1-20 of 72 Search Results for

scanning tunneling microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... is scanned to generate an image. Imaging of insulated surface structure at atomic resolution Scanning tunneling microscopy (STM) Tunneling current is monitored as the probe tip is scanned over a surface of interest in the x - y plane to generate an image. Imaging of conducting surface structure...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
.... These include electron microscopy, scanning tunneling microscopy, atomic force microscopy, and scanning acoustic microscopy. The article also reviews the X-ray diffraction technique used for determining the compositional changes, strain changes, and residual stress evaluation during the fatigue process...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... of nanotechnology and the development of smart coatings have been dependent largely on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. ball milling chemical vapor...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006633
EISBN: 978-1-62708-213-6
.... scanning tunneling microscope scanning probe microscopy atomic force microscope References 1. Binnig G. , Rohrer H. , Gerber C. , and Weibel E. , Surface Studies by Scanning Tunneling Microscopy , Phys. Rev. Lett. , Vol 49 , 1982 , p 57 – 61 10.1103...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
... photon scanning tunneling microscopy PW projection welding PWAA postweld artificial aging PWHT postweld heat treatment PWM pulse width modulation Q&T quenched and tempered R roentgen R a surface roughness in terms of arithmetic average RA rosin fully activated...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002353
EISBN: 978-1-62708-193-1
... in U. Scanning probe microscopy refers to a class of surface diagnostic techniques that operate by scanning a fine probe across a specimen surface. The first such instrument is the topographiner developed by Young in the early 70s ( Ref 58 ), followed by the now well-known scanning tunneling...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001347
EISBN: 978-1-62708-173-3
... are still far from reaching that goal. This is the case even for simple systems, such as metal pair that form solid solutions. The opportunities for understanding interfacial behavior come from studies conducted at the atomic level (for example, using scanning tunneling microscopy, transmission electron...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001348
EISBN: 978-1-62708-173-3
.... Mater. Res. 47. Colton R.J. , Marrian C.R.K. , and Stroscio J.A. , Ed., Proc. Fifth Int. Conf. Scanning Tunneling Microscopy/Spectroscopy (SAM '90) and the First Int. Conf. Nanometer Scale Science and Technology (NANO I) ( Baltimore, MD ), June 1990 , and J. Vac. Sci. Tech. B...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
.... , Ueda K. , and Gibson W. M. , Ag/Cu(111) Surface Structure and Metal Epitaxy by Impact-Collision Ion-Scattering Spectroscopy and Scanning Tunneling Microscopy , Phys. Rev. B , Vol 63 , 2000 , p 035402 10.1103/PhysRevB.63.035402 7. Robinson M.T. and Torrens I.M. , Computer...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... electron spectroscopy; GIWAXS: grazing-incidence wide angle x-ray scattering; OM: optical microscopy; energy dispersive x-ray spectrometry; STM: scanning tunneling microscopy; SPM: scanning probe microscopy; RS: Raman spectroscopy The starting point for many microelectronic devices is a single...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.a0003837
EISBN: 978-1-62708-183-2
... SO 4 , 0.7 pH. SCE, saturated calomel electrode Fig. 12 (a) 300 nm×300 nm scanning tunneling microscopy topography and (b) I/V curve for oxidized TiAl after exposure to atmospheric environment. Source: Ref 71 Fig. 7 Thermogravimetric test data for chromium-containing Fe 3 Al...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003620
EISBN: 978-1-62708-182-5
... in the surface layer or expose large clusters of “A” atoms in the second-layer terrace. The vacancy clusters grow with continued dissolution of “A” atoms, and, as a result, its overall diffusion decreases with time, resulting in a decreasing current. In situ scanning tunneling microscopy (STM) results support...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
... Electric field Tunnel current Surface and subsurface formation ≈0.1 nm; depth direction ≈0.1 nm Various applications, including scanning tunneling microscopy and atomic force microscopy STEM Scanning transmission microscopy Electron Electron (transmission) Polarization ≈1 nm Crystallization...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... Abstract This article is an overview of the division Surface Analysis of this volume. The division covers various developed surface-analysis techniques, such as scanning probe and atomic force microscopy. The division focuses on the analysis of surface layers that are less than 100 nm...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
..., and scanning tunneling microscopy) and stereochemistry (infrared and Raman spectroscopy). Recent trends are the development of increased spatial resolution (e.g., toward the 10 nm region and below in AES and SIMS) and improved databases and evaluation software for quantitative analysis. With the exception...
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003282
EISBN: 978-1-62708-176-4
... (stylus)-based methods, parameters such as filter type, cutoff length, stylus travel velocity, and stylus tip radius have to be standardized. In the recent past, techniques such as scanning probe microscopy (atomic force microscopy and scanning tunneling microscopy), confocal microscopy, and light...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
...) STA solution-treated and aged std standard STEM scanning transmission electron microscope/microscopy STLE Society of Tribologists and Lubrication Engineers (formerly ASLE) STM scanning tunneling microscope/microscopy SUS Saybolt Universal Seconds (viscosity) SWE...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003614
EISBN: 978-1-62708-182-5
.... (a) Advancing head and cracked tail section of a filiform cell. Scanning electron microscopy (SEM). 80×. (b) The gelatinous corrosion products of aluminum oozing out of the porous end tail section of a filiform cell. SEM. 830×. (c) Tail region of a filiform cell. Tail appears iridescent due to internal...