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scanning probe microscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006633
EISBN: 978-1-62708-213-6
.... scanning tunneling microscope scanning probe microscopy atomic force microscope Overview SINCE THE INTRODUCTION of the scanning tunneling microscope (STM) in 1981 and the atomic force microscope (AFM) in 1985, many variations of probe-based microscopies, referred to as scanning probe microscopes...
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003309
EISBN: 978-1-62708-176-4
... on the environmentally assisted crack growth of polymers is also included. The article details the evaluation of nanoscale environmental effects and indentation-induced cohesive cracking. It also provides information on scanning probe microscopy. hydrogen embrittlement stress-corrosion cracking corrosion fatigue...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... Abstract This article is an overview of the division Surface Analysis of this volume. The division covers various developed surface-analysis techniques, such as scanning probe and atomic force microscopy. The division focuses on the analysis of surface layers that are less than 100 nm...
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Published: 01 November 2010
Fig. 16 Dependence of the measured relative grain-boundary (GB) energy of a 49° <332> tilt boundary in NiAl on the inclination angle. Measured using scanning probe microscopy of thermal grooving at 1400 °C. Although the value of inclination is not related directly to the grain-boundary More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
.... (b) Scanning electron microscopy image of a microfabricated tip used in an AFM The AFM probes are created with MEMS manufacturing techniques. There are several variables that are used when creating the probes: Material: Most cantilevers/probes are made from either silicon or silicon...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... quantified to an accuracy of less than 0.1 μm. Computer analysis of digital images can quantify area or volume fractions and particle shapes and sizes. Atomic Force Microscopy Atomic force microscopy (AFM) is a form of scanning probe microscopy (SPM) where a small probe is scanned across the sample...
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Published: 30 June 2023
, atom probe field-ion microscopy; AEM, analytic electron microscopy; LM, light microscopy; TEM, transmission electron microscopy; MQD, multiplex-quadrature detection; DSC, differential scanning calorimetry; SEM, scanning electron microscopy; EDS, energy-dispersive spectroscopy. Source: Ref 13 More
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Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... Abstract Microstructural analysis of specialized types of magnetic materials is centered on the examination of optical, electron, and scanning probe metallographic techniques unique to magnetic materials. This article provides a comprehensive overview of magnetic materials...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... as the sample is scanned to generate an image. Imaging of insulated surface structure at atomic resolution Scanning tunneling microscopy (STM) Tunneling current is monitored as the probe tip is scanned over a surface of interest in the x - y plane to generate an image. Imaging of conducting surface...
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Published: 15 December 2019
; SEM: scanning electron microscopy; AFM: atomic force microscopy; EPMA: electron probe microanalysis; SAXS: x-ray solution scattering; AES: Auger electron spectroscopy; SIMS: secondary ion mass spectroscopy; LEISS: low-energy ion scattering spectroscopy More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
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Published: 15 December 2019
Fig. 6 (a) There are three parts to a probe used in a light lever atomic force microscope (AFM). They are the chip, cantilever, and tip. (b) Scanning electron microscopy image of a microfabricated tip used in an AFM More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
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Published: 15 December 2019
; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy, SSMS, spark source mass spectrometry; TEM, transmission electron microscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x-ray spectrometry. (a) Limited number of elements or groups. (b) Under special More
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Published: 15 December 2019
Fig. 1 Flow charts of common techniques for characterization of organic solids. AES: Auger electron spectroscopy; AFM: atomic force microscopy; COMB: high-temperature combustion; EFG: elemental and functional group analysis; EPMA: electron probe x-ray microanalysis; ESR: electron spin More
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Published: 15 December 2019
Fig. 1 Flow charts of common techniques for characterization of metals and alloys. AES: Auger electron spectroscopy; AFM: atomic force microscopy; COMB: high-temperature combustion; EDS: energy-dispersive x-ray spectroscopy; EFG: elemental and functional group analysis; EPMA: electron probe x More
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002353
EISBN: 978-1-62708-193-1
..., scanning tunneling microscopy has been used successfully to track the initiation of microcracks during fatigue deformation of silver single crystals ( Ref 30 ). In order to minimize tip artifacts, the tip must be sharp with a small opening angle. Also, imaging conditions must be chosen to minimize tip...