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scanning electron microscopy-energy dispersive X-ray spectroscopy

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Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006063
EISBN: 978-1-62708-172-6
... of KTA-Tator, Inc. Fig. 26 Scanning electron microscope. Courtesy of KTA-Tator, Inc. Fig. 27 Resolved image acquired by scanning electron microscopy-energy dispersive x-ray spectroscopy, with associated spectrum. Courtesy of KTA-Tator, Inc. Fig. 28 Spectrum obtained using...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... techniques, namely, optical microscopy, scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy, are reviewed. The article discusses the principles and applications of chemical identity and composition analysis techniques. These techniques include the energy dispersive X-ray...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
.... The techniques used for performing microanalysis include scanning electron microscopy and electron probe X-ray microanalysis. The article describes surface analysis techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and ion-scattering spectroscopy. Bulk analysis techniques...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
...); C = crystalline solids Fig. 1 Flow charts of common techniques for characterization of metals and alloys. AES: Auger electron spectroscopy; AFM: atomic force microscopy; COMB: high-temperature combustion; EDS: energy-dispersive x-ray spectroscopy; EFG: elemental and functional group...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006762
EISBN: 978-1-62708-295-2
... the analysis. Under ideal circumstances, the test plan is followed, and all data are in agreement. The various tests that can be performed during an investigation, including visual examination, scanning electron microscopy, energy-dispersive x-ray spectroscopy, quantitative chemical analysis, metallography...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... are then covered. The article ends with a discussion on the applications of x-ray spectroscopy in failure analysis. energy-dispersive spectrometers failure analysis handheld X-ray fluorescence analysis instrumentation scanning electron microscope wavelength-dispersive spectrometers X-ray spectroscopy...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... surface chemical analysis techniques such as x-ray photoelectron spectroscopy (XPS), or electron spectroscopy for chemical analysis, and Auger electron spectroscopy. Depth profiling through layers in the nanometer to micron range allows for chemical analysis into a material. These techniques are used...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... channeling pattern ECR electron cyclotron resonance E d displacement energy EDM electrical discharge machining EDS energy-dispersive spectrometer EDX energy-dispersive spectroscopy EDXA energy dispersive x-ray analysis EEC erosion-enhanced corrosion...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... of surfaces by Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Chemical characterization of surfaces by energy-dispersive spectroscopy (EDS) instrumentation, which is commonly a module integrated with modern scanning...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... , p 71 12. Barbi N.C. , Electron Probe Microanalysis Using Energy Dispersive X-ray Spectroscopy , PGT, Inc. , 1981 13. Reed S.J.B. , Electron Microprobe Analysis , Cambridge University Press , 1975 14. Goldstein J.I. et al. , Scanning Electron Microscopy...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000600
EISBN: 978-1-62708-181-8
... of important sections, photomicrographs of the structure, and elemental distribution maps obtained by scanning Auger electron spectroscopy (AES) or energy-dispersive x-ray spectroscopy (EDS) have been included, when appropriate, to enhance the reader's understanding of the fracture. The Atlas also includes...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., Rutherford backscattering spectrometry; RS, Raman spectroscopy; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy, SSMS, spark source mass spectrometry; TEM, transmission electron microscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x-ray spectrometry...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
...) spectroscopy Chemical shift of nuclei Mass spectroscopy Mass/charge of ions produced X-ray diffraction analysis (XRD) Crystalline polymer component Small-angle x-ray diffraction X-ray scattering at low angle Scanning electron microscopy (SEM) Surface and particle morphology Transmission...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006402
EISBN: 978-1-62708-192-4
... ≈1 nm Crystallization in very fine regions (+ energy-dispersive x-ray analysis, + electron energy loss spectroscopy TA Thermal analysis Thermal energy Heat dissipation Microscopic surface structure … Adsorption energy, lubricant deterioration, etc. TEM Transmission electron microscopy...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... or energy-dispersive x-ray analysis in a scanning electron microscope, which are discussed in the section “Energy-Dispersive Spectroscopy and Other Microchemical Analysis Procedures.” Polymers Chemical analysis, as is normally done for metals, is not sufficient for the characterizing of polymeric...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1