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scanning auger microprobe

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Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... The scanning Auger microprobe is basically a scanning electron microscope (SEM) with two additional features: An Auger electron detector replaces an x-ray detector. The Auger detector is used to measure the energies of Auger electrons emitted from the sample...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
.... It provides information on the capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe. electron probe microanalysis scanning auger microprobe scanning electron...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
...) Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Surface Scanning Auger microprobe (SAM) … Scanning Auger microprobe (SAM) (a) SEM has not historically been capable of this type of analysis, but recent developments are extending SEM...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
...) Surface Scanning Auger microprobe (SAM) … Scanning Auger microprobe (SAM) (a) SEM has not historically been capable of this type of analysis, but recent developments are extending SEM capabilities in this area. (b) Described in the Section “Metallography” in this Handbook. Selection...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001770
EISBN: 978-1-62708-178-8
... ). Figure 23 shows the results of a scanning Auger microprobe study performed on a gold-plated stainless steel lead frame. The grain structure of the substrate is evident in the secondary electron micrograph. An Auger spectrum obtained while averaging over a large surface area disclosed the presence...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000600
EISBN: 978-1-62708-181-8
... obtained in a scanning Auger microprobe ( Fig. 604 and 605 ). (b) Total includes a schematic of a fatigue fracture surface ( Fig. 577 ). (c) Total includes a graph showing the effect of hydrogen on ductility ( Fig. 639 ) and a drawing of a compression hip screw ( Fig. 670 ). (d) Total...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000609
EISBN: 978-1-62708-181-8
... strain rate of 4.4 × 10 −5 /s. Test interrupted at yield and specimen subsequently broken by impact at −100 °C (−150 °F) in a scanning Auger microprobe. At elevated temperatures and low strain rates, this steel (like many other metals) fails intergranularly by grain-boundary cavitation. However...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006786
EISBN: 978-1-62708-295-2
.... Energy-dispersive spectroscopy analysis (EDSA) indicated the presence of mercury on the fracture surface, and mercury was also detected using scanning Auger microprobe analysis. The mercury was accidentally introduced into the cylinders during a gas-blending operation through a contaminated blending...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003554
EISBN: 978-1-62708-180-1
... on the fracture surface, and mercury was also detected using scanning Auger microprobe analysis. The mercury was accidentally introduced into the cylinders during a gas-blending operation through a contaminated blending manifold. Replacement of the contaminated manifold was recommended, along with discontinued...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... than those for SEM. Sample preparation is tedious, and only very small portions of the sample can be viewed. Scanning Auger Microscopy Scanning Auger Microscopy can perform microanalyses on low atomic number elements down to lithium (atomic number 3). Analyses originate from very near surface...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006657
EISBN: 978-1-62708-213-6
... and include scanning Auger microprobe with submicron resolution and scanning Auger nanoprobe with nanometer-level resolution. The electron spectrometer is usually the central component of an AES system. Various types of analyzers are in use, with retarding-field analyzers being the first to be used...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003520
EISBN: 978-1-62708-180-1
... is outfitted with energy-dispersive analysis capability, it provides the ability to analyze inclusions or corrodents observed on the fracture face. A more recently developed tool is the scanning Auger microprobe, which is capable of analyzing surfaces on an atomic scale. This tool is very useful...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... for imaging only, whereas a thin carbon layer is typically vacuum evaporated onto samples where x-ray microanalysis will be performed. The electron probe microanalyzer (frequently termed the electron microprobe) is essentially a scanning electron microscope that has been...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001301
EISBN: 978-1-62708-170-2
... surface analysis techniques and their relative frequency of application is shown in Fig. 1 . Fig. 1 Survey of the most important surface analysis techniques. AES (SAM), Auger electron spectroscopy (scanning Auger microscopy). XPS (ESCA), x-ray photoelectron spectroscopy (electron spectroscopy...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001774
EISBN: 978-1-62708-178-8
... ion beam is used. Because the spectrum is presented on a linear scale, much of the background due to the molecular secondary ions has been eliminated. Fig. 9 Positive SIMS spectra for an organometallic silicate film deposited on a silicon substrate. Obtained using a scanning ion microprobe...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... with that of scanning Auger microscopes, and lists the applications and limitations of SEM. Jominy testing optical microscopes scanning electron microscopes scanning electron microscopy X-ray spectrometers References 1. Broers A.N. , Scan. Elec. Microsc. , 1974...
Series: ASM Handbook
Volume: 4D
Publisher: ASM International
Published: 01 October 2014
DOI: 10.31399/asm.hb.v04d.a0005939
EISBN: 978-1-62708-168-9
..., and composition-depth profiles obtained through glow-discharge optical emission spectrometry (GD-OES) or calibrated Auger electron spectroscopy (AES) using a scanning Auger microprobe (SAM) on a cross section. These methods are destructive, in that a component must be sectioned to evaluate the case. However...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... Positive secondary ion mass spectroscopy spectra for an organometallic silicate film deposited on a silicon substrate acquired using a scanning ion microprobe under inert argon bombardment The spectrum indicates the presence of hydrogen and hydroxylated molecular oxide species, but the quadrupole...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... be required, the scanning electron microprobe, a scanning electron microscope equipped with wavelength-dispersive detectors (WDS), enables quantitative analysis of samples with closely adjacent spectral peaks. For surface analysis of metal powders, x-ray photoelectron spectroscopy (XPS) and Auger electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... includes articles on recently developed techniques, such as “Introduction to Scanning Probe Microscopy” and “Atomic Force Microscopy,” as well as established methods, such as “Auger Electron Spectroscopy,” “Low-Energy Electron Diffraction,” and “Secondary Ion Mass Spectroscopy.” Table 2...