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Image
Published: 01 January 1986
Fig. 11(b) Boron profile (see Fig. 11(a) ) after quantitative analysis of the sputtering rate and secondary ion intensity. More
Image
Published: 01 January 1986
Fig. 11 Calibration curve for quantitative analysis of paraben concentrations in baby lotion. More
Image
Published: 15 December 2019
Fig. 18 Same area as Fig. 17 , but after quantitative analysis on a pixel-by-pixel basis with color encoding using logarithmic three-band color encoding, enabling direct comparison of concentration levels among the three constituents. Note the elimination of false contrast in the iron image. More
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
... Abstract Identification of alloys using quantitative chemical analysis is an essential step during a metallurgical failure analysis process. There are several methods available for quantitative analysis of metal alloys, and the analyst should carefully approach selection of the method used...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003758
EISBN: 978-1-62708-177-1
... Abstract This article reviews the essential parts of the complex process of quantitative image analysis to assist automatic image analysis in laboratories. It describes the basic difference between the bias of classical manual stereological analysis and quantitative image analysis. The article...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... spectrometry for electron probe microanalysis. Key concepts for performing qualitative analysis and quantitative analysis by electron-excited X-ray spectrometry are then presented. Several sources that lead to measurement uncertainties in the k-ratio/matrix corrections protocol are provided, along...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
.... Chemical analysis is carried out by X-ray fluorescence spectrometry, atomic absorption spectrophotometry, and plasma-emission spectrophotometry. Phase analysis is done by X-ray diffraction, spectroscopic methods, thermal analysis, and quantitative analysis. Techniques used for microstructural analysis...
Book Chapter

By J.B. Lumsden
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001771
EISBN: 978-1-62708-178-8
..., multiplet splitting, and the Auger parameter; and quantitative analysis such as depth analysis carried out using XPS. It also discusses the applications of XPS with examples. element analysis qualitative analysis quantitative analysis sample preparation sensitivity surface analysis X-ray...
Book Chapter

Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... on the effects of ion implantation and electronic excitation on the charge of the sputtered species. The design and operation of the various instrumental components of SIMS is then reviewed. Details on a depth-profiling analysis of SIMS, the quantitative analysis of SIMS data, and the static mode of operation...
Book Chapter

By Carlo G. Pantano
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001774
EISBN: 978-1-62708-178-8
... graphically illustrates the SIMS spectra and depth profiles of various materials. The quantitative analysis of ion-implantation profiles, instrumental features required for secondary ion imaging, the analysis of nonmetallic samples, detection sensitivity, and the applications of SIMS are also discussed...
Book Chapter

By Curtis Marcott
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001735
EISBN: 978-1-62708-178-8
..., the article provides information on spectral absorbance-subtraction, analysis of components in spectral matrix mixture, and determination of exact peak location of broad profiles. It discusses the quantitative analysis that mainly includes Beer's law for single compound in single wave number. The article also...
Book Chapter

By Curtis Marcott
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006662
EISBN: 978-1-62708-213-6
... and accessories necessary in obtaining the infrared spectrum of a material are then discussed. The article presents various techniques and methods involved in IR qualitative analysis and quantitative analysis. It ends with a few examples of the applications of IR spectroscopy. infrared spectroscopy...
Book Chapter

By Binayak Panda
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006639
EISBN: 978-1-62708-213-6
... to the calibration of materials for accurate measurements using XPS are provided, along with some aspects of the accuracy in quantitative analysis by XPS. In addition, the article presents examples of how XPS data can be used to solve problems with surface interactions. chemical composition X-ray...
Book Chapter

By G.D.W. Smith
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001772
EISBN: 978-1-62708-178-8
... be analyzed chemically by coupling to the microscope a time-of-flight mass spectrometer of single-particle sensitivity, known as the atom probe (AP). This article describes the principles, sample preparation, and quantitative analysis of FIM. It also provides information on the principles, instrument design...
Book Chapter

By G. Dana Brabson
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
... the quantitative analysis of elements in metals and metal-bearing ores. The instrumentation required for such applications consists of a light source, a filter or wavelength selector, and some type of visual or automated sensing mechanism. The article examines common sensing options and provides helpful...
Image
Published: 01 January 1986
Fig. 18 Phosphorus depth profiles for an ion-implanted silicon substrate. (a) Before quantitative analysis of the positive SIMS data. (b) After quantitative analysis. Obtained using 32 O 2 + bombardment in an ion microscope. Obtained using 33 Cs + beam bombardment in an ion More
Image
Published: 15 December 2019
Fig. 21 Phosphorus depth profiles for an ion-implanted silicon substrate. (a) Before quantitative analysis of the positive secondary ion mass spectroscopy data. (b) After quantitative analysis. Acquired using 32 O 2 + bombardment in an ion microscope. Acquired using 33 Cs + beam More
Book Chapter

By K.H. Eckelmeyer
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... Detection and quantification of elements with atomic number 5 or higher (older energy dispersive units with beryllium window detectors are limited to atomic number 11 or higher) Typical Uses Qualitative and quantitative chemical analysis for major and minor elements in metals and alloys...
Image
Published: 15 December 2019
Fig. 11 (a) Raw 11 B + and 30 Si 2+ secondary ion signals versus sputtering time for a boron-implanted silicon substrate. Acquired using oxygen beam bombardment in an ion microscope. (b) Boron profile after quantitative analysis of the sputtering rate and secondary ion intensity More
Image
Published: 01 January 1986
Fig. 14 The relationship between the Ni + secondary ion signal and the nickel content of NBS standard reference steels 661, 662, 663, 664, and 665. This calibration curve can be used for quantitative analysis of nickel in comparable low-alloy steels using an ion microprobe. Source: Ref 13 More