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scanning electron microscope

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... diffraction crystallographic texture Overview AUTOMATED ELECTRON BACKSCATTER DIFFRACTION (EBSD) is a technique that allows the crystallography of a sample to be determined in a suitably equipped scanning electron microscope (SEM). In brief, a prepared specimen that is flat and free from damage...
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Published: 01 January 2002
Fig. 20 Scanning electron microscopy. (a) Typical scanning electron microscope used in failure analysis photography. (b) Scanning electron microscope photograph of a fatigue fracture More
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Published: 01 January 2002
Fig. 7 Comparison of light microscope (top row) and scanning electron microscope (bottom row) fractographs showing the intergranular fracture appearance of an experimental nickel-base precipitation-hardenable alloy rising-load test specimen that was tested in pure water at 95 °C (200 °F). All More
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Published: 01 January 1987
Fig. 1 Comparison of light microscope (top row) and scanning electron microscope (bottom row) fractographs showing the intergranular fracture appearance of an experimental nickel-base precipitation-hardenable alloy rising-load test specimen that was tested in pure water at 95 °C (200 °F). All More
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Published: 30 September 2015
Fig. 2 Scanning electron microscope backscattered electron images showing comparison of (a) spray compacted plus hot worked and (b) hot isostatically pressed plus hot worked cold working HATS containing 2.9% C, 8% Cr, 1.5% Mo, and 10% V More
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Published: 30 September 2015
Fig. 4 Scanning electron microscope backscattered electron images of microstructure of a HSS containing 1.55% C, 4% Cr, 12% W, 5% V, and 5% Co. (a–c) Spray compacted and hot worked. (d–f) Hot isostatically pressed and hot worked. (a) and (d) As annealed. (b) and (e) Austenitized at 1220 °C More
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Published: 01 December 1998
Fig. 1 Schematic of a scanning electron microscope. (a) Electron beam produced and focused to a fine spot on sample surface. Scanning coils enable the position of the beam to be rastered across a selected portion of the sample surface. Signals produced by the sample at the point where the beam More
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Published: 15 December 2019
Fig. 5 Scanning electron microscope secondary electron image of pearlite revealed by etching with 4% picral and a test circle superimposed to make a measurement of the mean random spacing of the lamellae More
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Published: 15 December 2019
Fig. 17 Scanning electron microscope (SEM) (backscattered electron [BSE]) image and elemental x-ray intensity maps for Raney nickel, with color overlay for aluminum (red), iron (green), and nickel (blue); E 0 = 15 keV More
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Published: 01 December 2004
Fig. 26 Scanning electron microscope backscattered electron images of investment cast Ti-46Al-8Nb-1B test bars with 30 mm (1.18 in.) diam. Source: Ref 57 More
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Published: 01 December 2004
Fig. 54 Scanning electron microscope image in secondary electron mode of 56Pt-24Al-20Ni (at.%) alloy after arc melting and colloidal silica polishing, showing tetragonal ∼Pt 3 Al More
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Published: 01 December 2004
Fig. 60 Scanning electron microscope micrograph in backscattered electron mode of 86Pt-10Al-4Cr (at.%) alloy annealed at 1350 °C (2460 °F) for 96 h, showing a fine mixture of platinum-rich solid solution (light contrast) and ∼Pt 3 Al (dark contrast) More
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Published: 01 December 2004
Fig. 61 Scanning electron microscope micrograph in backscattered electron mode of 84Pt-11Al-2Ru-3Cr alloy annealed at 1350 °C (2460 °F) for 96 h, showing a fine mixture of platinum-rich solid solution (light contrast) and ∼Pt 3 Al (dark contrast) More
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Published: 01 December 2004
Fig. 65 Scanning electron microscope micrograph in secondary electron mode of nominal 20Pd-80Mo (at.%) alloy annealed at 1200 °C (2190 °F) for 1312 h, showing molybdenum-rich body-centered cubic dendrites with palladium-rich face-centered cubic needles (precipitated in the solid state More
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Published: 01 December 2004
Fig. 66 Scanning electron microscope micrograph in secondary electron mode of nominal 60Pd-30Ru-10Mo (at.%) alloy annealed at 1200 °C (2190 °F) for 1345 h, showing ruthenium-rich hexagonal close-packed needles in a palladium-rich face-centered cubic matrix. The smaller needles were More
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Published: 01 December 2004
Fig. 67 Scanning electron microscope micrograph in backscattered electron mode of nominal 70Mo-20Pd-10Ru (at.%) alloy annealed at 1200 °C (2190 °F) for 840 h, showing molybdenum-rich body-centered cubic (dark contrast) and ruthenium-rich hexagonal close-packed (light contrast). 1250× More
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Published: 01 December 2004
Fig. 70 Scanning electron microscope micrograph in secondary electron mode of nominal 28Ru-72Al (at.%) alloy annealed at 1300 °C (2370 °F) for 6.5 h, showing RuAl dendrites surrounded by eutectic comprising RuAl + Ru-rich solid solution More
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Published: 01 December 2004
Fig. 71 Scanning electron microscope micrograph in secondary electron mode of nominal 4Ru-98Al (at.%) alloy as cast, showing primary RuAl 6 needles (light contrast) in a fine eutectic comprising RuAl 6 + Al-rich solid solution (dark contrast) More
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Published: 15 January 2021
Fig. 45 Scanning electron microscope backscattered electron image of area within Fig. 44 , showing points identified for detailed energy-dispersive spectroscopy analysis More
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Published: 30 September 2015
Fig. 8 Scanning electron microscope image of acrylic latex particles More