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polycrystalline sample

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Image
Published: 01 June 2016
Fig. 27 (a) Polycrystalline sample of β phase with different strengths of texture: (b) random-textured (RT) β sample and (c) strong-textured (ST) β sample, according to the maxima intensity in the {101} β pole figures. Source: Ref 22 More
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Published: 01 January 1986
Fig. 24 Rocking curves for individual grains of a polycrystalline sample. Arrays of spots correspond to reflection range of each grain and are obtained by multiple exposures after incremental sample rotations of 3 arc minutes each. (a) Annealed and undeformed type 304 stainless steel. (b) Same More
Image
Published: 01 January 1986
Fig. 22 Double crystal diffractometer for polycrystalline samples. Source: Ref 40 , 41 More
Image
Published: 01 June 2016
Fig. 28 Phase field simulation of α precipitation in a polycrystalline β sample, showing the effects of both starting β texture and prestrain on the microstructure and transformation texture (represented by the {0001} α pole figure) More
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Published: 15 December 2019
Fig. 6 Diffraction patterns obtained from (a) single-crystal and (b) polycrystalline samples and recorded using a charge-coupled device detector More
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Published: 01 December 2004
Fig. 20 Geometrically necessary boundary (GNB) spacing measurements from highly cold-rolled (cr) polycrystalline samples of aluminum (ε vM = 2.7) and nickel (ε vM = 4.5) compared to data from the [421] single-crystal samples compressed to strains of ε vM = 0.2, 0.3, and 0.6. (a) Probability More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
... Abstract X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... Abstract This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001757
EISBN: 978-1-62708-178-8
.... The symmetry of the spot pattern can be used to determine the orientation of the single crystal relative to the x-ray beam. When monochromatic radiation is used, and the sample is polycrystalline, the film would show a set of concentric rings, known as Debye rings. In this case, the d -spacing (see...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001759
EISBN: 978-1-62708-178-8
... behavior. The article also discusses sample selection and preparation as well as the challenges and limitations of various methods. crystallographic texture polycrystalline sample preferred orientation quantitative determination Overview Introduction Crystallographic texture measurement...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001769
EISBN: 978-1-62708-178-8
...). Limitations of Surface-Sensitive Electron Diffraction Surface-sensitive diffraction is in general limited to analysis of surfaces of single crystals and overlayers and films on such surfaces. If a polycrystalline sample is illuminated using a beam of low-energy electrons, each crystallite surface exposed...
Image
Published: 01 December 1998
Fig. 17 Transmission electron microscopy grain orientation contrast in a sample of fine-grained polycrystalline silicon. Courtesy of Tom Headley, Sandia National Laboratories More
Image
Published: 01 December 1998
Fig. 15 Electron diffraction spot pattern from a single grain in a polycrystalline aluminum sample. The spots are indexed in the accompanying computer-generated drawing. Source: Ref 3 More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001760
EISBN: 978-1-62708-178-8
... by a cylindrical film surrounding the sample. These arcs would normally be continuous, but because of the highly parallel and monochromatic incident radiation, only selected grains are oriented for reflection. Fig. 22 Double crystal diffractometer for polycrystalline samples. Source: Ref 40 , 41...
Image
Published: 01 December 1998
Fig. 14 Electron diffraction ring pattern obtained from numerous grains in a polycrystalline aluminum sample. Starting with the innermost ring, the rings correspond to {111}, {200}, {220}, {311}, and {222} planes. Source: Ref 3 More
Image
Published: 15 December 2019
at a single location on the Toluca meteorite showing polycrystalline Debye rings with a strong preferred orientation. (c) Photograph of the sample area mapped in 2-D mineral maps. (d and e) 2-D kamacite and taenite maps, respectively, of area shown in (c). μXRD images were collected at 0.5 mm (0.02 More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006655
EISBN: 978-1-62708-213-6
.... If a polycrystalline sample is illuminated by using a beam of low-energy electrons, each crystallite surface exposed will create its own diffraction pattern, all of which will be superimposed on the fluorescent screen. If more than a few orientations are illuminated by the beam, the pattern becomes too complicated...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003784
EISBN: 978-1-62708-177-1
... Abstract Pure metals normally solidify into polycrystalline masses, but it is relatively easy to produce single crystals by directional solidification from the melt. This article illustrates the dislocations present in a metal crystal, which is often polygonized into sub-boundaries during grain...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001756
EISBN: 978-1-62708-178-8
.... Polycrystalline Diffraction Methods Use of a single crystal is impossible or inappropriate for many samples. X-ray powder diffraction (XRPD) techniques use a sample composed of a powder of many small crystallites. Uses for XRPD techniques range from phase identification to quantitative analysis of mixtures...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
.... Powder Diffraction Methods Use of a single crystal is impossible or inappropriate for many samples. X-ray powder diffraction (XRPD) techniques use a sample composed of a large number of small crystallites either in true powder form or under the form of a polycrystalline aggregate. Uses for XRPD...