978-1-62708-187-0
... morphology evolution, solute transport, and various process phenomena at spatiotemporal resolutions. It discusses the three viable imaging techniques made available by synchrotron radiation for the real-time investigation of solidification microstructures in alloys. These include two-dimensional X-ray...
Abstract
Metal transparency and interaction with X-rays have been recognized as obvious candidate principles from which methods for in situ monitoring of solidification processes could be developed. This article describes the use of X-ray imaging-based techniques to investigate interface morphology evolution, solute transport, and various process phenomena at spatiotemporal resolutions. It discusses the three viable imaging techniques made available by synchrotron radiation for the real-time investigation of solidification microstructures in alloys. These include two-dimensional X-ray topography, two-dimensional X-ray radiography, and ultra-fast three-dimensional X-ray tomography.
Book Chapter
Extended X-Ray Absorption Fine Structure
Available to PurchaseSeries: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006665
EISBN: 978-1-62708-213-6
... by a discussion on the use of synchrotron radiation as an X-ray source for EXAFS. Data-reduction procedures used to extract EXAFS signals are then described. The article also provides information on the analysis of x-ray absorption near-edge structure spectrum and ends with a discussion on the unique features...
Abstract
This article provides a detailed account of extended x-ray absorption fine structure (EXAFS). It begins with a description of the fundamentals of EXAFS, providing information on the physical mechanism, single-scattering approximation, and multiple-scattering effects. This is followed by a discussion on the use of synchrotron radiation as an X-ray source for EXAFS. Data-reduction procedures used to extract EXAFS signals are then described. The article also provides information on the analysis of x-ray absorption near-edge structure spectrum and ends with a discussion on the unique features and applications of EXAFS.
Book Chapter
In Situ X-Ray Imaging of Metal Additive Manufacturing Processes
Available to PurchaseSeries: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0006956
EISBN: 978-1-62708-439-0
... from Elsevier Synchrotron X-Ray Imaging System Synchrotron X-Ray Source In synchrotron radiation, charged particles (electrons or protons) are accelerated and moved at a relativistic velocity along a curved trajectory and in a homogeneous magnetic field, leading to a discharge...
Abstract
X-ray imaging is a nondestructive evaluation (NDE) technique in which x-ray waves interact with an observed sample to generate images from which information about the examined object can be derived. This article discusses x-ray imaging systems and applications, presenting the history and role of x-ray imaging. It describes different setups that are implemented at various facilities that conduct x-ray imaging for different types of metal AM processes. The article also discusses different types of dynamics observed in experimental metal AM processes using x-ray imaging systems. It presents the future of x-ray imaging in metal AM.
Image
Published: 01 January 1986
Fig. 2 Experimental EXAFS scan of germanium in GeCl 4 molecule taken using synchrotron radiation above the K-absorption edge of germanium at 11 103.3 eV. Source: Ref 10
More
Book Chapter
Synchrotron X-Ray Diffraction Applications
Available to PurchaseSeries: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... structures of materials to the atomic resolution level. A major advantage of synchrotron XRD over its laboratory counterpart is the super brightness of the synchrotron radiation source, which is many orders of magnitude higher than that of a contemporary laboratory x-ray source ( Ref 1 – 3 ). The brightness...
Abstract
This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in the construction and development of macromolecular x-ray crystallography are also described.
Image
Experimental extended x-ray absorption fine structure scan of germanium in ...
Available to PurchasePublished: 15 December 2019
Fig. 2 Experimental extended x-ray absorption fine structure scan of germanium in GeCl 4 molecule taken by using synchrotron radiation above the K-absorption edge of germanium at 11,103.3 eV. Source: Ref 13
More
Image
Tetragonal fraction in oxide formed in Zircaloy-4 tested in pure water, cal...
Available to Purchase
in Effect of Irradiation on Stress-Corrosion Cracking and Corrosion in Light Water Reactors
> Corrosion: Environments and Industries
Published: 01 January 2006
Fig. 37 Tetragonal fraction in oxide formed in Zircaloy-4 tested in pure water, calculated from synchrotron radiation micro-x-ray diffraction, versus distance from the oxide/metal interface. Source: Ref 176
More
Image
Experimental extended x-ray absorption fine structure scan of nickel metal ...
Available to PurchasePublished: 15 December 2019
Fig. 1 Experimental extended x-ray absorption fine structure scan of nickel metal taken by using synchrotron radiation above the K-absorption edge of nickel at 8332.8 eV. The energy is labeled regarding the K-edge of nickel as zero.
More
Image
Extended x-ray absorption fine structure experimental apparatus at the Stan...
Available to PurchasePublished: 15 December 2019
Fig. 6 Extended x-ray absorption fine structure experimental apparatus at the Stanford Synchrotron Radiation Laboratory. (a) Transmission mode of detection. (b) Fluorescence mode of detection. SPEAR, Stanford Position Electron Accelerator Ring. Source: Ref 35
More
Image
Published: 01 January 1986
Fig. 7 K-edge EXAFS spectra of arsenic in As 2 Te 3 glass. (a) Taken with a conventional x-ray tube. (b) With synchrotron radiation. The sharp white line in (b) is due to higher resolution (approximately 2 eV) compared with approximately 8 eV for the data taken with the x-ray tube. Source
More
Image
(a) Columnar dendritic growth in a directionally solidified Co-Sm-Cu perite...
Available to Purchase
in Thermophysical Properties of Liquids and Solidification Microstructure Characteristics—Benchmark Data Generated in Microgravity
> Metals Process Simulation
Published: 01 November 2010
Polytechnique Fédérale de Lausanne. (b) Equiaxed grains growing in the melt during cooling of an Al-4wt%Cu alloy. Observed by synchrotron x-ray radiography at the European Synchrotron Radiation Facility (Institut Matériaux Microélectronique Nanosciences de Provence, Univ. Paul Cézanne). Equiaxed crystals have
More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006644
EISBN: 978-1-62708-213-6
.... ( Ref 9 ) performed the first x-ray topography experiments using synchrotron radiation on silicon samples. While conventional radiation-based x-ray topography techniques continue to be used, the availability of numerous synchrotron radiation facilities providing intense, low-divergent x-ray beams...
Abstract
X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001760
EISBN: 978-1-62708-178-8
.... Polycrystal scattering topography is particularly useful for evaluating the development and modification of deformation texture due to mechanical processing. Synchrotron Radiation Synchrotron sources produce intense radiation, tunable to various wavelengths, that is advantageous for x-ray topography...
Abstract
X-ray topography is a technique that comprises topography and x-ray diffraction. This article provides a description of the kinematical theory and the dynamical theory of diffraction. It provides useful information on the configurations of reflection and transmission topography. The article explains various topographic methods, namely, divergent beam method, polycrystal rocking curve analysis, line broadening analysis, microbeam method, and polycrystal scattering topography, as well as their instrumentation. It also describes the applications of x-ray topography.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... Å are commonly employed. A wider range, and some possibility of selecting the working wavelength, is offered by synchrotrons and x-ray free-electron lasers (X-FELs). As electromagnetic radiation, x-rays have wave and particle properties. Derivation of all angle-dependent phenomena is based on their wave...
Abstract
This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.
Book Chapter
Radial Distribution Function Analysis
Available to PurchaseSeries: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
... of wavelengths at high intensity results, facilitating angle-dispersive and energy-dispersive measurements. A valuable feature of synchrotron radiation is that angular data can be collected readily at several tunable wavelengths within minutes to hours. Although few synchrotron facilities are available...
Abstract
The diffraction pattern of any material contains structural and chemical property information that can be extracted using radial distribution function analysis. This article provides an introduction to the technique and presents several examples highlighting various ways in which it can be used. It begins with a discussion on the principles of diffraction and scattering and the effectiveness of x-ray, neutron, and electron energy sources for different types of measurements. It provides information on data collection and reduction and explains how to create atomic distribution plots from intensity and scattering angle data. The article also presents application parameters for defining short distances and background intensity and describes a procedure for generating pair distribution functions.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
... enough for the x-rays to penetrate. Using laboratory x-rays, metallic samples typically must be less than 0.1 mm (0.004 in.) thick. The use of synchrotron radiation or neutrons can overcome this limitation. Figure 2 shows a back-reflection pinhole camera. If white radiation is used, the camera...
Abstract
X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation and the techniques used to characterize samples. The article then describes the principles, advantages, and disadvantages of various types of powder diffractometers. A section on the Rietveld method of diffraction analysis is then presented. The article discusses various methods and procedures for qualifying and quantifying phase mixtures in powder samples. It provides information on typical sensitivity and experimental limits on precision of XRPD analysis and other systematic sources of errors that affect accuracy. Some of the factors pertinent to the estimation of crystallite size and defects are also presented. The article ends with a few application examples of XRPD.
1