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partial angle imaging

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Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006456
EISBN: 978-1-62708-190-0
... also provides information on digital radiography, image processing and analysis, dual-energy imaging, and partial angle imaging, of a CT system. computed tomography digital radiography dual-energy imaging film radiography partial angle imaging real-time radiography X-ray computed tomography...
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003436
EISBN: 978-1-62708-195-5
... Wang W. , Critical Angle Measurement of Elastic Constants in Composite Materials , J. Acoust. Soc. Am. , Vol 85 , ( No. 5 ), 1989 , p 1876 – 1882 10.1121/1.398566 34. Dayal V. and Kinra V.K. , Leaky Lamb Waves in an Anisotropic Plate. I: An Exact Solution and Experiments...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006473
EISBN: 978-1-62708-190-0
... provides information on the dimension-measurement applications of ultrasonic inspection methods. ultrasonic imaging inspection area-amplitude blocks distance-amplitude blocks calibration defects WHEN ULTRASONIC NONDESTRUCTIVE TESTING (NDT) was first applied, it was a workmanship standard and...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003757
EISBN: 978-1-62708-177-1
... References 1. Wojnar L. and Kurzydlowski K.J. , Analysis and Interpretation , in Practical Guide to Image Analysis , ASM International , 2000 , p 171 – 183 2. Foley J.D. , Van Dam A. , Feiner S.K. , and Hughes J.F. , Computer Graphics...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003788
EISBN: 978-1-62708-177-1
... microscopy techniques specific to magnetic materials (e.g., domain imaging), with specific examples where possible. It includes metallographic sample preparation procedures, followed by descriptions of microstructures of bulk magnetic materials. Information on magnetically soft materials, permanent magnets...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006475
EISBN: 978-1-62708-190-0
... Abstract Electromagnetic signals at microwave and millimeter-wave frequencies are well suited for inspecting dielectric materials and composite structures in many critical applications. This article presents a partial list of reported nondestructive testing (NDT) application areas for...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003758
EISBN: 978-1-62708-177-1
... electron microscopy, for example, back-scattered and secondary electrons. If the apparatus also allows for the analysis of chemical composition, this option can be used for producing a series of images offering partial information about the interesting features. The appropriate use of this information can...
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005341
EISBN: 978-1-62708-187-0
... electrical conductivity measurements. This article summarizes the application of these nondestructive tests to castings. It also tabulates a partial list of automotive part types and materials amenable to PCRT and lists the potential limitations to the use of PCRT. castings automotive parts eddy...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006470
EISBN: 978-1-62708-190-0
... example, ultrasonic waves are almost completely reflected at metal-gas interfaces. Partial reflection occurs at a metal-liquid interface or at an interface between a metal and another solid, with the specific percentage of reflected energy depending mainly on the ratios of certain acoustic properties...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005729
EISBN: 978-1-62708-171-9
... Abstract Metallographic examination is a critical step in the assessment of thermal spray coating characteristics. This article discusses the major steps involved in metallographic examination: sectioning, mounting, grinding, polishing, optical microscopy, and image analysis. It provides a...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006452
EISBN: 978-1-62708-190-0
... and analytical simulation Direct numerical simulation Analytical simulation Basic principle Governing partial differential equations are discretized and solved numerically to satisfy boundary conditions. Most widely used method is finite-element simulation (numerous general-purpose...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006681
EISBN: 978-1-62708-213-6
... typically is ≤2 to 3°. Elastic scattering is due to interactions of the energetic electrons with the nuclei of the atoms in the target, partially screened by the bound electrons. The extent of the elastic scattering is related to the square of the atomic number of the target material and inversely...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006448
EISBN: 978-1-62708-190-0
... radiographic images, the design of the anode and target represents a compromise between maximum radiographic definition and maximum target life. In many x-ray tubes, a long, narrow, actual focal spot is projected as a roughly square effective focal spot by inclining the anode face at a small angle (usually...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... typically is ≤2°. Elastic scattering is due to interactions of the energetic electrons with the nuclei of the atoms in the target, partially screened by the bound electrons. The extent of the elastic scattering is related to the square of the atomic number of the target material and inversely related to...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
..., d s , to a diameter large enough to overlap an adjacent pixel. Therefore, depth of field depends on the magnification used as well as the beam convergence angle, α. A useful criterion is to presume a typical observer can discern image blur once two adjacent pixels completely overlap ( Ref 17...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001837
EISBN: 978-1-62708-181-8
... “Analytical Procedures” in this article, in which the subject of partially oriented surfaces is treated in a more quantitative manner. In this section, conventional stereoscopic imaging and photogrammetric methods will be considered, as well as a geometric method that requires no instrumentation. Basically...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... instrumentation and principles of SEM, broadly explaining its capabilities in resolution and depth of field imaging. It describes three additional functions of SEM, including the use of channeling patterns to evaluate the crystallographic orientation of micron-sized regions; use of backscattered detectors to...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006644
EISBN: 978-1-62708-213-6
.... Forum , Vol 600–603 , 2009 , p 305 – 308 10.4028/www.scientific.net/MSF.600-603.305 16. Chen Y. , Dudley M. , Liu K.X. , Caldwell J.D. , and Stahlbush R.E. , Synchrotron X-Ray Topographic Studies of Recombination Activated Shockley Partial Dislocations in 4H-SiC...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
.... Conventional SEMs operate in the minimal scattering regime, where n c varies between 0 and 0.05. In the partial scattering regime, where LV-SEMs and ESEMs are operating, n c varies between 0.05 and 3. The complete scattering regime, with n c > 3, is not useful for imaging. In Fig. 9 , the beam intensity...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... sand blasting. In sputter coating, the sample is placed in a vacuum chamber beneath a metallic target, usually of gold or gold-platinum. After a vacuum is achieved, a partial pressure of argon is introduced into the chamber and a voltage placed across the target material and the sample. The target...