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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001738
EISBN: 978-1-62708-178-8
.... Resolution of this scan is ∼1200. Fig. 1 Schematic of a simple introduction system. Fig. 2 Schematic of a computer-controlled multiple-expansion volume introduction system. Fig. 3 Schematic of a gas mass spectrometer. Ion source components: A, trap; B, repeller; C, ionization...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
.... The intensity distributions from each of the pinholes separately are shown as solid lines; the combined profile from the two pinholes acting together is shown dotted. At the Rayleigh resolution limit, as shown here, the maximum intensity from one pinhole coincides with the first minimum from the other...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003757
EISBN: 978-1-62708-177-1
..., as applied to microscopy of materials. The article describes the basic concepts of sampling and resolution and quantization of light microscopy, scanning electron microscopy, and transmission electron microscopy. It discusses the acquisition of a digital image that accurately represents the sample under...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... yellow 505 5050 Reddish orange 536 5360 Red 565 5650 Purple 575 5750 Violet 589 5890 Indigo 664 6640 Sky blue 747 7470 Green Objective resolution and theoretical size of the CCD cell Table 2 Objective resolution and theoretical size of the CCD cell...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
...Resolution limits of currently available scanning electron microscopes compared with the optical microscope Table 1 Resolution limits of currently available scanning electron microscopes compared with the optical microscope Microscope Minimum resolution range,nm Maximum useful...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006432
EISBN: 978-1-62708-192-4
... with attached wear measurement Fig. 3 Nuclide chart Abstract Abstract Radionuclide methods for wear measurement are used to measure wear continuously throughout a tribological experiment at a resolution of nanometers or micrograms per hour. This article presents an overview of radionuclide...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003239
EISBN: 978-1-62708-199-3
... be classified as contact thermographic methods using cholesteric liquid crystals, thermally quenched phosphors, and heat-sensitive paints, and noncontact techniques using hand-held infrared scanners, high-resolution infrared imaging systems, and thermal wave interferometer systems. Contact thermometric...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
.... It provides information on the capabilities, typical uses, spatial resolution, elemental analysis detection threshold and precision, limitations, sample requirements, and operating principles of the scanning auger microprobe. electron probe microanalysis scanning auger microprobe scanning electron...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003558
EISBN: 978-1-62708-180-1
... behavior and projecting wear. A straight line in this type of plot is indicative of stable behavior. Abstract Abstract This article focuses on the types of activities required for the resolution of wear problems. These include examining and characterizing the tribosystem; characterizing...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003519
EISBN: 978-1-62708-180-1
..., cell phone, and laptop or hand-held computer device Fig. 2 Example of fault tree chart for forgings with dye-penetrant defects Fig. 3 Example of a failure mode assessment chart (for fault tree of forgings defects in Fig. 2) Fig. 4 Example of a technical plan for resolution...
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005218
EISBN: 978-1-62708-187-0
... interface morphology evolution, solute transport, and various process phenomena at spatiotemporal resolutions. It discusses the three viable imaging techniques made available by synchrotron radiation for the real-time investigation of solidification microstructures in alloys. These include two-dimensional X...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
...Abstract Abstract Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006650
EISBN: 978-1-62708-213-6
.... (a) 27 Al magic-angle spinning nuclear magnetic resonance (MAS NMR) spectrum of γ-alumina, showing resolution of aluminum in tetrahedral and octahedral sites. (b) 1 H MAS NMR spectrum of H-ZSM-5 zeolite, with identification of silanol and protonated linkages between the framework silicon and aluminum...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
.... This is followed by sections providing information on EBSD spatial resolution and system operation of EBSD. Various factors pertinent to perform an EBSD experiment are then covered. The article further describes the processes involved in sample preparation that are critical to the success or usefulness of an EBSD...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... resolution. EMPAD, electron microscope pixel array detector. Reprinted from Ref 2 with permission of Springer Nature. Copyright 2009 Fig. 1 Various transmission electron microscopy instruments. (a) JEOL JEM-ARM300F Grand ARM. Courtesy of JEOL. (b) Thermo/Fisher Themis Z. Source: Thermo/Fisher...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... argon bombardment Fig. 12 Schematic representations of artifacts that can distort a secondary ion mass spectroscopy depth-profiling analysis Fig. 8 High-resolution mass scan over the region of m / e = 63 for a CuTi specimen acquired using an ion microscope Fig. 10 Depth...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005719
EISBN: 978-1-62708-171-9
... is defined by their resolution, accuracy, linearity, and repeatability. The commercial thermal spray controls discussed here include the open-loop input-based, open-loop output-based, closed-loop input-based, and closed-loop output-based or adaptive controls. The article discusses the common causes...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003239
EISBN: 978-1-62708-199-3
... be classified as contact thermographic methods using cholesteric liquid crystals, thermally quenched phosphors, and heat-sensitive paints, and noncontact techniques using hand-held infrared scanners, high-resolution infrared imaging systems, and thermal wave interferometer systems. Contact thermometric...