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optoelectronic devices

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... or electronic performance of a material in order to identify areas with electronic inhomogeneities. Photoluminescence and time-resolved photoluminescence can be used to measure the internal quantum efficiency and minority carrier lifetime of an optoelectronic device and can be performed using...
Series: ASM Handbook
Volume: 4B
Publisher: ASM International
Published: 30 September 2014
DOI: 10.31399/asm.hb.v04b.a0005931
EISBN: 978-1-62708-166-5
... monitoring and control of motion and position of various mechanical components with the help of mechanical limit switches, proximity sensors, and distance- and position-measuring devices. Using inputs from both flow meters and sensors, such as thermocouples and oxygen sensors, flow measurement control...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003067
EISBN: 978-1-62708-200-6
... applications, lighting, information display, electronic processing and electronic devices, optical and ophthalmic products, and communications equipment. architectural glass biomedical glass dental glass glass fibers lamp glass optical glass specialty glasses traditional glasses GLASS in its...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001284
EISBN: 978-1-62708-170-2
... as optoelectronic devices, such as lasers, light-emitting diodes, and high-efficiency photovoltaic cells. The ability to grow thin, multilayered structures with very fine dimensional and compositional control has made possible quantum-well devices and strained-layer superlattices. The development of...
Book Chapter

By S.L. Rohde
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001288
EISBN: 978-1-62708-170-2
... reactive and nonreactive sputtering is also provided. The article concludes with a discussion on the several methods of process control and the applications of sputtered films. In the fields of microelectronics and optoelectronics, sputtered thin films have...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
.... Special techniques include electron backscatter diffraction capable of determining local crystal structure to map microstructure; electron beam induced current, which is useful for semiconductor device characterization, defect imaging, and failure analysis; cathodoluminescence, where detected photons have...