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scanning transmission electron microscope-EDS

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Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... dating back to the sixteenth century to the state-of-the-art work in electron fractography and quantitative fractography. It also describes the applications and limitations of scanning electron microscope and transmission electron microscope. electron fractography fractography microfractography...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., EDS: elements with Z >10 Scanning transmission electron microscope Small area microanalysis of thin films; small area diffraction 2–3 nm (SEM mode, in-lens) 5–30 nm (EDS) Samples must be thinned; generally also functions as a transmission electron microscope; allows chemical analysis...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
...-of-field resolution more dramatically, by a factor of approximately 300. The first portion of this article explains how the scanning electron microscope functions and how it is able to provide these improvements over the optical microscope. Commercial scanning transmission electron microscopes became...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
..., the instrument is often referred to as a scanning transmission electron microscope. This article is divided into two major sections. The first introduces the analytical electron microscope and its basic operational characteristics, electron optics, electron beam/specimen interactions and the generation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... Abstract This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
..., and the general features of ductile and brittle fracture modes. fractography fracture modes scanning electron microscopy specimen preparation THE SCANNING ELECTRON MICROSCOPE has unique capabilities for analyzing surfaces. A beam of electrons moves in an x - y pattern across a conductive specimen...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... and then scanning electron microscopy (SEM). Transmission electron microscopy (TEM) is used to perform further detailed microstructure characterization. The TEM approach is unique among materials characterization techniques in that it enables essentially simultaneous examination of microstructural features through...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... diffraction crystallographic texture Overview AUTOMATED ELECTRON BACKSCATTER DIFFRACTION (EBSD) is a technique that allows the crystallography of a sample to be determined in a suitably equipped scanning electron microscope (SEM). In brief, a prepared specimen that is flat and free from damage...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... SRM Standard Reference Materials ST short transverse (direction) STA solution-treated and aged std standard STEM scanning transmission electron microscope/microscopy STLE Society of Tribologists and Lubrication Engineers (formerly ASLE) STM scanning...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... and their distinctions in order to maximize the opportunities for the successful use of acoustic microscopy. Fundamentals of Acoustic Microscopy Methods As a general comparison between the methods, the scanning laser acoustic microscope primarily is a transmission-mode instrument that creates true real-time...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... or by sectioning and preparing the specimen for scanning electron microscopic examination and/or metallography. It is important to photograph the component at each stage of the cleaning or sectioning processes to retain the characteristic information available for the component at each step of the preparation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... by using x-ray fluorescent analysis or x-ray spectroscopy (XRS), coupled with a scanning electron microscope (SEM) to perform electron probe microanalysis (EPMA). However, this analysis can also be done at submicrometer levels when coupled with a transmission electron microscope (TEM) or analytical...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... and scanning electron imaging, see the articles “Scanning Electron Microscopy” and “Analytical Transmission Electron Microscopy” in this Volume. Basic Microanalytical Concepts Microanalysis provides information concerning specimen composition on a microscopic scale; hence, microanalytical processes...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... and the transmission electron microscope. Compared to optical microscopy, the depth of focus, ranging from 1 μm at 10,000× to 2 mm (0.08 in.) at 10×, is larger by more than two orders of magnitude. Development of SEM Technology Development of what is now recognized as a scanning electron microscope was begun...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... selected to avoid excessive file sizes that are unreasonable for storage, reproduction, and electronic transmission. An image resolution of 200 to 400 dots/in. is suitable for failure analysis photograph scanning, and both film and digital photographs can be scanned with excellent results. Basics...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... scanning electron microscopy topographic contrast X-ray microanalysis THE SCANNING ELECTRON MICROSCOPE is one of the most versatile instruments for investigating the microstructure of materials. Under electron bombardment, a variety of different signals is generated (including secondary electrons...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... Abstract The scanning electron microscope (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. The SEM provides the user with an unparalleled ability to observe and quantify the surface of a sample. This article discusses...