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scanning electron microscopes

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... to the electron beam. Fig. 5 View of the electron backscatter diffraction (EBSD) camera in the scanning electron microscope (SEM) sample chamber for the experimental configuration used for conventional EBSD measurements. The EBSD phosphor screen, the sample, and the SEM pole piece are shown. Fig...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
...Abstract Abstract The scanning electron microscope (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. The SEM provides the user with an unparalleled ability to observe and quantify the surface of a sample. This article discusses...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
... appearance dating back to the sixteenth century to the state-of-the-art work in electron fractography and quantitative fractography. It also describes the applications and limitations of scanning electron microscope and transmission electron microscope. electron fractography fractography...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
...Abstract Abstract X-ray spectroscopy is generally accepted as the most useful ancillary technique that can be added to any scanning electron microscope (SEM), even to the point of being considered a necessity by most operators. While “stand-alone” x-ray detection systems are used less...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003720
EISBN: 978-1-62708-177-1
...). (d) LM replica. (e) SEM replica. (f) Transmission electron microscopy replica. Source: Ref 13 Fig. 30 Light microscope fractographs taken with (a) bright-field and (b) dark-field illumination compared to (c) a scanning-electron secondary-electron image fractograph of the same area. Sample...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006765
EISBN: 978-1-62708-295-2
... examination can be performed with the scanning electron microscope (SEM) over the same magnification range as the LM, but examination with the latter is more efficient. This article describes the major operations in the preparation of metallographic specimens, namely sectioning, mounting, grinding, polishing...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003536
EISBN: 978-1-62708-180-1
... In a random plane through bulk microstructure Voids 15.5 1.6 Inclusions 7.5 1.9 Source: Ref 14 , 30 Fig. 15 Systematic random sampling of fields of view Fig. 17 Scanning electron microscope fractograph of fracture surface of a wrought aluminum alloy. Observe...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
...Typical resolution and magnification ranges for general types of scanning electron microscopes and for an optical microscope Table 3 Typical resolution and magnification ranges for general types of scanning electron microscopes and for an optical microscope Microscope Minimum resolution...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003226
EISBN: 978-1-62708-199-3
... fracture information contained in optical and scanning-electron microscope fractographs. fractography fracture surface preparation light microscopy optical fractographs scanning-electron microscope fractographs FRACTOGRAPHY is the term coined in 1944 to describe the science of studying...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003226
EISBN: 978-1-62708-199-3
... fracture information contained in optical and scanning-electron microscope fractographs. fractography fracture surface preparation light microscopy optical fractographs scanning-electron microscope fractographs FRACTOGRAPHY is the term coined in 1944 to describe the science of studying...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006760
EISBN: 978-1-62708-295-2
...Abstract Abstract Visual examination, using the unaided eye or a low-power optical magnifier, is typically one of the first steps in a failure investigation. This article presents the guidelines for selecting samples for scanning electron microscope examination and optical metallography...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
...Resolution limits of currently available scanning electron microscopes compared with the optical microscope Table 1 Resolution limits of currently available scanning electron microscopes compared with the optical microscope Microscope Minimum resolution range,nm Maximum useful...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... The scanning electron microscope provides a valuable combination of high resolution imaging, elemental analysis, and recently, crystallographic analysis: Imaging of features as small as ∼10 nm or less, roughly 100 times smaller than can be seen with light microscopes Imaging of rough surfaces...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... Capabilities Typical Uses Spatial resolution Elemental Analysis Detection Threshold and Precision Limitations Sampling Requirements Operating Principles Capabilities of Related Techniques The scanning electron microscope provides a valuable combination of high resolution imaging...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... Conversion Oxide Film Replicas Two-stage replication can yield either thin second-stage replicas for transmission viewing in a transmission electron microscope or thick second-stage replicas for viewing by reflection in a scanning electron microscope or a light microscope. Two methods are commonly...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... Fig. 9 Schematic showing method for producing extraction replicas and surface replicas for SEM examination Fig. 1 Schematic showing the general layout of a typical scanning electron microscope Fig. 2 Illustration of how the information obtained from a square raster...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... illumination is shown in Fig. 5 . As mentioned previously, many images of microstructures at 1000× and lower are being published in metallurgical journals using secondary electron and backscattered electron scanning electron microscopy (SEM) images rather than light microscope images. This is often poor...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
..., and the general features of ductile and brittle fracture modes. fractography fracture modes scanning electron microscopy specimen preparation THE SCANNING ELECTRON MICROSCOPE has unique capabilities for analyzing surfaces. A beam of electrons moves in an x - y pattern across a conductive specimen...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... or by sectioning and preparing the specimen for scanning electron microscopic examination and/or metallography. It is important to photograph the component at each stage of the cleaning or sectioning processes to retain the characteristic information available for the component at each step of the preparation...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
...Overview of contrast mechanisms, detectors, and typical lateral and depth resolution of signals used for imaging and analyzing materials in the scanning electron microscope Table 1 Overview of contrast mechanisms, detectors, and typical lateral and depth resolution of signals used for imaging...