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reflected-light microscopy

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Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
... optical microscopy. bright-field illumination composite materials contrast microscopy dark-field illumination dyes etchants fluorescence microscopy interference microscopy macrophotography microscope alignment optical microscopy polarized-light microscopy reflected-light microscopy...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... control. This article describes the sample preparation techniques of composite materials. These techniques include mounting, rough grinding, and polishing. The preparation techniques of ultrathin sections are also summarized. The article explains the illumination methods used by reflected light microscopy...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009080
EISBN: 978-1-62708-177-1
... materials. It discusses two main methods for manufacturing prepregs, namely, single-pass impregnation and double-pass impregnation. The article illustrates reflected-light optical microscopy techniques to evaluate the morphology of thermoplastic materials for determining the material quality and correlating...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... DIC (b). DIC reveals details more effectively. Abstract Abstract The reflected light microscope is the most commonly used tool to study the microstructure of metals, composites, ceramics, minerals, and polymers. For the study of the microstructure of metals and alloys, light microscopy...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009077
EISBN: 978-1-62708-177-1
... in the article, “Viewing the Specimen Using Reflected-Light Microscopy,” optical microscopy can be used to determine the fiber angles in composites made from unidirectional fiber prepreg materials. Also, it was shown that reflected polarized light can be used to further enhance fiber angle differences. Usually...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009082
EISBN: 978-1-62708-177-1
... illumination, 25× objective Fig. 7 An area in Fig. 5 viewed using reflected-light phase contrast with the same magnification as Fig. 6 . Notice the shading on the outer edges of the micrograph due to this contrast technique. Fig. 8 Transmitted-light microscopy of the natural fiber...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003720
EISBN: 978-1-62708-177-1
... Cleavage fracture in a quenched-and-tempered low-carbon steel examined using three direct methods and three replication methods. (a) Light microscopy (LM) cross section (nickel plated). Etched with Vilella's reagent. (b) LM fractograph (direct). (c) Scanning electron microscopy (SEM) fractograph (direct...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003753
EISBN: 978-1-62708-177-1
... requirements. For example, reflected light microscopy is common in the imaging of metallic microstructures, while transmitted light microscopy can be more effectively used in the microstructural imaging of polymers (where specimens may allow more light transmission). The choice of method also depends...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005729
EISBN: 978-1-62708-171-9
... Grinding Polishing Recommended Procedures Abrasive Cutting Sectioning Damage Focused Ion Beam (FIB) Machining Microscope Light Filtration Restatement: Image Analysis versus Reflected Light Microscopy of Metallographically Polished Thermal Spray Coatings Camera Computer...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009079
EISBN: 978-1-62708-177-1
..., as described in the article, “Sample Preparation and Mounting,” in this Volume. Most analysis of microcracks in composites can be performed using unmounted samples and reflected-light optical microscopy techniques (see the article, “Viewing the Specimen Using Reflected-Light Microscopy” ). Figure 1...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009071
EISBN: 978-1-62708-177-1
... of processing parameters used for manufacturing composite materials are also elucidated using optical microscopy techniques. For the majority of cases, reflected-light microscopy provides most of the necessary information one would desire. In some cases, however, etchants, stains, or dyes may be required...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... J.T. and Sparkman O.D. , Introduction to Mass Spectrometry: Instrumentation, Applications, and Strategies for Data Interpretation , Wiley , 2007 Light microscopy for the analysis of materials and device components generally refers to reflected light microscopy. In this method, light...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009072
EISBN: 978-1-62708-177-1
... of the microscope used. The polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The viewing of dyed specimens is discussed in the article, “Viewing the Specimen Using Reflected-Light...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003614
EISBN: 978-1-62708-182-5
... reflection. Light microscopy. 60× Fig. 5 Close-up of the advancing head shown in Fig. 4(a) . Minute cracks can be seen at the head-tail interface of a filiform-corrosion cell. These cracks are entry points for water and air to provide a source of hydroxyl ions and an electrolyte. Intermediate...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003749
EISBN: 978-1-62708-177-1
... etching in conjunction with light microscopy and describes several methods for film formation, namely, heat tinting, color etching, anodizing, potentiostatic etching, vapor deposition, and film deposition by sputtering. It provides information on the general procedures and precautions for etchants...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
.... and Gross L. , Reflected-Light Differential-Interference Microscopy: Principles, Use and Image Interpretation , J. Microsc. , Vol 91 (Part 3) , 1970 , p 149 – 172 10.1111/j.1365-2818.1970.tb02219.x 21. Holik A.S. , Surface Characterization by Interference Microscopy , Microstruct...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
... interface of different components (for example, carbon fiber/matrix interface). After the polishing is complete, the sample surface can be viewed using reflected-light optical microscopy. If the quality of the surface is not excellent, it can be subjected to longer polishing or reworked using the initial...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... Photographs from single-side perpendicular lighting of a fatigue fracture. (a) Single-side incandescent perpendicular lighting. (b) Single-side incandescent perpendicular lighting with an opposing white reflecting card Fig. 10 Fracture surface fiber optic ring lighting. (a) Fiber optic ring light...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... Visible light 390–760 200 0.00251 Ultraviolet ray 13–390 400 0.00164 X-ray 0.05–10 1000 0.00087 γ-ray 0.005–0.1 … … Source: Ref 1 Features of electron sources used in transmission electron microscopy Table 2 Features of electron sources used in transmission electron...