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polarized-light microscopy

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Published: 01 December 2004
Fig. 22 Principles of polarized light microscopy More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009075
EISBN: 978-1-62708-177-1
...-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The article also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical...
Image
Published: 30 September 2015
Fig. 22 Microstructure of beryllium consolidated by vacuum hot pressing revealed using polarized light microscopy More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003780
EISBN: 978-1-62708-177-1
... of A. Kelly U-0.3Mo U-0.3Mo is used for applications requiring a higher yield strength than that of unalloyed uranium. The material is usually vacuum induction melted, cast to near final shape, then used in the as-cast condition. Low-magnification polarized light microscopy of as-cast U-0.3Mo...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003754
EISBN: 978-1-62708-177-1
... oblique illumination optical components phase contrast illumination photomicrography polarized light microscopy resolution THE LIGHT OPTICAL MICROSCOPE remains the most important tool for the study of microstructure, despite the evolution of sophisticated electron metallographic instruments...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003464
EISBN: 978-1-62708-195-5
... grinding, and polishing. The preparation techniques of ultrathin sections are also summarized. The article explains the illumination methods used by reflected light microscopy to view a specimen. These consist of epi-bright-field illumination, epi-dark-field illumination, epi-polarized light, and epi...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003795
EISBN: 978-1-62708-177-1
..., and polishing as well as ceramographic etching. It discusses common imaging approaches, including scanning electron microscopy and thin-section polarized light techniques, a type of optical microscopy. The article also addresses microstructural classification, examining detailed micrographs from samples...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009082
EISBN: 978-1-62708-177-1
... differential scanning calorimetry, x-ray analysis, or density measurements, these analytical methods provide little, if any, information on the origin and microstructure of the crystallinity in the composite. To determine the morphology of thermoplastic-matrix composites, transmitted polarized-light microscopy...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... are markedly inferior to what can be achieved using the light microscope, as shown in this article. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright-field illumination, dark-field illumination, polarized light illumination...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009081
EISBN: 978-1-62708-177-1
... Laminates , Compos. Part A: Appl. Sci. Manuf. , Vol 32 , 2001 , p 1237 – 1242 10.1016/S1359-835X(01)00058-6 12. Davidson M.W. , “The Berek Compensator,” Polarized Light Microscopy, Olympus Microscopy Resource Center, http://www.olympusmicro.com/primer/techniques/polarized...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009076
EISBN: 978-1-62708-177-1
...: Bright field Polarized light Phase contrast Differential interference contrast (DIC), also known as Nomarski Modulation contrast, also known as Hoffman modulation contrast Epi-illumination Optical staining The various methods of transmitted optical microscopy are used to enhance...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009077
EISBN: 978-1-62708-177-1
... Reflected-Light Microscopy,” optical microscopy can be used to determine the fiber angles in composites made from unidirectional fiber prepreg materials. Also, it was shown that reflected polarized light can be used to further enhance fiber angle differences. Usually, a composite material can be cross...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... structures (microstructure) include the magneto-optical Kerr method, the Faraday method, the Bitter technique, scanning electron microscopy (magnetic contrast Types I and II), scanning electron microscopy with polarization analysis, Lorentz transmission electron microscopy, and magnetic force microscopy...
Image
Published: 01 November 2010
Fig. 25 Recorded grain-boundary migration in a zinc bicrystal by optical microscopy in polarized light (video frames). Source: Ref 2 More
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009083
EISBN: 978-1-62708-177-1
... Abstract Honeycomb-cored sandwich panels increase part stiffness at a lower weight than monolithic composite materials. This article illustrates an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. This area shows...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0009085
EISBN: 978-1-62708-177-1
..., including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including the type of lightning strike protection material on the surface (expanded foil or interwoven wire), the polymer matrix, the fiber type and volume, the lay-up...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
... of illumination, several special techniques (oblique illumination, darkfield illumination, opaque-stop microscopy, phase-contrast microscopy, and polarized-light microscopy) have particular applications for metallographic studies. Köhler Illumination Most microscopes using reflected or transmitted light...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001295
EISBN: 978-1-62708-170-2
... is measured during ellipsometry. The amplitude ratios and phase shifts are functions of the wavelength, thickness, optical properties of the various materials, and angle of incidence. Polarized Light Most light sources emit unpolarized light, or light with electric-field components oriented in all...