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scanning transmission electron microscopes

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Published: 15 December 2019
Fig. 23 Transmission Kikuchi diffraction maps of a worn nickel surface obtained at 30 kV by using the conventional arrangement and a 3 nm step size. (a) Scanning transmission electron microscope image of the thin focused-ion-beam-prepared sample. (b) Band contrast image of a small region More
Image
Published: 01 January 2006
Fig. 14 Typical segregation profiles in commercial purity type 304 stainless steel irradiated to ∼10 22 n/cm 2 at 275 °C (525 °F). Composition profiles were measured using a field emission gun scanning transmission electron microscope (FEGSTEM). Source: Ref 72 More
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... types of scanning electron-beam instruments are currently available: scanning electron, scanning transmission electron, and scanning Auger microscopes. These instruments all have in common the capability to obtain information about a sample by scanning an electron beam over a small area and analyzing...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
...-of-field resolution more dramatically, by a factor of approximately 300. The first portion of this article explains how the scanning electron microscope functions and how it is able to provide these improvements over the optical microscope. Commercial scanning transmission electron microscopes became...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
...-state welding STA solution treated and aged STEM scanning transmission electron microscope/microscopy STM/S scanning tunneling microscopy/spectroscopy SUS Saybolt universal seconds (viscosity) Sv sievert SW stud arc welding t thickness; time T tesla T temperature...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... fractographs with illustrations. cleaning fractograph fracture surface scanning electron microscopy specimen replication transmission electron microscopy THE APPLICATION of the transmission electron microscope to the study of fracture surfaces and related phenomena made it possible to obtain...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... SRM Standard Reference Materials ST short transverse (direction) STA solution-treated and aged std standard STEM scanning transmission electron microscope/microscopy STLE Society of Tribologists and Lubrication Engineers (formerly ASLE) STM scanning...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... diffraction crystallographic texture Overview AUTOMATED ELECTRON BACKSCATTER DIFFRACTION (EBSD) is a technique that allows the crystallography of a sample to be determined in a suitably equipped scanning electron microscope (SEM). In brief, a prepared specimen that is flat and free from damage...
Image
Published: 01 January 1986
Fig. 1 Comparison of the electron optical columns used in analytical electron microscopes. (a) SEM electron optical column. In the scanning electron microscope, the electron lenses are used to focus the electron beam to a small-diameter probe. To form an image, the scan coils raster the beam More
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... dating back to the sixteenth century to the state-of-the-art work in electron fractography and quantitative fractography. It also describes the applications and limitations of scanning electron microscope and transmission electron microscope. electron fractography fractography microfractography...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Image
Published: 01 January 2024
Fig. 11 Focused ion beam lift-out transmission electron microscope (TEM) specimen and TEM investigation of stress-corrosion crack tip in an X52 line pipe steel. (a) Scanning electron microscope image of an active crack tip. (b) Plan-view TEM lift-out TEM sample from the same crack tip. (c, d More
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005749
EISBN: 978-1-62708-171-9
... STEM scanning transmission electron microscope/microscopy SVC Society of Vacuum Coaters t thickness; time T tesla T temperature tan tangent of an angle TBC thermal arrier coating tc thermocouple TE target efficiency TEM transmission electron...
Image
Published: 01 January 2002
Fig. 8 Examples of three direct (a to c) and three replication (d to f) procedures for examination of a cleavage fracture in a low-carbon martensitic steel. (a) Light microscope cross section with nickel plating at top. (b) Direct light fractograph. (c) Direct scanning electron microscopy More
Image
Published: 01 January 2024
Fig. 9 Fatigue failure of a Sikorsky S-61N helicopter pressurized rotor blade spar. (a) Details of the fatigue fracture surface indicating the phases of the spar fatigue life and the locations (arrows) of fractographs for striation spacing measurements. (b) Scanning electron microscope (SEM More
Image
Published: 01 January 2024
Fig. 10 Step-by-step transmission electron microscope (TEM) H-bar lift-out technique from a fracture surface. (a) Scanning electron microscope identification of crack-initiation point. Original magnification: 2500×. (b) Focused ion beam (FIB) deposits platinum to protect the region of interest More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
.... The application of this approach has led to the development of the scanning electron microscope, which, over the past 35 years, has revolutionized attitudes to the study of surfaces. With both types of electron microscope, transmission and scanning, the use of electromagnetic lenses and deflection coils means...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
..., the instrument is often referred to as a scanning transmission electron microscope. This article is divided into two major sections. The first introduces the analytical electron microscope and its basic operational characteristics, electron optics, electron beam/specimen interactions and the generation...
Image
Published: 01 December 2009
and quench-in liquid. (d) Scanning electron microscope/backscattered electron (SEM/BE) micrograph of directionally solidified structure in the mushy zone showing primary α(Mg), quenched-in liquid, and the eutectic-like α(Mg) + C36 structure. The transmission electron microscope/selected-area diffraction More