1-20 of 57 Search Results for

polarized light microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... what can be achieved using the light microscope, as shown in this article. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright-field illumination, dark-field illumination, polarized light illumination, oblique...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001834
EISBN: 978-1-62708-181-8
... intergranular and to determine if the fracture part is specific to any phase or constituent present. Although such specimens can be examined by scanning electron microscopy (SEM), light microscopy is more efficient for such work, and certain information, such as the color or polarization response of...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... include reflected light microscopy using polarized light, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis of X-rays, and wavelength dispersive analysis of X-rays. Macroscopic property characterization involves measurement of porosity, density, and surface area...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... Abstract This article discusses the fundamentals and operating principles of the following acoustic microscopy methods: scanning laser acoustic microscopy, C-mode scanning acoustic microscopy, and scanning acoustic microscopy. It describes the applications of acoustic microscopy for detecting...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006765
EISBN: 978-1-62708-295-2
... influence of microstructures on the failure of a material is discussed and examples of such work are given to illustrate the value of light microscopy. In addition, information on heat-treatment-related failures, fabrication-/machining-related failures, and service failures is provided, with examples...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... devices. The methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive x-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, x-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
... Abstract This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural parameters...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... nm. In both techniques, the wave nature of electrons is used to image a specimen, just as light is used in optical microscopy. An electron gun generates a stream of highly energized electrons that are focused onto the specimen. Generally speaking, TEM, in which electrons are passed through the...
Book Chapter

Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006685
EISBN: 978-1-62708-213-6
... Abstract This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. A discussion on light-scattering fundamentals and a description of the experimental aspects of the technique are...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... lighting and microscopic photography. Special techniques can be employed to deal with highly reflective conditions and are also described in this article. digital cameras failure analysis microscopic photography photographic lighting visual examination FAILURE ANALYSIS is an investigative...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001833
EISBN: 978-1-62708-181-8
... 3200 K balanced film and no filter (the article “Light Microscopy” in Volume 9 of ASM Handbook includes a color filter nomograph to aid photographers in determining which color-correcting filters are required to match the film with the light source). Electronic-flash lighting is rarely used for...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001237
EISBN: 978-1-62708-170-2
... that requires a three-dimensional appearance. It uses low-angle illumination, so higher magnifications are limited. Polarized light is especially useful for analyzing optically anisotropic metals, such as beryllium, α-titanium, and zirconium. Differential interference contrast (DIC...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001295
EISBN: 978-1-62708-170-2
... change the polarization state of the light, some sort of detector, and some calculation facilities. Although rudimentary forms of these requirements have been present throughout this century, the development of the photomultiplier, the laser, and the desktop computer have greatly enhanced the use of this...
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.a0003839
EISBN: 978-1-62708-183-2
... passivates in 0.5 M Na 2 SO 4 during anodic polarization. Fig. 12 Reinforcement-induced microcrevice corrosion. (a) In situ light micrograph of silicon/aluminum metal-matrix composite immersed in aerated 0.5 M Na 2 SO 4 at 30 °C (86 °F) in the open-circuit condition. Region of localized...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006073
EISBN: 978-1-62708-172-6
... in a crosslinked coating film. Even if the film is thermoplastic, and not crosslinked, such inhomogeneities and phase separations still are present, and for the same reasons. The presence of low-molecular-weight regions in coating films has been demonstrated by electron and light microscopy studies...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003246
EISBN: 978-1-62708-199-3
... the matrix is tempered martensite plus a small amount of retained austenite not visible by light microscopy. Because these specimens were tempered at relatively low temperatures, the prior-austenite grain boundaries are visible after etching. Fig. 21 Microstructure of two common high-carbon...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
.... Optical microscopy is a primary analytical technique used to examine microstructure. Thick sections and fracture surfaces can be examined with reflected light to characterize microstructure. Thin sections can be more revealing and provide a better opportunity for phase analysis but with increased effort...
Series: ASM Handbook
Volume: 14A
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v14a.a0004018
EISBN: 978-1-62708-185-6
... by microscopy alone. Because they reveal the characteristic lattice rotation produced by twinning, x-ray and electron diffraction positively differentiate twins and slip lines ( Fig. 31b , c ). Polarized light illumination is sometimes useful for identifying twins, especially in hcp metals. Fig...