Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering More

Fig. 11 High-resolution ESR spectrum of DPPH in tetrahydrofuran after removal of dissolved oxygen. More

Fig. 10 Comparison of the resolution in an optical microscope and the scanning electron microscope. (a) A pearlite nodule in a martensite matrix taken with a high-quality optical microscope, oil immersion, green filter, original magnification of 1600×, 4% picral etch. (b) Same nodule taken More

Fig. 11 Line scan across gold particles on resolution sample often used with SEM. More

Fig. 12 Influence of the sample material on resolution. (a) A gold on carbon resolution sample demonstrating 3-nm (30-Å) resolution. (b) A niobium filament sample examined in the same instrument under the same conditions, but having a resolution of only 7 nm (70 Å) More

Fig. 26 High-resolution spectrum of tungsten obtained using the ECAP shown in Fig. 25 . Source: Ref 9 More

Fig. 5 LEISS spectra showing the improved mass resolution when a heavier mass ion is used. More

Fig. 8 High-resolution mass scan over the region of m / e = 63 for a CuTi specimen. Obtained using an ion microscope More

Fig. 17 High-resolution SIMS spectra for a phosphorus-doped silicon substrate. Obtained using 32 O 2 + primary ion bombardment in an ion microscope More

Fig. 2 Parameters for defining retention, peak width, and resolution. More

Fig. 3 Recommended f /numbers for optimum depth of field with high resolution. See Table 1 . Source: Ref 4 More

Fig. 4 (a) Transmission electron microscopy and (b) high-resolution transmission electron microscopy images of β″ precipitates in Al-0.64Mg-0.69Si alloy after 36 h of artificial aging at 175 °C (350 °F). Both images were taken along a ⟨001⟩ α direction. The mean particle cross section is 5.3 More

Fig. 10 GP-I zone in aluminum-copper alloys. High-resolution transmission electron microscopy image of a monolayer Guinier-Preston (GP) zone sheared by an edge dislocation in Al-4Cu alloy aged for 10 h at 100 °C (210 °F), including schematic of the event. Source: Ref 94 . Reprinted More

Fig. 12 Spatial resolution by laser flash More

Fig. 10 High-resolution images of focused ion beam (FIB)-sectioned powder particles. (a) Scanning electron microscope/scanning electron detector image. (b) FIB-charged device model image. Source: Ref 4 More

Fig. 11 High-resolution transmission electron micrograph of a thin-film sample of amorphous Pd 75 Si 25 . Notice the textured appearance on the scale of ∼2 nm, as well as the apparent lattice fringes on the same scale. More

Fig. 20 High-resolution TEM lattice image of zinc oxide formed by combining transmitted and (002) diffracted beams. The interplanar spacing is 0.26 nm. A grain boundary, inclined to the incident beam, is visible in the upper portion of the micrograph. Source: Ref 3 More

Fig. 40 High-resolution scanning electron micrograph of leached AuAl 2 revealing the skeletal gold mesoporous structure More

Fig. 8 High-resolution electron micrograph of two ferrite regions split by a carbon rich M 7 C 3 lamellae in a Fe-8.2Cr-0.92C alloy. Source: Ref 8 . Reprinted with permission More

Fig. 2 Sampling, resolution, and quantization. (a) SEM image of a cleaved silicon wafer. (b) Intensity trace (gray graph) along the white line shown on the image. The black dots represent sampling points. The black line is the digital approximation given by the sampling shown. More