Neutrons are a principal tool for the study of lattice vibrational spectra in materials. This article provides a detailed account of fission and spallation methods of neutron production that are capable of producing sufficient intensity to be useful in neutron scattering research. It describes the instrumentation required for, and advancements made in, neutron powder diffraction. The article further explains the texture and residual stress (macrostresses and microstresses) problems that are analyzed using the neutron powder diffraction method. It also outlines the single-crystal neutron diffraction technique, and provides examples of the applications of neutron diffraction.

This article provides a brief introduction to neutron diffraction as well as its state-of-the-art capabilities. The discussion covers the general principles of the neutron, neutron-scattering theory, generation of neutrons, types of incident radiation, and purposes of single-crystal neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also presents application examples and possible future developments in neutron diffraction.

X-ray diffraction (XRD) is the most extensively used method for identifying and characterizing various aspects of metals related to the arrangements and spacings of their atoms for bulk structural analysis. XRD techniques are also applicable to ceramics, geologic materials, and most inorganic chemical compounds. This article describes the operating principles and types of XRD analyses, along with information about the threshold sensitivity and precision, limitations, sample requirements, and capabilities of related techniques. The necessary instrumentation for XRD analyses include the Debye-Scherrer camera and the X-ray diffractometer. The article also describes the uses of XRD analyses, such as the identification of phases or compounds in metals and ceramics; detection of order and disorder transformation; determination of lattice parameters and changes in lattice parameters due to alloying and temperature effects; measurement of residual stresses; characterization of crystallite size and perfection; characterization of preferred orientations; and determination of single crystal orientations.

This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.

The diffraction pattern of any material contains structural and chemical property information that can be extracted using radial distribution function analysis. This article provides an introduction to the technique and presents several examples highlighting various ways in which it can be used. It begins with a discussion on the principles of diffraction and scattering and the effectiveness of x-ray, neutron, and electron energy sources for different types of measurements. It provides information on data collection and reduction and explains how to create atomic distribution plots from intensity and scattering angle data. The article also presents application parameters for defining short distances and background intensity and describes a procedure for generating pair distribution functions.

This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.

X-ray diffraction techniques are useful for characterizing crystalline materials, such as metals, intermetallics, ceramics, minerals, polymers, plastics, and other inorganic or organic compounds. This article discusses the theory of x-rays and how they are generated and detected. It also describes the crystalline nature of certain materials and how the geometry of a unit cell, and hence crystal lattice, affects the direction and intensity of diffracted x-ray beams. The article concludes with several application examples involving measurements on single and polycrystalline materials.

This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in the construction and development of macromolecular x-ray crystallography are also described.

This article is a compilation of definitions of terms related to materials characterization techniques.

This article discusses the central aspect of anisotropy modeling, namely, texture measurement and analysis. It provides an overview of the methods available for characterizing crystallographic preferred orientation, or texture, in polycrystalline materials. These methods include pole figure measurement and electron backscatter diffraction (EBSD). The article describes the process considerations for pole figure measurement, including X-ray diffraction, neutron diffraction, stereographic projection, equal area projection, graphing pole figures, typical textures, and orientation distribution. It also deals with the limitations and challenges associated with the EBSD, and applications of the diffraction.

This article provides a detailed account of the concepts of single-crystal x-ray diffraction (XRD). It begins with a historical review of XRD methods, followed by a description of the various factors involved in crystal symmetry. The article then focuses on the phase problem in x-ray structural analysis and validation of the structural model. Some of the factors to be considered for performing experimental procedure are provided. The article presents several examples of applications of single-crystal XRD. The following sections cover the crystallographic problem in terms of structural analysis, software programs for crystal structure solution and refinement, and visualization of crystal structures. The article ends with a discussion on various databases available for single-crystal XRD analysis.

X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.

This article is a compilation of terms and definitions related to materials characterization.

This article describes the mechanisms involved in creating texture for various metal-fabrication processes, namely, solidification, deformation, recrystallization and grain growth, thin-film deposition, and imposition of external magnetic fields. It discusses two experimental and analytical approaches for experimental determination of texture: one using classical diffraction and pole figure measurement techniques and the other using individual orientation measurements. The article also provides information on microtexture, grain-boundary character, and texture gradients. It concludes with information on texture evolution through modeling.

This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification, fabrication methods, sample preparation, bulk/elemental characterization methods, microstructural characterization methods, surface characterization methods, and electronic characterization methods.

This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.

Self-consistent models are a particular class of models in continuum micromechanics, that is, the field concerned with making predictions of the properties and evolution of aggregates whose single-crystal deformation behavior is known. This article provides information on the measurement and representation of textures as well as prediction of texture evolution in single-phase materials and two-phase aggregates.

This article provides a detailed account of x-ray diffraction (XRD) residual-stress techniques. It begins by describing the principles of XRD stress measurement, followed by a discussion on the most common methods of XRD residual-stress measurement. Some of the procedures required for XRD residual-stress measurement are then presented. The article provides information on measurement of subsurface stress gradients and stress relaxation caused by layer removal. The article concludes with a section on examples of applications of XRD residual-stress measurement that are typical of industrial metallurgical, process development, and failure analysis investigations undertaken at Lambda Research.