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reflected-light microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... microscopy. bright-field illumination composite materials contrast microscopy dark-field illumination dyes etchants fluorescence microscopy interference microscopy macrophotography microscope alignment optical microscopy polarized-light microscopy reflected-light microscopy sample...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... grinding, and polishing. The preparation techniques of ultrathin sections are also summarized. The article explains the illumination methods used by reflected light microscopy to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Image
Published: 01 January 2003
region of a filiform cell. Tail appears iridescent due to internal reflection. Light microscopy. 60× More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
... and double-pass impregnation. The article illustrates reflected-light optical microscopy techniques to evaluate the morphology of thermoplastic materials for determining the material quality and correlating key microstructural features with material performance. dispersed-phase toughening double-pass...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... Abstract The reflected light microscope is the most commonly used tool to study the microstructure of metals, composites, ceramics, minerals, and polymers. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009077
EISBN: 978-1-62708-177-1
... Reflected-Light Microscopy,” optical microscopy can be used to determine the fiber angles in composites made from unidirectional fiber prepreg materials. Also, it was shown that reflected polarized light can be used to further enhance fiber angle differences. Usually, a composite material can be cross...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009082
EISBN: 978-1-62708-177-1
... Higher-magnification view of the same area as Fig. 5 . Bright-field illumination, 25× objective The use of phase contrast, which is not commonly performed using reflected-light microscopy, provided more insight into the fiber and matrix microstructure ( Fig. 7 ). This contrast technique...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... that magnify images obtained by the transmission or reflection of either light or electrons. The choice of method depends on several factors, such as the type of specimen and the imaging requirements. For example, reflected light microscopy is common in the imaging of metallic microstructures, while...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... microscopy for the analysis of materials and device components generally refers to reflected light microscopy. In this method, light is reflected from the sample surface through the microscope objective to an eyepiece, view screen, or camera. Transmitted light is occasionally used for transparent...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
... composites are performed using reflected-light optical microscopy, a sample-preparation technique that enables transmitted-light analysis is extremely valuable ( Ref 1 ). At the ultrathin level, even opaque materials become optically transparent. This preparation is needed to resolve and analyze...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... microscopy Application of this technique is based on the fact that optically anisotropic metals and phases reflect plane-polarized light as elliptically polarized light with a rotation of the plane of polarization. When light passes through a polarizing filter, the vibrations occur in only one plane...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003720
EISBN: 978-1-62708-177-1
... light microscopy (where the impinging light for viewing is reflected off the specimen surface). In contrast, biological samples are transparent and thus can be examined by transmitted light (transmission microscopy). Sorby understood the need for proper surface preparation when examining metals...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009071
EISBN: 978-1-62708-177-1
... using optical microscopy techniques. For the majority of cases, reflected-light microscopy provides most of the necessary information one would desire. In some cases, however, etchants, stains, or dyes may be required for further clarification of the morphology or crack identification. If reflected...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... vibration when long exposures are used for close-up photography. The copystand allows lighting from single or dual sides of the component. Orientation of the component with respect to the incident lighting highlights different characteristic features on the fracture surface. Highly reflective components can...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009079
EISBN: 978-1-62708-177-1
... to the casting resin, as described in the article, “Sample Preparation and Mounting,” in this Volume. Most analysis of microcracks in composites can be performed using unmounted samples and reflected-light optical microscopy techniques (see the article, “Viewing the Specimen Using Reflected-Light...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... lighting and microscopic photography. Special techniques can be employed to deal with highly reflective conditions and are also described in this article. digital cameras failure analysis microscopic photography photographic lighting visual examination FAILURE ANALYSIS is an investigative...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001295
EISBN: 978-1-62708-170-2
... require significantly greater calibration efforts, however, and always depend on assumptions wit regard to microstructure. Ellipsometry and reflectometry basically involve the measurement of changes in phase shift or intensity, respectively, as light reflects from material. Optical properties and film...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001833
EISBN: 978-1-62708-181-8
... consideration. In general, the area should have a reasonably high ceiling, should be free of excessive vibrations, and, most important, should be capable of being darkened. Total darkness is not required, but when exposures are being made, the area should be dark enough to avoid extraneous light or reflections...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... lattice length along the c axis; velocity (speed of light) CARCA computer-assisted rocking curve analysis CBEDP convergent-beam electron diffraction pattern CDF centered dark-field (image) CHA concentric hemispherical analyzer CIRCLE cylindrical internal...