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scanning tunneling microscopy

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Published: 01 January 2005
Fig. 11 (a) 175 nm×175 nm scanning tunneling microscopy topography and (b) (d I /d V )/( I/V ) curves for TiAl after exposure to environment with 100 Langmuir oxygen (1 Langmuir is 10 −6 torr · s) SS, surface state. Source: Ref 71 More
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Published: 01 January 2005
Fig. 12 (a) 300 nm×300 nm scanning tunneling microscopy topography and (b) I/V curve for oxidized TiAl after exposure to atmospheric environment. Source: Ref 71 More
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... techniques, namely, optical microscopy, scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy, are reviewed. The article discusses the principles and applications of chemical identity and composition analysis techniques. These techniques include the energy dispersive X-ray...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
... emission techniques, ultrasonic methods, eddy current techniques, infrared techniques, exoelectron methods, and gamma radiography. The article explains the microscopy methods used to determine fatigue crack initiation and propagation. These include electron microscopy, scanning tunneling microscopy, atomic...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... of nanotechnology and the development of smart coatings have been dependent largely on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. ball milling chemical vapor...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006633
EISBN: 978-1-62708-213-6
.... scanning tunneling microscope scanning probe microscopy atomic force microscope Overview SINCE THE INTRODUCTION of the scanning tunneling microscope (STM) in 1981 and the atomic force microscope (AFM) in 1985, many variations of probe-based microscopies, referred to as scanning probe microscopes...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
... photon scanning tunneling microscopy PW projection welding PWAA postweld artificial aging PWHT postweld heat treatment PWM pulse width modulation Q&T quenched and tempered R roentgen R a surface roughness in terms of arithmetic average RA rosin fully activated...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0005663
EISBN: 978-1-62708-173-3
... per square inch absolute Abbreviations and Symbols / 1223 psig gage pressure (pressure relative to ambi- SPA-LEED spot profile analysis-low-energy equals ent pressure) in pounds per square inch electron diffraction = approximately equals ~ not equal to PSTM photon scanning tunneling microscopy SPC...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002353
EISBN: 978-1-62708-193-1
..., scanning tunneling microscopy has been used successfully to track the initiation of microcracks during fatigue deformation of silver single crystals ( Ref 30 ). In order to minimize tip artifacts, the tip must be sharp with a small opening angle. Also, imaging conditions must be chosen to minimize tip...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001347
EISBN: 978-1-62708-173-3
... for understanding interfacial behavior come from studies conducted at the atomic level (for example, using scanning tunneling microscopy, transmission electron microscopy, first principles energy band calculations, and embedded atom potential calculations) with appropriate correlations to both micromechanics...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006183
EISBN: 978-1-62708-175-7
... electron microscopy mm microinch STM scanning tunneling microscopy ms micrometer (micron) Sv sievert n microsecond t thickness; time p Poisson s ratio; velocity T Tesla; transverse direction r pi (3.141592) T absolute temperature; temperature; tenacity; total s density; resistivity dispersion...
Image
Published: 15 June 2020
Fig. 5 Bond formation in ultrasonic additive manufacturing. (a) Schematic illustration of head-to-head welding of gold nanowires where one nanowire is caused to approach the other. STM, scanning tunneling microscope. (b) and (c) The motion in (a) is shown in transmission electron microscopy More
Series: ASM Handbook
Volume: 20
Publisher: ASM International
Published: 01 January 1997
DOI: 10.31399/asm.hb.v20.a0005752
EISBN: 978-1-62708-194-8
... cone equivalent STM scanning tunneling microscopy M metal atom PDS product design specification Sv sievert M molecular weight PDT product design team t thickness; time rnA milliampere P{F powder forging T Tesla; transverse direction MeV megaelectronvolt pH negative logarithm of hydrogen-ion T absolute...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001348
EISBN: 978-1-62708-173-3
... the signal. This condition can be overcome by using scanning tunneling microscopy (STM) or AFM. However, preparation of the surface is extremely difficult, the equipment requires a skilled and trained operator, the data are fundamental, and engineering information is not obtained. The crux of the problem...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
...) Surface Structure and Metal Epitaxy by Impact-Collision Ion-Scattering Spectroscopy and Scanning Tunneling Microscopy , Phys. Rev. B , Vol 63 , 2000 , p 035402 10.1103/PhysRevB.63.035402 7. Robinson M.T. and Torrens I.M. , Computer Simulation of Atomic-Displacement Cascades in Solids...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... Abstract This article is an overview of the division Surface Analysis of this volume. The division covers various developed surface-analysis techniques, such as scanning probe and atomic force microscopy. The division focuses on the analysis of surface layers that are less than 100 nm...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0006515
EISBN: 978-1-62708-200-6
... UNS Unified Numbering System I, s, and v represent liquid, STEM scanning transmission electron UP, UPE unsaturated polyester solid, and vapor, microscopy USM ultrasonic machining o respectively) STM scanning tunneling microscopy UTS ultimate tensile strength an increment; a range; change in STOL short...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
...-ray scattering; OM: optical microscopy; energy dispersive x-ray spectrometry; STM: scanning tunneling microscopy; SPM: scanning probe microscopy; RS: Raman spectroscopy Single-Crystal Semiconductors The starting point for many microelectronic devices is a single-crystal wafer of an elemental...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
... nanometers in diameter. Piezoelectric ceramics were used to control the motion of the probe relative to the sample, and a vibration-isolation system similar to that used in the scanning tunneling microscope was used. In the initial AFM instrument, vertical and horizontal resolution was a few nanometers...