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scanning acoustic microscopy

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Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... Abstract This article discusses the fundamentals and operating principles of the following acoustic microscopy methods: scanning laser acoustic microscopy, C-mode scanning acoustic microscopy, and scanning acoustic microscopy. It describes the applications of acoustic microscopy for detecting...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
.... These include electron microscopy, scanning tunneling microscopy, atomic force microscopy, and scanning acoustic microscopy. The article also reviews the X-ray diffraction technique used for determining the compositional changes, strain changes, and residual stress evaluation during the fatigue process...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006477
EISBN: 978-1-62708-190-0
..., such as the time-of-flight diffraction (TOFD) technique, scanning acoustic microscopy (SAM), ultrasonic spectroscopy, and the compound scanning technique, have been used to detect diffusion bond defects ( Ref 5 ). The TOFD method showed a promising result for sizing defects, but the location of defects...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005616
EISBN: 978-1-62708-174-0
...-of-flight diffraction (TOFD) technique, scanning acoustic microscopy (SAM), ultrasonic spectroscopy, and the compound scanning technique, have been used to detect diffusion bond defects ( Ref 5 ). The TOFD method showed a promising result for sizing defects, but the location of defects in the material...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006461
EISBN: 978-1-62708-190-0
... the methods for using Rayleigh waves for defect detection and materials characterization, alongside nonlinear ultrasonic inspection and surface acoustic wave (SAW) microscopy. The article concludes with information on the standards that use Rayleigh waves for nondestructive evaluation (NDE) of different...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... diffraction SAE Society of Automotive Engineers SAM scanning acoustic microscope/microscopy SARA Superfund Amendments and Reauthorization Act SCaM scanning capacitance microscope SCC stress-corrosion cracking SCE saturated calomel electrode SCR selective catalytic...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
... acoustic microscope/microscopy SAW submerged arc welding SCC stress-corrosion cracking SEM scanning electron microscope/microscopy SHE standard hydrogen electrode SI Système International d'Unités SIR surface insulation resistance SLAM scanning laser acoustic microscope...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
... , p 4723 10.1063/1.338807 6. Hartoonian A. , Betzig E. , Isaacson M. , and Lewis A. , Super-Resolution Fluorescence Near-Field Scanning Optical Microscopy , Appl. Phys. Lett. , Vol 49 (No. 11 ), Sept 15, 1986 , p 674 , 10.1063/1.97565 Selected References...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006471
EISBN: 978-1-62708-190-0
... Abstract This article discusses the advantages, disadvantages, applications, and selection criteria of various technologies and transduction modalities that can generate and detect ultrasonic waves. These include piezoelectric transducers, electromagnetic acoustic transducers (EMATs), laser...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006633
EISBN: 978-1-62708-213-6
... acoustic microscopy (SFAM, or atomic force acoustic microscopy) ( Ref 23 , 24 , 44 , 47 , 78 – 80 ), scanning magnetic microscopy (SMM, or magnetic force microscopy) ( Ref 81 – 85 ), scanning near-field optical microscopy ( Ref 86 – 89 ), scanning thermal microscopy ( Ref 90 – 92 ), scanning...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001238
EISBN: 978-1-62708-170-2
... Evaluation technique References Cracks Acoustic emission 57 Acoustic microscope 48 Eddy current Etching 9 , 46 Magnetic particle 9 Metallography 9 Optical microscope 58 Penetrant 9 Scanning electron microscopy Transmission electron microscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... , John Wiley & Sons , 1983 , 10.1016/0002-9610(83)90338-0 • Cullity B.D. , Elements of X-Ray Diffraction , Addison-Wesley , 1978 • Goldstein J.I. et al. , Scanning Electron Microscopy and X-Ray Microanalysis , Plenum Press , 1981 , 10.1016/0009-8981(81)90032-2...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006470
EISBN: 978-1-62708-190-0
... techniques also involves other methods, such as acoustical microscopy, acoustical holography, the frequency modulation technique, spectral analysis, and ultrasound conduction. The first of these methods is discussed in the article “Acoustic Microscopy” in this Volume. The second of these is covered...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005749
EISBN: 978-1-62708-171-9
... STEM scanning transmission electron microscope/microscopy SVC Society of Vacuum Coaters t thickness; time T tesla T temperature tan tangent of an angle TBC thermal arrier coating tc thermocouple TE target efficiency TEM transmission electron...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005605
EISBN: 978-1-62708-174-0
... the fundamental bonding mechanisms. Using a variety of characterization techniques, a number of researchers have accumulated extensive microstructure information at the bond interface ( Ref 17 , Ref 18 , Ref 19 , 20 ). The work noted here covers the use of scanning electron microscopy and focused ion beam...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001348
EISBN: 978-1-62708-173-3
.... Mater. Res. 47. Colton R.J. , Marrian C.R.K. , and Stroscio J.A. , Ed., Proc. Fifth Int. Conf. Scanning Tunneling Microscopy/Spectroscopy (SAM '90) and the First Int. Conf. Nanometer Scale Science and Technology (NANO I) ( Baltimore, MD ), June 1990 , and J. Vac. Sci. Tech. B...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006454
EISBN: 978-1-62708-190-0
... and its intimate connection with failure processes, AE inspection provides unique insight into the response of material to applied stress ( Ref 40 ). Acoustic emission analysis is most useful when used in conjunction with other diagnostic techniques, such as stress-strain measurements, microscopy, crack...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001472
EISBN: 978-1-62708-173-3
... applications, although only significant lack of bonding or clusters of smaller defects can be reliably detected. High-resolution flaw detection involving frequencies approaching 100 MHz appears to have distinct advantages over conventional testing. Scanning acoustic microscopy also appears to offer excellent...