Thermoelastic stress analysis (TSA) an increasingly popular infrared (IR)-based technique for measuring stress on the surface of a part subjected to time-varying loads. This article begins by providing a theoretical and historical background of thermoelastic stress analysis. It then describes infrared detectors, such as quantum detectors and thermal/nonquantum detectors, for thermoelastic stress analysis. The article discusses the theoretical aspects for producing thermoelastic stress analysis data and the applications amenable to thermoelastic stress analysis. It concludes with information on the qualitative applications of thermoelastic stress analysis.

This article provides an introduction to the molecular fluorescence spectroscopy, and discusses the theory of fluorescence and its application to chemical analysis. It provides information on fluorescence that occurs in organic compounds and inorganic atoms and molecules. The article describes the instruments used in the spectroscopy, namely, radiation sources, sample holders, wavelength selectors, detectors, computers, and ratiometric instruments. The practical considerations include solvent effects, corrected spectra, wavelength calibration, temperature, and scattered light. The article also discusses the uses of some special techniques used in molecular fluorescence spectroscopy.

The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold and precision methods, and sample requirements. The amount of material that needs to be sampled, operating principles, and limitations of the stated methods are also discussed.

Digital radiography is a technique that uses digital detector arrays (linear or area) to capture an X-ray photonic signal and convert it to an electronic signal for display on a computer. This article begins with an overview of real-time radiography and provides a schematic illustration of a typical radioscopic system using an X-ray image intensifier. It discusses the advantages and limitations of real-time radiography. Computed radiography (CR) is one of the radiography techniques that utilizes a reusable detector comprised of photostimuable luminescence (PSL) storage phosphor. The article provides a schematic illustration of a typical storage phosphor imaging plate. It concludes with a discussion on the benefits of digital radiography.

Electron spin resonance (ESR), or electron paramagnetic resonance (EPR), is an analytical technique that can extract a great deal of information from any material containing unpaired electrons. This article explains how ESR works and where it applies in materials characterization. It describes a typical ESR spectrometer and explains how to tune it to optimize critical electromagnetic interactions in the test sample. It also identifies compounds and elements most suited for ESR analysis and explains how to extract supplementary information from test samples based on the time it takes electrons to return to equilibrium from their resonant state. Two of the most common methods for measuring this relaxation time are presented as are several application examples.

Computed tomography (CT) is an imaging technique that generates a three-dimensional (3-D) volumetric image of a test piece. This article illustrates the basic principles of CT and provides information on the types, applications, and capabilities of CT systems. A comparison of performance characteristics for film radiography, real-time radiography, and X-ray computed tomography is presented in a table. A functional block diagram of a typical computed tomography system is provided. The article discusses CT scanning geometry that is used to acquire the necessary transmission data. It also provides information on digital radiography, image processing and analysis, dual-energy imaging, and partial angle imaging, of a CT system.

This article provides an introduction to x-ray spectrometry, and discusses the role of electromagnetic radiation, x-ray emission, and x-ray absorption. It focuses on the instrumentation of wavelength-dispersive x-ray spectrometers, and energy dispersive x-ray spectrometers (EDS) that comprise x-ray tubes, the analyzing system, and detectors. The fundamentals of EDS operation are described. The article also provides useful information on preparation of various samples, explaining the qualitative and quantitative analyses of EDS. It reviews the applications of the x-ray spectrometry.

This article provides a detailed account of X-ray spectroscopy used for elemental identification and determination. It begins with an overview of the operating principles of X-ray fluorescence (XRF) spectrometer, as well as a comparison of the operating principles of wavelength-dispersive spectrometer (WDS) and energy-dispersive spectrometer (EDS). This is followed by a discussion on the mechanism and effects of X-ray radiation, X-ray emission, and X-ray absorption. The article then discusses components used, operation, and applications of WDS and EDS. Some of the factors and processes involved in sample preparation for XRF analysis are also included. The article further provides information on the practical procedure for and the applications of WDS and EDS qualitative and quantitative analyses.

This article is a compilation of definitions of terms related to materials characterization techniques.

This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.

This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. A discussion on light-scattering fundamentals and a description of the experimental aspects of the technique are included. Emphasis is placed on the different instrument approaches that have been developed for performing Raman analyses on various materials. The applications presented reflect the breadth of materials characterization uses for Raman spectroscopy and highlight the analysis of bulk material and of surface and near-surface species.

This article is a compilation of terms and definitions related to materials characterization.

This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. It includes a discussion of light-scattering fundamentals and a description of the experimental aspects of the technique. Emphasis has been placed on the different instrument approaches that have been developed for performing Raman analyses on various materials. The applications presented in the article reflect the breadth of materials characterization uses for Raman spectroscopy and highlight the analysis of bulk material and of surface and near-surface species.

Radiography is the process or technique of producing images of a solid material on a paper/photographic film or on a fluorescent screen by means of radiation particles or electromagnetic waves of short wavelength. This article reviews the general characteristics and safety principles associated with radiography. There are two main aspects of safety: monitoring radiation dosage and protecting personnel. The article summarizes the major factors involved in both and discusses the operating characteristics of X-ray tubes. It describes the various methods of controlling scattered radiation: use of lead screens; protection against backscatter and scatter from external objects; and use of masks, diaphragms, collimators, and filtration. The article concludes with a discussion on image conversion media, including recording media, lead screens, lead oxide screens, and fluorescent intensifying screens.

This article is a detailed account of optical emission spectroscopy (OES) for elemental analysis. It begins with a discussion on the historical background of OES and development trends in OES methods. This is followed by a description of the general principles and optical systems of OES, along with various types of emission sources commonly used for OES. Some of the processes involved in calibration and quantification of OES for direct solids analysis by the ratio method are then described. The article ends with a discussion on the applications of each type of emission sources.

This article provides an overview of the basic theory of infrared (IR), including emissivity and E slope. It explains how the IR thermometer works, and provides guidance on choosing a thermometer, in particular, deciding between a two-color and a single-wavelength thermometer and installing and maintaining them. The article discusses typical applications of induction heating, and describes how the IR thermometer controls the temperature. While the majority of the article discusses spot thermometers, thermal imagers, which are fast and are used for both research and control of the induction process, are also addressed.

This article focuses on the methods that are being developed for detecting and monitoring corrosion: electrochemical methods, electromagnetic or sound wave methods, fiber-optic technology, fluorescence methods, and the Diffracto Sight method. It reviews the importance of data management and the Corrosion Expert System. It concludes with information on the simulation and modeling for incorporating the mechanisms of corrosion prevention into military hardware systems design and operation.

Nondestructive testing (NDT), also known as nondestructive evaluation (NDE), includes various techniques to characterize materials without damage. This article focuses on the typical NDE techniques that may be considered when conducting a failure investigation. The article begins with discussion about the concept of the probability of detection (POD), on which the statistical reliability of crack detection is based. The coverage includes the various methods of surface inspection, including visual-examination tools, scanning technology in dimensional metrology, and the common methods of detecting surface discontinuities by magnetic-particle inspection, liquid penetrant inspection, and eddy-current testing. The major NDE methods for internal (volumetric) inspection in failure analysis also are described.

This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents the details of SEM-based techniques and specialized SEM instruments. It ends with example applications of various SEM modes.

X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation and the techniques used to characterize samples. The article then describes the principles, advantages, and disadvantages of various types of powder diffractometers. A section on the Rietveld method of diffraction analysis is then presented. The article discusses various methods and procedures for qualifying and quantifying phase mixtures in powder samples. It provides information on typical sensitivity and experimental limits on precision of XRPD analysis and other systematic sources of errors that affect accuracy. Some of the factors pertinent to the estimation of crystallite size and defects are also presented. The article ends with a few application examples of XRPD.