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Image
Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering
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Published: 01 January 1986
Fig. 11 High-resolution ESR spectrum of DPPH in tetrahydrofuran after removal of dissolved oxygen.
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Image
Published: 01 January 1986
Fig. 10 Comparison of the resolution in an optical microscope and the scanning electron microscope. (a) A pearlite nodule in a martensite matrix taken with a high-quality optical microscope, oil immersion, green filter, original magnification of 1600×, 4% picral etch. (b) Same nodule taken
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Image
Published: 01 January 1986
Fig. 11 Line scan across gold particles on resolution sample often used with SEM.
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Image
Published: 01 January 1986
Fig. 12 Influence of the sample material on resolution. (a) A gold on carbon resolution sample demonstrating 3-nm (30-Å) resolution. (b) A niobium filament sample examined in the same instrument under the same conditions, but having a resolution of only 7 nm (70 Å)
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Published: 01 January 1986
Fig. 26 High-resolution spectrum of tungsten obtained using the ECAP shown in Fig. 25 . Source: Ref 9
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Published: 01 January 1986
Fig. 5 LEISS spectra showing the improved mass resolution when a heavier mass ion is used.
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Image
Published: 01 January 1986
Fig. 8 High-resolution mass scan over the region of m / e = 63 for a CuTi specimen. Obtained using an ion microscope
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Image
Published: 01 January 1986
Fig. 17 High-resolution SIMS spectra for a phosphorus-doped silicon substrate. Obtained using 32 O 2 + primary ion bombardment in an ion microscope
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Published: 01 January 1986
Fig. 2 Parameters for defining retention, peak width, and resolution.
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Published: 01 January 1987
Fig. 3 Recommended f /numbers for optimum depth of field with high resolution. See Table 1 . Source: Ref 4
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Published: 01 January 2002
Fig. 5 X-ray photoelectron spectroscopy high-resolution spectrum of polyethylene terephthalate (PET)
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Published: 01 January 2002
Fig. 10 X-ray photoelectron spectroscopy high-resolution carbon spectrum of stainless steel surface
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Published: 01 January 2002
Fig. 11 X-ray photoelectron spectroscopy high-resolution iron spectrum of stainless steel surface
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Published: 01 January 2002
Fig. 12 X-ray photoelectron spectroscopy high-resolution iron spectrum obtained from well-passivated stainless steel surface
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Published: 01 January 2002
Fig. 2 Levels of resolution related to the engineering design process. Source: Ref 1
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Published: 01 December 2004
Fig. 8 High-resolution electron micrograph of two ferrite regions split by a carbon rich M 7 C 3 lamellae in a Fe-8.2Cr-0.92C alloy. Source: Ref 8 . Reprinted with permission
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Published: 01 December 2004
Fig. 28 High-resolution transmission electron microscopy image of a (11 1 ¯ ) twin boundary in 8% deformed Ti-44.7Ni-9Nb (at.%). Source: Ref 29 . Reprinted with permission
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Published: 01 December 2004
Fig. 13 High-resolution atomic-force microscope plots of the displacements caused by the formation of a single subunit of bainite. Surface was flat before transformation. Source: Ref 15
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