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scanning acoustic microscope

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Published: 01 August 2018
Fig. 3 Schematic of the C-mode scanning acoustic microscope. This instrument incorporates a reflection, pulse-echo technique that employs a focused transducer lens to generate and receive the ultrasound signals beneath the surface of the sample. More
Image
Published: 01 August 2018
Fig. 5 Schematic and block diagram of the C-mode scanning acoustic microscope. The instrument employs a very high-speed mechanical scanner and an acoustic impedance polarity detector to produce high-resolution C-scan images. CRT, cathode ray tube More
Image
Published: 01 August 2018
Fig. 6 Schematic of the scanning acoustic microscope lens used for interrogating the surface zone of a sample More
Image
Published: 01 November 1995
Fig. 45 High-resolution C-scan acoustic microscopic image of individual voids in SiC sample of Fig. 41 . Source: Ref 174 More
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... and their distinctions in order to maximize the opportunities for the successful use of acoustic microscopy. Fundamentals of Acoustic Microscopy Methods As a general comparison between the methods, the scanning laser acoustic microscope primarily is a transmission-mode instrument that creates true real-time...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005647
EISBN: 978-1-62708-174-0
... acoustic microscope/microscopy SAW submerged arc welding SCC stress-corrosion cracking SEM scanning electron microscope/microscopy SHE standard hydrogen electrode SI Système International d'Unités SIR surface insulation resistance SLAM scanning laser acoustic microscope...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0005586
EISBN: 978-1-62708-170-2
... SAD selected-area diffraction SAE Society of Automotive Engineers SAM scanning acoustic microscope/microscopy SARA Superfund Amendments and Reauthorization Act SCaM scanning capacitance microscope SCC stress-corrosion cracking SCE saturated calomel...
Image
Published: 01 August 2018
indicated in the color micrograph. This is explained by the fact that the scanning laser acoustic microscope shows the disbonds on either side of the lead frame, that is, two interfaces, while the C-mode scanning acoustic microscopy (C-SAM) image shows only one interface. When the integrated circuit More
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Published: 01 August 2018
Fig. 1 Simplified view of the methods for producing through-transmission and noncollinear reflection-mode acoustic images with the scanning laser acoustic microscope More
Image
Published: 01 August 2018
Fig. 2 Schematic showing principal components of a scanning laser acoustic microscope. The unit employs a plane-wave piezoelectric transducer to generate the ultrasound, and a focused laser beam as a point source detector of the ultrasonic signal. Acoustic images are produced at a rate of 30 More
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Published: 01 August 2018
Fig. 43 Cross-sectional analysis of the capacitor shown in Fig. 42 revealing a delamination in the location indicated by scanning laser acoustic microscopy. The cut edge of the capacitor was polished and placed under a conventional microscope. More
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Published: 01 August 2018
Fig. 17 A portion of the 160 mm 2 (0.25 in. 2 ) area of an alumina ceramic disk scanned by an acoustic microscope showing the presence of porosity in the disk (arrows). Courtesy of G.H. Thomas, Sandia National Laboratories More
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0005663
EISBN: 978-1-62708-173-3
... SACP selected-area channeling pattems /1,8 delta SAE Society of Automotive Engineers E, E epsilon SAM scanning acoustic microscope! Z, t zeta microscopy H,'I] eta SAW submerged arc welding 0,6 theta SCC stress-corrosion cracking I, ~ iota SCPM scanning chemical potential micros- copy SCR silicon...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
... Atomic force microscope Detecting fatigue crack initiation Scanning acoustic microscope Detecting fatigue crack initiation X-ray diffraction Detecting fatigue damage and residual stresses in the laboratory This article describes and compares the test techniques listed in Table 1...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
...: electron microscopes, including scanning electron microscopes (SEMs) and transmission electron microscopes (TEMs), which use focused electron beams to generate images of surfaces; optical microscopes, which use focused light to generate images of surfaces; and the newest type of scanning probe microscopes...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005616
EISBN: 978-1-62708-174-0
... studies. Various ultrasonic techniques, such as the time-of-flight diffraction (TOFD) technique, scanning acoustic microscopy (SAM), ultrasonic spectroscopy, and the compound scanning technique, have been used to detect diffusion bond defects ( Ref 5 ). The TOFD method showed a promising result...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006477
EISBN: 978-1-62708-190-0
..., such as the time-of-flight diffraction (TOFD) technique, scanning acoustic microscopy (SAM), ultrasonic spectroscopy, and the compound scanning technique, have been used to detect diffusion bond defects ( Ref 5 ). The TOFD method showed a promising result for sizing defects, but the location of defects...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006633
EISBN: 978-1-62708-213-6
... Abstract This article provides an overview of scanning probe microscopes (scanning tunneling microscope and atomic force microscope (AFM)), covering the various operating modes and probes used in these instruments and providing information on AFM instrumentation, applications, and analyses...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...