1-20 of 504 Search Results for

scanning electron microscope

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... diffraction crystallographic texture AUTOMATED ELECTRON BACKSCATTER DIFFRACTION (EBSD) is a technique that allows the crystallography of a sample to be determined in a suitably equipped scanning electron microscope (SEM). In brief, a prepared specimen that is flat and free from...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... Abstract The scanning electron microscope (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. The SEM provides the user with an unparalleled ability to observe and quantify the surface of a sample. This article discusses...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001830
EISBN: 978-1-62708-181-8
.... Tech. Phys. , Vol 11 , 1935 , p 467 – 475 (in German) 98. von Ardenne M. , The Scanning Electron Microscope: Practical Construction , Z. Tech. Phys. , Vol 19 , 1938 , p 407 – 416 (in German) 99. von Ardenne M. , The Scanning Electron Microscope: Theoretical Fundamentals...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006765
EISBN: 978-1-62708-295-2
... be performed with the scanning electron microscope (SEM) over the same magnification range as the LM, but examination with the latter is more efficient. This article describes the major operations in the preparation of metallographic specimens, namely sectioning, mounting, grinding, polishing, and etching...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... Abstract This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006760
EISBN: 978-1-62708-295-2
... Abstract Visual examination, using the unaided eye or a low-power optical magnifier, is typically one of the first steps in a failure investigation. This article presents the guidelines for selecting samples for scanning electron microscope examination and optical metallography and for cleaning...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... analysis and application in the field. X-RAY SPECTROSCOPY is generally accepted as the most useful ancillary technique that can be added to any scanning electron microscope (SEM), even to the point of being considered a necessity by most operators. Modern x-ray spectrometers allow detection of elements...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003226
EISBN: 978-1-62708-199-3
... fracture information contained in optical and scanning-electron microscope fractographs. fractography fracture surface preparation light microscopy optical fractographs scanning-electron microscope fractographs FRACTOGRAPHY is the term coined in 1944 to describe the science of studying...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003536
EISBN: 978-1-62708-180-1
... that are based on fracture profilometry. This is followed by a section describing the methods based on scanning electron microscope fractography. The article also addresses procedures for three-dimensional fracture surface reconstruction. In each case, sufficient methodological details, governing equations...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003720
EISBN: 978-1-62708-177-1
..., and fatigue fracture with illustrations. It discusses microanalysis with a focus on the method of light microscopy and includes information of scanning electron microscope in fractography. The article also explains the characteristics of solidification, transformation, deformation structures...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003226
EISBN: 978-1-62708-199-3
... fracture information contained in optical and scanning-electron microscope fractographs. fractography fracture surface preparation light microscopy optical fractographs scanning-electron microscope fractographs FRACTOGRAPHY is the term coined in 1944 to describe the science of studying...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... with that of scanning Auger microscopes, and lists the applications and limitations of SEM. Jominy testing optical microscopes scanning electron microscopes scanning electron microscopy X-ray spectrometers References 1. Broers A.N. , Scan. Elec. Microsc. , 1974...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... The scanning electron microscope provides a valuable combination of high resolution imaging, elemental analysis, and recently, crystallographic analysis: Imaging of features as small as ∼10 nm or less, roughly 100 times smaller than can be seen with light microscopes Imaging of rough surfaces...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
...) Capabilities The scanning electron microscope provides a valuable combination of high resolution imaging, elemental analysis, and recently, crystallographic analysis: Imaging of features as small as ∼10 nm or less, roughly 100 times smaller than can be seen with light microscopes Imaging of rough...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001836
EISBN: 978-1-62708-181-8
... by reflection in a scanning electron microscope or a light microscope. Two methods are commonly used to prepare a final replica from a first-stage plastic replica. In the first method, a carbon replica is formed by vacuum vapor deposition of carbon on a first-stage plastic replica. In the second method...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... discussed. display equipment electron optical column fractography microstructure sample preparation scanning electron microscopy signal detection vacuum system THE SCANNING ELECTRON MICROSCOPE (SEM) is one of the most versatile instruments for investigating the microstructure of metallic...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
..., measuring the amount, size, and spacing of constituents, using the light optical microscope. The discussion covers the examination of microstructures using different illumination methods and includes a comparison between light optical images and scanning electron microscopy images of microstructure...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... Fig. 1 Schematic cross section of a commercially available scanning electron microscope. Courtesy of JEOL Fig. 5 Radial marks (arrows) in the fibrous zone of a bolt fractured under conditions of tensile overload. The morphologies of the different texture zones are shown in the SEM...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... or by sectioning and preparing the specimen for scanning electron microscopic examination and/or metallography. It is important to photograph the component at each stage of the cleaning or sectioning processes to retain the characteristic information available for the component at each step of the preparation...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... scanning electron microscopy topographic contrast X-ray microanalysis THE SCANNING ELECTRON MICROSCOPE is one of the most versatile instruments for investigating the microstructure of materials. Under electron bombardment, a variety of different signals is generated (including secondary electrons...