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powder diffraction

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders or aggregates of finely divided material that readily diffract x-rays in specified patterns. This article provides an introduction to XRPD, beginning with a review of sensing...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation...
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Published: 01 January 1986
Fig. 13 The geometry of powder diffraction and several detection methods used in XRPD. (a) Cones of diffracted beams emanating from a powder sample. (b) The Debye-Scherrer detection method. (c) The diffractometer method of detection. (d) Position-sensitive detection. (e) Guinier method More
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Published: 01 January 1986
Fig. 12 JCPDS card giving x-ray powder diffraction and other associated data for the mineral quartz. Source: Ref 1 More
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Published: 01 January 1994
Fig. 6 Powder diffraction standard card for stoichiometric titanium nitride More
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Published: 15 December 2019
Fig. 14 Geometry of powder diffraction and several detection methods used in x-ray powder diffraction. (a) Cones of diffracted beams emanating from a powder sample. (b) Debye-Scherrer detection method. (c) Diffractometer method of detection. (d) Position-sensitive detection. (e) Guinier method More
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Published: 15 December 2019
Fig. 15 Powder diffraction pattern of NaCl More
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Published: 15 December 2019
Fig. 4 Debye-Scherrer method of x-ray powder diffraction. (a) Geometric relationship of film to sample, incident beam, and diffracted beams and film when developed and laid flat. (b) Example of Debye-Scherrer films identifying phases in copper-zinc alloys of various compositions. Source: Ref More
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Published: 15 December 2019
Fig. 11 (a) High-resolution synchrotron powder diffraction data (black dots) and Rietveld fit (red line) of the data. The lower (green) trace is the difference (measured minus calculated), normalized to statistical uncertainty of the raw counts. ESD, electrostatic discharge. (b) Drawing More
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Published: 15 December 2019
Fig. 7 Illustration of the diffraction cones in powder x-ray diffraction and the geometry of a point-detector setup More
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Published: 01 January 1994
Fig. 7 X-ray diffraction patterns of yttria-stabilized zirconia powder showing some monoclinic phase, and of a coating made from that powder. M, monoclinic phase; C, cubic phase; T, tetragonal phase; T + C, overlapping tetragonal and cubic reflection More
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Published: 15 December 2019
Fig. 13 (a) Contour plot of in situ powder x-ray diffraction patterns of Co(dca) 2 upon compression, displaying a phase transition at 1.1 GPa (0.16 × 10 6 psi). (b) View of metal-ligand connectivity before and after transition. Source: Ref 89 . Reprinted with permission from More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
.... It describes the instrumentation required for, and advancements made in, neutron powder diffraction. The article further explains the texture and residual stress (macrostresses and microstresses) problems that are analyzed using the neutron powder diffraction method. It also outlines the single-crystal neutron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... and monochromatic beams, powder diffraction methods, and the Rietveld method. X-ray diffraction powder diffraction methods single-crystal methods Rietveld refinement Introduction Diffraction techniques are some of the most useful in the characterization of crystalline materials, such as metals...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
... neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... Abstract This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved...
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Published: 15 December 2019
Fig. 1 Transmission Laue diffraction patterns for (a) single-crystal and (b) polycrystalline powder α-Al 2 O 3 (Mo α radiation; no filter for single-crystal diffraction pattern; zirconium filter for polycrystalline powder diffraction pattern). Reprinted with permission from International More
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
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Published: 15 December 2019
Fig. 15 International Centre for Diffraction Data (ICDD) POF(R) card giving x-ray powder diffraction and other associated data for the mineral quartz More
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Published: 01 November 1995
Fig. 6 Plot of intensity vs. twice the angle of incidence, 2θ, to show powder diffraction pattern obtained for face-centered-cubic (fcc) phase magnesium oxide using a copper target and a nickel filter. Acceleration voltage was 50 kV at a current of 20 mA. Numbers in parentheses are Miller More