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Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006455
EISBN: 978-1-62708-190-0
.... The article discusses the three major inspection techniques for tubular sections, namely, the double-wall, double-image technique; the double-wall, single-image technique; and the single-wall, single-image technique. It illustrates the arrangements of penetrameters and identification markers...
Abstract
Film radiography requires the development of the exposed film so that the latent image becomes visible for viewing. It describes the general characteristics of film, including speed, gradient, and graininess, and the factors affecting film selection and exposure time. The article discusses the three major inspection techniques for tubular sections, namely, the double-wall, double-image technique; the double-wall, single-image technique; and the single-wall, single-image technique. It illustrates the arrangements of penetrameters and identification markers for the radiography of plates, cylinders, and flanges. The article discusses various control methods, including the use of lead screens; protection against backscatter and scatter from external objects; and the use of masks, diaphragms, collimators, and filtration. The radiographic appearance of specific types of flaws is also discussed. The article concludes with a discussion on two methods of radiographic film processing: manual and automatic processing.
Image
Published: 01 August 2018
Fig. 16 Schematic of the double-wall, single-image inspection technique applied to a circumferential butt weld in a large-diameter pipe showing relation of radiation beam, weld, and film
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Image
Published: 01 June 2012
Fig. 3 Light microscopy image of as-cut surfaces of a stainless steel stent. This image was produced from multiple images combined using an extended depth-of-field technique to allow the surfaces of interest to be in focus in a single image.
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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... or sequentially by the repositioning of a single camera. The resulting image pairs are viewed with a stereoviewer, enabling the observation of three-dimensional features and characteristics. Similar techniques are used with the scanning electron microscope by the capture of sequential images, with the second...
Abstract
This article reviews photographic principles, namely, visual examination, field photographic documentation, and laboratory photographic documentation, as applied to failure analysis and the specific techniques employed in both the field and laboratory. It provides information on the photographic equipment used in failure analysis and on film and digital photography. The article describes the basics of photography and the uses of different types of lighting in photography of a fractured surface. The article also addresses the techniques involved in macrophotography and microscopic photography as well as other special techniques.
Image
Published: 01 December 2004
Fig. 28 Secondary electron image of a Nd 2 Fe 14 B single crystal grown using flux growth synthesis. Type I magnetic contrast clearly shows the maze pattern domains, typical of these uniaxial materials. The large depth of field, characteristic of scanning electron imaging techniques
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Image
Published: 01 August 2018
Fig. 17 Schematic of techniques employing different arrangements of radiation source, cylinder, and film for the single-wall, single-image radiography of cylindrical sections using external and internal radiation sources. See text for discussion.
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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
...Abstract Abstract This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification...
Abstract
This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification, fabrication methods, sample preparation, bulk/elemental characterization methods, microstructural characterization methods, surface characterization methods, and electronic characterization methods.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006644
EISBN: 978-1-62708-213-6
... of a single crystal was recorded as early as 1931 by Berg ( Ref 1 ) and later by Barrett ( Ref 2 ), developing the technique commonly known as Berg-Barrett reflection topography, which is used to study large-sized crystals. Subsequently, the x-ray topography technique was developed to image and characterize...
Abstract
X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006469
EISBN: 978-1-62708-190-0
..., surface (Rayleigh) wave and ultrasonic polar scan techniques. electronic equipment pulse-echo method single-element transducer-based system surface wave technique transducers transmission method ultrasonic inspection ultrasonic polar scan technique THIS ARTICLE CONSIDERS the two primary...
Abstract
This article considers the two primary methods used for ultrasonic inspection: pulse-echo and the transmission methods. Pulse-echo inspection can be accomplished with longitudinal, shear, surface (Rayleigh), or Lamb (plate) waves using a diverse range of transducers. The article discusses the principles of each of these inspection methods. It describes the applications and the basic data formats for single-element transducer-based systems, including A-scans, B-scans, and C-scans. The article provides information on electronic equipment used for ultrasonic inspection. It also describes how specific material conditions produce and modify A-scan indications. The article provides information on the controls and their functions for the display unit of the electronic equipment. It describes the techniques used for the identification and characterization of flaws, namely, surface (Rayleigh) wave and ultrasonic polar scan techniques.
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... and features observed during a failure analysis investigation is photography. Failure analysis photographic imaging is a combination of both science and art; experience and proper imaging techniques are required to produce an accurate and meaningful fracture surface photograph. This article reviews...
Abstract
Failure analysis is an investigative process that uses visual observations of features present on a failed component fracture surface combined with component and environmental conditions to determine the root cause of a failure. The primary means of recording the conditions and features observed during a failure analysis investigation is photography. Failure analysis photographic imaging is a combination of both science and art; experience and proper imaging techniques are required to produce an accurate and meaningful fracture surface photograph. This article reviews photographic principles and techniques as applied to failure analysis, both in the field and in the laboratory. The discussion covers the processes involved in field and laboratory photographic documentations, provides a description of professional digital cameras, and gives information on photographic lighting and microscopic photography. Special techniques can be employed to deal with highly reflective conditions and are also described in this article.
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005616
EISBN: 978-1-62708-174-0
... , 20 ). Instead of using a conventional single probe consisting of transmitting and receiving coils in the same housing, various specialized eddy current techniques have been adapted. One such example is an array eddy current probe having several coils configured in a two-dimensional planar format...
Abstract
This article describes the fundamental aspects of three nondestructive evaluation (NDE) methods of solid-state welds in terms of operation principles. These methods are radiography, ultrasound, and eddy current methods. The article provides examples of these NDE techniques performed on various types of flaws resulting from solid-state welding processes.
Book Chapter
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006477
EISBN: 978-1-62708-190-0
..., which helps minimize the lift-off variations. Considering the noise source in the eddy-current method, having a small variation in the lift-off is a big advantage over many single-probe-based scan techniques. In many cases, advanced signal-processing algorithms can be used to produce more intuitive...
Abstract
A number of nondestructive evaluation (NDE) methods, such as radiography, ultrasound, and eddy current, are available to detect flaws in solid materials. This article describes the fundamental aspects of these NDE methods in terms of operation principles. It presents some examples of the methods performed on various types of flaws resulting from solid-state welding processes.
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005504
EISBN: 978-1-62708-197-9
... composition, and crystallographic orientation, this technique works best for single crystals of uniform composition with a flat surface. As the ion beam is rastered over the surface, material is removed at a nominally fixed rate, and microstructural information can be collected via secondary electron imaging...
Abstract
This article reviews the characterization methods for producing 3-D microstructural data sets. The methods include serial sectioning by mechanical material removal method and focused ion beam tomography method. The article describes how these data sets are used in realistic 3-D simulations of microstructural evolution during materials processing and materials response. It also explains how the 3-D experimental data are actually input and used in the simulations using phase-field modeling and finite-element modeling.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... to determine both trace, major, and minor elements in a single experiment with minimum chemical interferences. Development of a similar technique, for isotope and trace analysis—namely inductively coupled plasma mass spectrometry (ICP-MS)—began in the 1980s and is currently considered as equally...
Abstract
This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001760
EISBN: 978-1-62708-178-8
... useful in characterizing the junction. Topographic imaging techniques aid investigation of heterojunctions. Topographs can be taken of samples prepared with single or multiple films to reveal the misfit dislocations and other interfacial defects. The defect distribution can then be correlated...
Abstract
X-ray topography is a technique that comprises topography and x-ray diffraction. This article provides a description of the kinematical theory and the dynamical theory of diffraction. It provides useful information on the configurations of reflection and transmission topography. The article explains various topographic methods, namely, divergent beam method, polycrystal rocking curve analysis, line broadening analysis, microbeam method, and polycrystal scattering topography, as well as their instrumentation. It also describes the applications of x-ray topography.
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006851
EISBN: 978-1-62708-395-9
..., with accompanying software capability, a computer-controlled digital microscope or specimen stage can be used to acquire multiple images at different focal planes and combine the images into a single image, a technique known as “focus-stacking” or “Z-stacking.” This ability to readily capture multiple focal plane...
Abstract
Failure analysis is an investigative process in which the visual observations of features present on a failed component and the surrounding environment are essential in determining the root cause of a failure. This article reviews the basic photographic principles and techniques that are applied to failure analysis, both in the field and in the laboratory. It discusses the processes involved in visual examination, field photographic documentation, and laboratory photographic documentation of failed components. The article describes the operating principles of each part of a professional digital camera. It covers basic photographic principles and manipulation of settings that assist in producing high-quality images. The need for accurate photographic documentation in failure analysis is also presented.
Series: ASM Handbook
Volume: 1A
Publisher: ASM International
Published: 31 August 2017
DOI: 10.31399/asm.hb.v01a.a0006336
EISBN: 978-1-62708-179-5
... machines or noncontact visual sensors with image analysis capabilities. The type of techniques and equipment required to perform a dimensional inspection depends on a number of factors, such as the size and shape of the part, speed of inspection/automation, tolerance requirements, portability...
Abstract
Nondestructive inspection (NDI) methods for cast iron are used to ensure that the parts supplied perform as required by the purchaser. This article focuses on the principal nondestructive methods used to inspect for anomalies in cast irons and to determine if the volume, shape, size, or number of these anomalies exceeds the maximum allowed by the purchaser. The nondestructive methods include visual inspection, dimensional inspection, liquid penetrant inspection, magnetic-particle inspection, eddy-current inspection, radiographic inspection, ultrasonic inspection, resonant testing, and leak testing. The technique, strengths, and weaknesses of each of the nondestructive methods are also discussed.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
... Single crystal or powder Crystal perfection Direct imaging Single crystal Line shape analysis Powder In general, the techniques are classified as single crystal or polycrystalline. The information obtainable can be categorized as position, intensity, and shape of the diffraction peaks...
Abstract
X-ray diffraction techniques are useful for characterizing crystalline materials, such as metals, intermetallics, ceramics, minerals, polymers, plastics, and other inorganic or organic compounds. This article discusses the theory of x-rays and how they are generated and detected. It also describes the crystalline nature of certain materials and how the geometry of a unit cell, and hence crystal lattice, affects the direction and intensity of diffracted x-ray beams. The article concludes with several application examples involving measurements on single and polycrystalline materials.
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
...Abstract Abstract Three-dimensional microscopy can be used to reveal the shape, distribution, and connectivity of three-dimensional (3D) features that lie buried within an opaque material. This article discusses several experimental techniques that can be used to generate 3D images...
Abstract
Three-dimensional microscopy can be used to reveal the shape, distribution, and connectivity of three-dimensional (3D) features that lie buried within an opaque material. This article discusses several experimental techniques that can be used to generate 3D images. These include serial sectioning, focused ion beam tomography, atom probe tomography, and X-ray microtomography. Nine case studies are presented that represent the work of the various research groups currently working on 3D microscopy using serial sectioning and illustrate the variants of the basic experimental techniques. The article also discusses the techniques for reconstruction and visualization of 3D microstructures with advanced computer software and hardware.
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006456
EISBN: 978-1-62708-190-0
... techniques that are similar to XCT. These are single-photon emission computed tomography (SPECT) and positron emission tomography (PET) scanning, which produce cross-sectional displays of the tracer concentration ( Ref 15 ). Nuclear Magnetic Resonance (NMR) Imaging Nuclear magnetic resonance (NMR...
Abstract
Computed tomography (CT) is an imaging technique that generates a three-dimensional (3-D) volumetric image of a test piece. This article illustrates the basic principles of CT and provides information on the types, applications, and capabilities of CT systems. A comparison of performance characteristics for film radiography, real-time radiography, and X-ray computed tomography is presented in a table. A functional block diagram of a typical computed tomography system is provided. The article discusses CT scanning geometry that is used to acquire the necessary transmission data. It also provides information on digital radiography, image processing and analysis, dual-energy imaging, and partial angle imaging, of a CT system.