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photo spectrometry

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001737
EISBN: 978-1-62708-178-8
... Abstract Spark source mass spectrometry (SSMS) is an analytical technique used for determining the concentration of elements in a wide range of solid samples, including metals, semiconductors, ceramics, geological and biological materials, and air and water pollution samples. This article...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... scattering energy-dispersive spectrometry wavelength-dispersive spectrometry Overview Introduction X-ray spectroscopy, or x-ray fluorescence (XRF) spectrometry, is an emission spectroscopic technique that has found wide application in elemental identification and determination. The technique...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006647
EISBN: 978-1-62708-213-6
... Inductively coupled plasma atomic emission spectrometry is inherently a multielement technique, and different spectrometer configurations are used to detect the emission of interest: polychromators for simultaneous multielement analysis and monochromators for sequential multielement analysis. Grating...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001777
EISBN: 978-1-62708-178-8
..., these devices have found wide applicability in the analysis of biochemical compounds. Recently, liquid chromatography/mass spectrometry (LC/MS) systems have been developed, combining the excellent separation capabilities of LC with the powerful structural identification capabilities of MS. However...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... and oxygen, with significantly lower atomic numbers than the aluminum (dark flakes) or the steel (bright flakes). The particles and fibers in both photos are held in place by a special double stick tape whose only EDS detectible element is carbon. Energy-Dispersive Spectrometry Microchemical Analysis...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... bonding, and elemental depth profile Ion scattering spectroscopy (ISS) The energy of scattered primary ions from the surface allows identification of surface atoms. Chemical composition of the surface films at atomic and a molecular level Secondary ion mass spectrometry (SIMS) Incident ion beam...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... the sample is excited in the sources used for emission spectroscopy and absorption contrast. In transmission electron aliquot. A representative sample of a larger spark source mass spectrometry. microscopy, image contrast caused by dif- quantity. ferences in absorption within a sample due analytical line...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0006515
EISBN: 978-1-62708-200-6
...-tenninated polybutadiene EC ethyl cellulose b Burgers vector ECTFE ethylene chlorotrifluoroethylene b empirical wavelength dependent constant acrylonitrile rubber EDM electrical discharge machining bal balance CTE coefficient of thennal expansion EDS energy-dispersive x-ray spectrometry bee body-centered...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
.... A change in temper- tions in sample excitation and photo- phase chromatography. ature in a gas undergoing Joule-Thomson graphic processing in emission spec- expansion. See also Joule-Thomson ex- troscopy. ion-scattering spectrometry. A technique pansion. to elucidate composition and structure of internal...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001729
EISBN: 978-1-62708-178-8
.... In subsequent years, the success of the technique renewed interest in analytical atomic emission, which had been largely supplanted by developments in atomic absorption instrumentation in the 1950s and 1960s (see the article “Atomic Absorption Spectrometry” in this Volume). The success of the ICP was due...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
... Absorption Spectrometry” in this Volume). The spectral region of interest extends from 200 to 800 nm. The short-wavelength (200 nm) high-energy end of this spectral region is defined by the fact that below 200 nm oxygen and nitrogen in the atmosphere begin to absorb the radiant energy. The region below...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... a microscopic part of a solid specimen bombarded by a beam of accelerated electrons. It provides information on the various aspects of energy-dispersive spectrometry (EDS) and wavelength-dispersive spectrometry (WDS), and elucidates the qualitative analysis of the major constituents of EDS and WDS. The article...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
..., the fracture origin. If the specimen exhibits multiple fracture modes, usually visible with a binocular microscope, the different areas are documented ( Fig. 5 ). Consequently, to maintain orientation, the microscopist should use a macrophotograph or detailed sketch to identify sites where SEM photos...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... and Table 1 list some of the most common tools used for the characterization of the various classes of semiconducting materials considered in this article. Fig. 1 Flow charts of common techniques for characterization of semiconductors. ICP-MS: inductively coupled mass spectrometry; ESR: electron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006662
EISBN: 978-1-62708-213-6
... is oriented to pass p-polarized light and is followed by a photo-elastic modulator (PEM) oriented with the stress axis at 45° to the plane of polarization. The optical element of a PEM is a highly isotropic infrared-transmitting material, the most common being ZnSe and calcium fluoride (CaF 2 ). Two...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001735
EISBN: 978-1-62708-178-8
... spectroscopy with various chromatographic techniques. The most advanced and useful of these techniques is gas chromatography-infrared (GC-IR) spectroscopy ( Ref 28 , 29 ). Although not as sensitive as the more widely used technique of gas chromatography/mass spectrometry (GC/MS), GC-IR spectroscopy can...
Series: ASM Handbook
Volume: 14B
Publisher: ASM International
Published: 01 January 2006
DOI: 10.31399/asm.hb.v14b.a0009152
EISBN: 978-1-62708-186-3
... in conducting current based on the amount of light detected. Because LEDs emit light over a wide area, and photo-detectors can detect light over a wide area, lenses are used to narrow down the emitting and sensing areas ( Ref 17 ). Opposed-Mode Photoelectric Sensors Opposed-mode photoelectric sensors...