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scanning transmission electron microscopy

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Published: 01 June 2016
Fig. 28 High-angle annular dark-field scanning transmission electron microscopy age of η′ precipitate in a 7449 alloy in the T6 state. Courtesy of S.J. Andersen and C.D. Marioara. For further explanation, see Ref 202 . More
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Published: 01 June 2016
Fig. 5 (a) High-angle annular dark-field scanning transmission electron microscopy image of a β″ precipitate in a 6016-type alloy low in copper (0.05 wt%) and aged for 5 h at 185 °C (365 °F) after T4, as viewed in the ⟨001⟩ α direction parallel to the needle axis. The unit cell is given More
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Published: 15 December 2019
Fig. 8 Schematic of various detector positions and associated electron trajectories for secondary electrons (SE; dotted arrows) and backscattered electrons (BE; solid arrows). STEM, scanning transmission electron microscopy; DF, dark field; BF, bright field More
Image
Published: 15 December 2019
Fig. 43 Comparison of orientation zone (ORZ) distribution mapping based on (a) a series of selected-area electron diffraction patterns and (b) a series precession electron diffraction patterns, both obtained in the scanning transmission electron microscopy mode. VBF, virtual bright-field More
Image
Published: 01 June 2016
Fig. 21 Complex Guinier-Preston-Bagaryatsky (GPB) zone in an Al-3Mg-1Cu alloy artificially aged at 180 °C (355 °F) for ≥1 day. High-angle annular dark-field scanning transmission electron microscopy image. A core-shell structure is seen comprising two different structural units. Courtesy of L More
Image
Published: 01 June 2016
Fig. 26 T 1 -precipitates in alloy 2198 after artificial aging at 155 °C (310 °F). (a) Aging time 16 h; high-angle annular dark-field scanning transmission electron microscopy image along a ⟨110⟩ α zone axis. (b) Aging time 500 h; dark-field micrograph. Courtesy of M. Weyland. For further More
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Published: 01 June 2016
Fig. 22 Precipitates in an Al-2.5Cu-1.5Mg alloy aged for 9 h at 200 °C (390 °F) as seen by (a) bright-field scanning transmission electron microscopy (STEM) and (b) high-angle annular dark-field STEM. Small, ordered Guinier-Preston-Bagaryatsky (GPB) zones are observed together with a large More
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... microscopy: Faster, less expensive, and provides superior image quality on relatively flat samples at less than 300 to 400× Scanning transmission electron microscopy and Auger electron microscopy: Compared in Table 2 Transmission electron microscopy: Provides information from within the volume...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... SSMS spark source mass spectrometry STEM scanning transmission electron microscopy TEM transmission electron microscopy TNAA thermal neutron activation analysis UV/VIS ultraviolet/visible (absorption spectroscopy) XPS x-ray photoelectron spectroscopy XRPD...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
...-styrene size-exclusion chromatography scanning electron microscope short ber reinforced polymer secondary ion mass spectroscopy styrene-maleic anhydride sheet molding compound Society of Plastics Engineers superplastic forming structural reaction injection molding scanning transmission electron...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... structures (microstructure) include the magneto-optical Kerr method, the Faraday method, the Bitter technique, scanning electron microscopy (magnetic contrast Types I and II), scanning electron microscopy with polarization analysis, Lorentz transmission electron microscopy, and magnetic force microscopy...
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Published: 01 January 1994
spectroscopy. SAM, scanning Auger microscopy. SIMS, secondary ion mass spectroscopy. TEELS, transmission electron energy loss spectroscopy. TEM, transmission electron microscopy. More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006183
EISBN: 978-1-62708-175-7
... growth exponent S siemens N integral number SAE distance traveled Newton Society of Automotive Engineers Abbreviations and Symbols / 869 scfm standard cubic foot per minute D an increment; a range; change in quantity SEM scanning electron microscopy DT temperature difference or change sfm surface feet...
Image
Published: 01 January 2002
fractograph. (d) Light fractograph of replica. (e) Scanning electron microscopy fractograph of replica. (f) Transmission electron microscopy fractograph of replica More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003757
EISBN: 978-1-62708-177-1
... to microscopy of materials. The article describes the basic concepts of sampling and resolution and quantization of light microscopy, scanning electron microscopy, and transmission electron microscopy. It discusses the acquisition of a digital image that accurately represents the sample under observation...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... of nanotechnology and the development of smart coatings have been dependent largely on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. ball milling chemical vapor...