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small-angle neutron scattering
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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001763
EISBN: 978-1-62708-178-8
..., desmearing parameters, and the types of scattering curves are illustrated. ceramics ferrous metals metallic glass nonferrous metals polymers small-angle neutron scattering small-angle X-ray diffraction Overview Introduction Small-angle x-ray scattering (SAXS) and small-angle neutron...
Abstract
This article presents the experimental and theoretical aspects of small-angle scattering, and discusses specific applications used in the characterization of metals, glasses, polymers, and ceramics. The basic methods of collimating x-rays, the cause of smearing from a line source, desmearing parameters, and the types of scattering curves are illustrated.
Image
in Aluminum Alloy Design for Additive Manufacturing
> Additive Manufacturing Design and Applications
Published: 30 June 2023
Fig. 1 Computational modeling spanning a hierarchy of microstructural length scales (right) and advanced experimental characterization techniques (left) used for calibration and validation. SAM, scanning acoustic microscopy; SANS, small-angle neutron scattering; XRD, x-ray diffraction; APFIM
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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... SANS small-angle neutron scattering SAM scanning Auger microscopy SAXS small-angle x-ray scattering SEM scanning electron microscopy SERS surface-enhanced Raman spectroscopy SFC supercritical fluid chromatography SIMS secondary ion mass spectroscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001762
EISBN: 978-1-62708-178-8
... is then selected using a monochromator crystal, and intensity data are collected over the range of scattering angles. Data collection may require one to several days. Intense beams of neutrons can be produced in conjunction with some particle accelerators in which a pulse of protons is used to produce a pulse...
Abstract
The diffraction pattern of any material contains structural and chemical property information that can be extracted using radial distribution function analysis. This article provides an introduction to the technique and presents several examples highlighting various ways in which it can be used. It begins with a discussion on the principles of diffraction and scattering and the effectiveness of x-ray, neutron, and electron energy sources for different types of measurements. It provides information on data collection and reduction and explains how to create atomic distribution plots from intensity and scattering angle data. The article also presents application parameters for defining short distances and background intensity and describes a procedure for generating pair distribution functions.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
..., with the best resolution provided by detector banks located at large scattering angles (2θ ∼ 160°). However, such a bank will only collect data for relatively small d -spacing, because long neutron wavelengths (≳2 Å) are not used. Therefore, data for longer spacings must be collected on detector banks...
Abstract
Neutrons are a principal tool for the study of lattice vibrational spectra in materials. This article provides a detailed account of fission and spallation methods of neutron production that are capable of producing sufficient intensity to be useful in neutron scattering research. It describes the instrumentation required for, and advancements made in, neutron powder diffraction. The article further explains the texture and residual stress (macrostresses and microstresses) problems that are analyzed using the neutron powder diffraction method. It also outlines the single-crystal neutron diffraction technique, and provides examples of the applications of neutron diffraction.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
..., which can then be readily converted into d -spacing via Bragg’s law, in the same way as for x-ray diffraction. In the case of TOF diffraction, data are collected in two dimensions: scattering angle and TOF. The neutron wavelength can be extracted from TOF via the de Broglie relationship: (Eq 9) λ...
Abstract
This article provides a brief introduction to neutron diffraction as well as its state-of-the-art capabilities. The discussion covers the general principles of the neutron, neutron-scattering theory, generation of neutrons, types of incident radiation, and purposes of single-crystal neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also presents application examples and possible future developments in neutron diffraction.
Image
in Introduction to Characterization of Organic Solids and Organic Liquids
> Materials Characterization
Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass
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Image
Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning
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Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... result in very broad diffraction peaks. On the other hand, when the beams scattered by a semi-infinite number of adjacent planes are summed, constructive interference and significant diffracted intensity are only obtained at angles that exactly satisfy Bragg's law. In this case, very narrow diffracted...
Abstract
X-ray diffraction (XRD) is the most extensively used method for identifying and characterizing various aspects of metals related to the arrangements and spacings of their atoms for bulk structural analysis. XRD techniques are also applicable to ceramics, geologic materials, and most inorganic chemical compounds. This article describes the operating principles and types of XRD analyses, along with information about the threshold sensitivity and precision, limitations, sample requirements, and capabilities of related techniques. The necessary instrumentation for XRD analyses include the Debye-Scherrer camera and the X-ray diffractometer. The article also describes the uses of XRD analyses, such as the identification of phases or compounds in metals and ceramics; detection of order and disorder transformation; determination of lattice parameters and changes in lattice parameters due to alloying and temperature effects; measurement of residual stresses; characterization of crystallite size and perfection; characterization of preferred orientations; and determination of single crystal orientations.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... some information may be obtained on amorphous solids and liquids using the pair distribution function method or complementary techniques (see the articles “Small-Angle X-Ray and Neutron Scattering” and “Micro X-Ray Diffraction” in this Division). Similar or complementary information often can...
Abstract
This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.
Book Chapter
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... of a field ion element due to a change in chemical with a small energy loss. The back- microscope with a hole in its screen open- bonding relative to a specified element or scattered electron yield is strongly de- ing into a mass spectrometer; atoms are compound. pendent upon atomic number, qualita- removed...
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... planes, and y is the channeling process. Channeling contrast from the slope of a thermomechanical anal- Bragg angle, or the angular distance commonly results from variation in back- ysis or dilatometer plot of dL/L0 versus T. between the incident beam and the lattice scattered electron yields...
Book Chapter
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003238
EISBN: 978-1-62708-199-3
... focal spot is projected as a roughly square effective focal spot by inclining the anode face at a small angle (usually about 20°) to the centerline of the x-ray beam, as shown in Fig. 4 . Fig. 4 Schematic diagram of the actual and effective focal spots of an anode that is inclined at 20...
Abstract
Radiography is a nondestructive-inspection method that is based on the differential absorption of penetrating radiation by the part or test piece (object) being inspected. This article discusses the fundamentals and general applications of radiography, and describes the sources of radiation in radiographic inspection, including X-rays and gamma rays. It deals with the characteristics that differentiate neutron radiography from X-ray or gamma-ray radiography. The geometric principles of shadow formation, image conversion, variation of attenuation with test-piece thickness, and many other factors that govern the exposure and processing of a neutron radiograph are similar to those for radiography using X-rays or gamma rays.
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003732
EISBN: 978-1-62708-177-1
... waves in the solid. The kinetics of a spinodal reaction can be quantitatively studied using small-angle x-ray and neutron scattering, by monitoring the change in intensity distribution around the direct beam. Fig. 5 Selected area diffraction pattern of Cu-15Ni-8Sn alloy showing satellites from...
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... chromatography; LC/MS: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM...
Abstract
This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
... of information that can be obtained, and its interpretation. In general, x-ray analysis is restricted to crystalline materials, although some information may be obtained on amorphous solids and liquids. These topics are discussed in the articles “Radial Distribution Function Analysis” and “Small-Angle X...
Abstract
X-ray diffraction techniques are useful for characterizing crystalline materials, such as metals, intermetallics, ceramics, minerals, polymers, plastics, and other inorganic or organic compounds. This article discusses the theory of x-rays and how they are generated and detected. It also describes the crystalline nature of certain materials and how the geometry of a unit cell, and hence crystal lattice, affects the direction and intensity of diffracted x-ray beams. The article concludes with several application examples involving measurements on single and polycrystalline materials.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... spaced, the scattered x-rays from all of the planes will have constructive interference at the same θ angles, at which point x-rays appear to be “reflected” by the planes. This is why diffraction peaks also are called reflections. The concept of crystal planes and the analogy of diffraction to reflection...
Abstract
This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in the construction and development of macromolecular x-ray crystallography are also described.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006432
EISBN: 978-1-62708-192-4
... using neutron activation can be found in Ref 10 and 17 , among others. Thin Layer (TLA) or Surface Layer (SLA) Activation Thin layer activation uses accelerated particles, which are aimed at a small area (usually a few mm 2 ) on the surface area of the sample. Commonly, protons, deuterons, 3...
Abstract
Radionuclide methods for wear measurement are used to measure wear continuously throughout a tribological experiment at a resolution of nanometers or micrograms per hour. This article presents an overview of radionuclide methods for wear measurement. It discusses complementary wear measurement methods to introduce the advantages of using radioactive isotopes (RI) for wear or corrosion measurements in comparison to other methods. The article provides information on radiation safety regulations and approaches to minimize external radiation exposure. It describes neutron activation, thin layer or surface layer activation, and ultrathin layer or recoil activation that are used to create radioactive isotopes in the samples to be tested. The article reviews the two common types of wear measurement setup configurations: the direct method and the indirect method. It concludes with a discussion on the practical application of wear measurement using radioactive isotopes.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
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