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powder diffraction

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation and the...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders or aggregates of finely divided material that readily diffract x-rays in specified patterns. This article provides an introduction to XRPD, beginning with a review of sensing...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
... describes the instrumentation required for, and advancements made in, neutron powder diffraction. The article further explains the texture and residual stress (macrostresses and microstresses) problems that are analyzed using the neutron powder diffraction method. It also outlines the single-crystal neutron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... monochromatic beams, powder diffraction methods, and the Rietveld method. X-ray diffraction powder diffraction methods single-crystal methods Rietveld refinement References 1. Giacovazzo C. , Monaco H.L. , Artioli G. , Viterbo D. , Milanesio M. , Gilli...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... Abstract This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
... neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., sulfur, carbon, or nitrogen Poorer sensitivity for refractory oxide or carbide-forming elements than plasma atomic emission spectrometry Basically a single-element technique (a) XRPD, X-ray powder diffraction. (b) ICP-AES, inductively coupled plasma atomic emission spectroscopy. (c) AAS...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... solid solution obtained by quenching from 500 °C (930 °F). Source: Ref 4 As noted in the section “Identification of Compounds and Phases Using X-Ray Powder Diffraction,” predictable and reproducible intensities are obtained for the diffracted beams corresponding to particular sets of...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
... materials. crystal structure qualitative analysis single crystal diffraction X-ray diffraction X-ray powder diffraction X-ray diffraction techniques are some of the most useful in the characterization of crystalline materials, such as metals, inter-metallics, ceramics, minerals, polymers...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
... 10.1021/ac50125a001 5. Fawcett T.G. , Kabekkodu S.N. , Blanton J.R. , and Blanton T.N. , Chemical Analysis by Diffraction: The Powder Diffraction File , Powder Diffr. , Vol 32 ( No. 2 ), 2017 , p 63 – 71 10.1017/S0885715617000288 6. Kabekkodu S. , Ed...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006631
EISBN: 978-1-62708-213-6
... ). Jana can work with multiphase structures (for both powder and single-crystal data) and merohedric twins as well as twins with partial overlap of diffraction spots and commensurate and composite structures. It is free for academic use and is available at http://jana.fzu.cz/ . Jana can also be used to...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001761
EISBN: 978-1-62708-178-8
... checked readily using a stress-free powder sample ( Ref 15 ). If the diffraction apparatus is properly aligned for residual stress measurement, a loosely compacted powder sample producing diffraction at approximately the Bragg angle to be used for residual stress measurement should indicate not more than...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006632
EISBN: 978-1-62708-213-6
... using a mechanical gage capable of repeat positioning precision of ±0.05 mm (±0.002 in.). The alignment of the diffractometers was established and checked using alloy or base metal powder incapable of supporting macroscopic residual stress, in accordance with ASTM E 915 (Ref 14...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003528
EISBN: 978-1-62708-180-1
... verification of instrument alignment is usually performed on a stress-free powder of the material in which residual stress is to be measured. Ideally, the shear stress should also be on the same order of magnitude as the normal stress, that is ±2 ksi, although technically, this would exceed the ASTM E 915...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006768
EISBN: 978-1-62708-295-2
... Abstract X-ray diffraction (XRD) residual-stress analysis is an essential tool for failure analysis. This article focuses primarily on what the analyst should know about applying XRD residual-stress measurement techniques to failure analysis. Discussions are extended to the description of ways...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
... significant: the preferred orientation and the size of the columnar grains. The preferred orientation of a film can be ascertained using a standard x-ray diffractometer by comparing a θ-2θ scan to one from a powder of the same material. This type of measurement also provides the grain size in the vertical...
Series: ASM Handbook
Volume: 24
Publisher: ASM International
Published: 15 June 2020
DOI: 10.31399/asm.hb.v24.a0006567
EISBN: 978-1-62708-290-7
... Abstract This article provides an overview of the general methods of metal powder production. It details the primary methods for particle sizing used in additive manufacturing: sieving, laser diffraction and scattering, and digital image analysis. Methods of interpreting and understanding...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
..., Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed. The article...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
... materials. This article discusses various characterization methods for powders. Topics discussed include: methods for determining particle size and/or size distribution; powder and coating stoichiometry; particle chemistry; and phase analysis by x-ray diffraction. This article discusses the characterization...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006136
EISBN: 978-1-62708-175-7
... produced from ADMA titanium powder. UTS = 965 MPa (140 ksi), YS = 848 MPa (123 ksi), El = 12.5% Fig. 8 Microstructure of titanium MMC strip produced by direct powder rolling plus sintering. Density is 4.25 g/cm 3 . Fig. 9 X-ray diffraction analysis of titanium MMC manufactured using...