Analyzing the structure of composite materials is essential for understanding how the part will perform in service. Assessing fiber volume variations, void content, ply orientation variability, and foreign object inclusions helps in preventing degradation of composite performance. This article describes the optical microscopy and bright-field illumination techniques involved in analyzing ply terminations, prepreg plies, splices, and fiber orientation to provide the insight necessary for optimizing composite structure and performance.

This article presents tools, techniques, and procedures that engineers and material scientists can use to investigate plastic part failures. It also provides a brief survey of polymer systems and the key properties that need to be measured during failure analysis. It describes the characterization of plastics by infrared and nuclear magnetic resonance spectroscopy, differential scanning calorimetry, differential thermal analysis, thermogravimetric analysis, thermomechanical analysis, and dynamic mechanical analysis. The article also discusses the use of X-ray diffraction for analyzing crystal phases and structures in solid materials.

Honeycomb-cored sandwich panels increase part stiffness at a lower weight than monolithic composite materials. This article illustrates an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. This area shows the differences in the constituents and resin intermingling. The article discusses the factors that govern the honeycomb core movement and honeycomb core crush, with illustrations. Some common tests performed on honeycomb composites to characterize the skin-to-core bond strength are the climbing drum peel and flatwise tensile tests. The article concludes with a description on the reasons for core failure, which are analyzed after these tests.

X-ray diffraction (XRD) is the most extensively used method for identifying and characterizing various aspects of metals related to the arrangements and spacings of their atoms for bulk structural analysis. XRD techniques are also applicable to ceramics, geologic materials, and most inorganic chemical compounds. This article describes the operating principles and types of XRD analyses, along with information about the threshold sensitivity and precision, limitations, sample requirements, and capabilities of related techniques. The necessary instrumentation for XRD analyses include the Debye-Scherrer camera and the X-ray diffractometer. The article also describes the uses of XRD analyses, such as the identification of phases or compounds in metals and ceramics; detection of order and disorder transformation; determination of lattice parameters and changes in lattice parameters due to alloying and temperature effects; measurement of residual stresses; characterization of crystallite size and perfection; characterization of preferred orientations; and determination of single crystal orientations.

A sandwich structure is comprised of layered composite materials formed by bonding two or more thin facings or facesheets to a relatively thick core material. This article describes the sandwich panel failure modes. It tabulates the nomenclature and definitions for loads, geometry, and material properties. The article illustrates critical strength-check locations for a flat sandwich panel. It discusses the analysis methods formulated for flat rectangular honeycomb panels; curved sandwich panel; and for each of the various sandwich panel failure modes. The article concludes with a discussion on flat panel stability analysis methods.

Welded connections are a common location for failures for many reasons, as explained in this article. This article looks at such failures from a holistic perspective. It discusses the interaction of manufacturing-related cracking and service failures and primarily deals with failures that occur in service due to stresses caused by externally applied loads. The purpose of this article is to enable a failure analyst to identify the causative factors that lead to welded connection failure and to identify the corrective actions needed to overcome such failures in the future. Additionally, the reader will learn from the mistakes of others and use principles that will avoid the occurrence of similar failures in the future. The topics covered include failure analysis fundamentals, welded connections failure analysis, welded connections and discontinuities, and fatigue. In addition, several case studies that demonstrate how a holistic approach to failure analysis is necessary are presented.

This article provides a detailed account of the concepts of single-crystal x-ray diffraction (XRD). It begins with a historical review of XRD methods, followed by a description of the various factors involved in crystal symmetry. The article then focuses on the phase problem in x-ray structural analysis and validation of the structural model. Some of the factors to be considered for performing experimental procedure are provided. The article presents several examples of applications of single-crystal XRD. The following sections cover the crystallographic problem in terms of structural analysis, software programs for crystal structure solution and refinement, and visualization of crystal structures. The article ends with a discussion on various databases available for single-crystal XRD analysis.

This article describes the analytical methods for analyzing surfaces for corrosion and corrosion inhibition processes as well as failure analysis based on surface structure and chemical identity and composition. The principles and applications of the surface-structure analysis techniques, namely, optical microscopy, scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy, are reviewed. The article discusses the principles and applications of chemical identity and composition analysis techniques. These techniques include the energy dispersive X-ray spectroscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, reflectance Fourier transform infrared absorption spectroscopy, Raman and surface enhanced Raman spectroscopy, and extended X-ray absorption fine structure analysis.

This article provides an overview of the structural design process and discusses the life-limiting factors, including material defects, fabrication practices, and stress. It details the role of a failure investigator in performing nondestructive inspection. The article provides information on fatigue life assessment, elevated-temperature life assessment, and fitness-for-service life assessment.

When complex designs, transient loadings, and nonlinear material behavior must be evaluated, computer-based techniques are used. This is where the finite-element analysis (FEA) is most applicable and provides considerable assistance in design analysis as well as failure analysis. This article provides a general view on the applicability of finite-element modeling in conducting analyses of failed components. It highlights the uses of finite-element modeling in the area of failure analysis and design, with emphasis on structural analysis. The discussion covers the general development and both general- and special-purpose applications of FEA. The special-purpose applications of FEA covered are piping and pressure vessel analysis, impact analysis, and microelectronic and microelectromechanical systems analysis. The article provides case histories that involved the use of FEA in failure analysis.

This article is a brief account of low-energy ion-scattering spectroscopy (LEIS) for determining the atomic structure of solid surfaces. It begins with a description of the general principles of LEIS. This is followed by a section providing information on the equipment used for LEIS. Various steps involved in the sample preparation, calibration, and data analysis are then discussed. The article concludes with a section on the applications and interpretation of LEIS in material analysis, including discussion on surface structural analysis, layer-by-layer (Frank-van der Merwe) growth, and low-energy atom-scattering spectroscopy.

This article provides an introduction to extended x-ray absorption fine structure (EXAFS). It describes the fundamentals of EXAFS with an emphasis on the physical mechanism, the single-scattering approximation, and multiple-scattering effects. The article discusses the use of synchrotron radiation as the x-ray source for EXAFS experiments. It also describes the typical EXAFS data analysis of pure nickel at 90 K, and explains the near-edge structure analysis of vanadium. The article presents a discussion on the unique features and applications of EXAFS.