1-20 of 350 Search Results for

sample preparation

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... experiment are then covered. The article further describes the processes involved in sample preparation that are critical to the success or usefulness of an EBSD experiment. It also discusses the applications of EBSD to bulk samples and the development of EBSD indexing methods. transmission Kikuchi...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
..., fabrication methods, sample preparation, bulk/elemental characterization methods, microstructural characterization methods, surface characterization methods, and electronic characterization methods. semiconductor characterization This article introduces various techniques commonly...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006628
EISBN: 978-1-62708-213-6
.... Various steps involved in the sample preparation, calibration, and data analysis are then discussed. The article concludes with a section on the applications and interpretation of LEIS in material analysis, including discussion on surface structural analysis, layer-by-layer (Frank-van der Merwe) growth...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006664
EISBN: 978-1-62708-213-6
... gas chromatography/mass spectrometry (GC/MS) instrumentation, interpreting mass spectra, GC/MS methodology, and GC/MS advances. Sample preparation, which is very important in GC/MS to avoid erroneous data and to minimize maintenance and troubleshooting of the instrument, is also discussed. Further...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006630
EISBN: 978-1-62708-213-6
... detection, spectrophotometric detection, and electrochemical detection. Various separation modes in IC are then described. The article further provides information on various eluents species, analyte range, and sample preparation techniques in IC. It ends by providing information on the instrumentation and...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... processes involved in sample preparation for XRF analysis are also included. The article further provides information on the practical procedure for and the applications of WDS and EDS qualitative and quantitative analyses. X-ray absorption X-ray emission X-ray spectroscopy X-Ray Radiation X-ray...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
... Abstract This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
... neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
... involved in sample preparation are described. In addition, the article discusses the limitations of surface-sensitive electron diffraction and the applications of LEED with examples. crystallography Low-energy electron diffraction Low-energy electron diffraction (LEED...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001832
EISBN: 978-1-62708-181-8
... stripping, organic-solvent cleaning, water-base detergent cleaning, cathodic cleaning, and chemical-etch cleaning. cleaning cracks fractography nondestructive inspection specimen preparation specimen preservation specimen sectioning steel fracture FRACTURE SURFACES are fragile and subject...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006024
EISBN: 978-1-62708-172-6
... Abstract This article reviews the steps involved in presurface-preparation inspection: substrate replacement; removal of weld spatter, rounding of sharp edges, and grinding of slivers/laminations; and removal of rust scale, grease, oil, and chemical (soluble salt) contamination. It focuses on...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006636
EISBN: 978-1-62708-213-6
... various processes involved in liquid chromatography, including assessing a separation of sample components, adjusting the mobile phase, choosing the stationary phase, optimizing a separation, preparing real samples, and analyzing complex samples. liquid chromatography stationary phase mobile phase...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006043
EISBN: 978-1-62708-172-6
... and analyzing background information, preliminary determination of site conditions, inspection equipment requirements, coating failure site investigation, sampling techniques, sample chain of custody, coordination with the coatings laboratory, report preparation, and sample retention. adhesion...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... development of SEM technology and operating principles of basic systems of SEM. The basic systems covered include the electron optical column, signal detection and display equipment, and the vacuum system. The processes involved in the preparation of samples for observation using an SEM are described, and the...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... are the different types of samples that can be analyzed and the special sample-handling procedures that must be implemented when preparing to do failure analysis using these surface-sensitive techniques. Data obtained from different material defects are presented for each of the techniques. The...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001237
EISBN: 978-1-62708-170-2
... of samples prone to abrasion damage and artifacts for quantitative image analysis. abrasion artifacts abrasion damage computer technology microhardness analysis microstructural analysis optical microscopy quantitative image analysis sample preparation surface analysis surface finishing...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006673
EISBN: 978-1-62708-213-6
... various criteria to be considered for specimen preparation and calibration of TGAs. The use of thermogravimetric analysis data in the assessment of failure analysis of plastics and the combined usage of TGA with other techniques to understand the changes in the sample are also covered. The article...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006648
EISBN: 978-1-62708-213-6
... detector(s). Sample preparation in GDMS generally is quite simple and fast, which results in a reduction of the contamination risk as well as the overall analytical cycle/time (compared to analysis techniques requiring the dissolution of the solid sample). For the analysis of bulk...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... processes involved in the selection of metallurgical samples, the preparation and examination of metallographic specimens in failure analysis, and the analysis and interpretation of microstructures. Examination and evaluation of polymers and ceramic materials in failure analysis are also briefly discussed...