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small-angle neutron scattering

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001763
EISBN: 978-1-62708-178-8
..., desmearing parameters, and the types of scattering curves are illustrated. ceramics ferrous metals metallic glass nonferrous metals polymers small-angle neutron scattering small-angle X-ray diffraction Overview Introduction Small-angle x-ray scattering (SAXS) and small-angle neutron...
Image
Published: 30 June 2023
Fig. 1 Computational modeling spanning a hierarchy of microstructural length scales (right) and advanced experimental characterization techniques (left) used for calibration and validation. SAM, scanning acoustic microscopy; SANS, small-angle neutron scattering; XRD, x-ray diffraction; APFIM More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... SANS small-angle neutron scattering SAM scanning Auger microscopy SAXS small-angle x-ray scattering SEM scanning electron microscopy SERS surface-enhanced Raman spectroscopy SFC supercritical fluid chromatography SIMS secondary ion mass spectroscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
... is then selected using a monochromator crystal, and intensity data are collected over the range of scattering angles. Data collection may require one to several days. Intense beams of neutrons can be produced in conjunction with some particle accelerators in which a pulse of protons is used to produce a pulse...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
..., with the best resolution provided by detector banks located at large scattering angles (2θ ∼ 160°). However, such a bank will only collect data for relatively small d -spacing, because long neutron wavelengths (≳2 Å) are not used. Therefore, data for longer spacings must be collected on detector banks...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
..., which can then be readily converted into d -spacing via Bragg’s law, in the same way as for x-ray diffraction. In the case of TOF diffraction, data are collected in two dimensions: scattering angle and TOF. The neutron wavelength can be extracted from TOF via the de Broglie relationship: (Eq 9) λ...
Image
Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass More
Image
Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... result in very broad diffraction peaks. On the other hand, when the beams scattered by a semi-infinite number of adjacent planes are summed, constructive interference and significant diffracted intensity are only obtained at angles that exactly satisfy Bragg's law. In this case, very narrow diffracted...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... some information may be obtained on amorphous solids and liquids using the pair distribution function method or complementary techniques (see the articles “Small-Angle X-Ray and Neutron Scattering” and “Micro X-Ray Diffraction” in this Division). Similar or complementary information often can...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... of a field ion element due to a change in chemical with a small energy loss. The back- microscope with a hole in its screen open- bonding relative to a specified element or scattered electron yield is strongly de- ing into a mass spectrometer; atoms are compound. pendent upon atomic number, qualita- removed...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003238
EISBN: 978-1-62708-199-3
... focal spot is projected as a roughly square effective focal spot by inclining the anode face at a small angle (usually about 20°) to the centerline of the x-ray beam, as shown in Fig. 4 . Fig. 4 Schematic diagram of the actual and effective focal spots of an anode that is inclined at 20...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003732
EISBN: 978-1-62708-177-1
... waves in the solid. The kinetics of a spinodal reaction can be quantitatively studied using small-angle x-ray and neutron scattering, by monitoring the change in intensity distribution around the direct beam. Fig. 5 Selected area diffraction pattern of Cu-15Ni-8Sn alloy showing satellites from...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... planes, and y is the channeling process. Channeling contrast from the slope of a thermomechanical anal- Bragg angle, or the angular distance commonly results from variation in back- ysis or dilatometer plot of dL/L0 versus T. between the incident beam and the lattice scattered electron yields...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
... of information that can be obtained, and its interpretation. In general, x-ray analysis is restricted to crystalline materials, although some information may be obtained on amorphous solids and liquids. These topics are discussed in the articles “Radial Distribution Function Analysis” and “Small-Angle X...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... chromatography; LC/MS: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... spaced, the scattered x-rays from all of the planes will have constructive interference at the same θ angles, at which point x-rays appear to be “reflected” by the planes. This is why diffraction peaks also are called reflections. The concept of crystal planes and the analogy of diffraction to reflection...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006432
EISBN: 978-1-62708-192-4
... using neutron activation can be found in Ref 10 and 17 , among others. Thin Layer (TLA) or Surface Layer (SLA) Activation Thin layer activation uses accelerated particles, which are aimed at a small area (usually a few mm 2 ) on the surface area of the sample. Commonly, protons, deuterons, 3...
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005532
EISBN: 978-1-62708-197-9
... range of reflections. In recent years, significant progress has been made in extending conventional analysis of neutron-scattering data to simultaneously obtain information on texture, crystal structure, elastic strains, and grain size ( Ref 10 ). Thus, neutron diffraction proves to be useful...