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optical emission spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006640
EISBN: 978-1-62708-213-6
... Abstract This article is a detailed account of optical emission spectroscopy (OES) for elemental analysis. It begins with a discussion on the historical background of OES and development trends in OES methods. This is followed by a description of the general principles and optical systems of...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001728
EISBN: 978-1-62708-178-8
... Abstract This article discusses the general principles, optical systems, and emission sources of optical emission spectroscopy for elemental analysis. Changes in the energy of the valence or outer shell electrons result in the atomic lines used in emission spectroscopy. Each possible...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... Abstract The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold and...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001729
EISBN: 978-1-62708-178-8
... applications of ICP-AES. inductively coupled plasma atomic emission spectroscopy optical properties scrap metal spectrometers water References 1. Greenfield S. , Jones I.L. , and Berry C.T. , Analyst , Vol 89 , 1964 , p 713 10.1039...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001735
EISBN: 978-1-62708-178-8
... becomes the source in emission spectroscopy. For weak emission signals, the spectrometer temperature should be less than the sample temperature, or infrared emission from the background and spectrometer optics may be larger than the source signal of interest. Heating the sample is usually more convenient...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001770
EISBN: 978-1-62708-178-8
... elemental images. In XPS, bombardment of the sample surface with x-rays results in photoelectron and Auger electron emission. Thus, an XPS spectrum contains both sets of peaks representing sample surface and provides much information (see the article “X-Ray Photoelectron Spectroscopy” in this Volume...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001774
EISBN: 978-1-62708-178-8
... particles that can be focused into a directed beam; therefore, these techniques are referred to as ion sputtering and ion beam sputtering. However, in principle, sputtering (and secondary ion emission) will also occur under neutral beam bombardment. Secondary ion mass spectroscopy is typically based on ion...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001771
EISBN: 978-1-62708-178-8
... techniques. (a) XPS. (b) X-ray analysis. (c) AES (Auger electron spectroscopy). ϕ, spectrometer work function After a core hole is produced, it is filled by an outer electron. When this electronic transition occurs, energy is conserved by the emission of a photon ( Fig. 1b ) or by the emission of a...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001731
EISBN: 978-1-62708-178-8
.... Table 1 Terms and symbols used in UV/VIS absorption spectroscopy Term and symbol Definition Alternative Radiant power, P Energy per unit area per unit time Intensity, I Absorbance, A log 10 ( P 0 / P ) = log 10 ( l / T ) Optical density, OD, or D; extinction, E...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... electron microscope and its basic operational characteristics, electron optics, electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001730
EISBN: 978-1-62708-178-8
... practice differs substantially among the three types of atomic spectroscopy. The sensitivity of AAS determinations is determined almost wholly by the characteristics of the light source and the atomizer, not by the optics or electronics of the spectrometer. Simple, inexpensive AAS...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
.... electromagnetic radiation energy-dispersive X-ray spectrometers qualitative analysis quantitative analysis sample preparation X-ray absorption spectroscopy X-ray emission spectroscopy References 1. Kramers A.H. , Philos. Mag. , Vol 46 , 1923 , p 836 10.1080...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... analysis NGR nuclear gamma-ray resonance NMR nuclear magnetic resonance NQR nuclear quadrupole resonance ODMR optical double magnetic resonance OES optical emission spectroscopy PAS photoacoustic spectroscopy PGAA prompt gamma-ray activation analysis PIXE...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... stainless. Referring to Table 1 , the engineer can look down the list of analytical methods for one having a closed circle (●) under the “Macro/Bulk” column, the “Quant” column, and the “Major” and “Minor” columns. This quickly shows that optical emission spectroscopy, spark source mass spectrometry...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001739
EISBN: 978-1-62708-178-8
... as x-ray and optical emission spectrographs are effective (see the articles “X-Ray Spectrometry” and “Optical Emission Spectroscopy” in this Volume). Qualitative methods may be classified as those in which a portion of the solid sample is dissolved and the solution transferred to another medium...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001767
EISBN: 978-1-62708-178-8
... scanning Auger microscopes, and lists the applications and limitations of SEM. Jominy testing optical microscopes scanning electron microscopes scanning electron microscopy X-ray spectrometers References 1. Broers A.N. , Scan. Elec. Microsc. , 1974 , p 10...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001750
EISBN: 978-1-62708-178-8
... electrons in the higher energy level. The absorbed energy results in stimulated emissions by these electrons. Because the coefficients of absorption and stimulated emission are equal, no net value would be observed if the spin population were distributed equally between these two levels. In general, n 1...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... microanalysis energy-dispersive X-ray spectrometers microbeam analysis qualitative analysis quantitative analysis scanning electron microscopes wavelength-dispersive X-ray fluorescence spectroscopy References 1. Castaing R. , Thesis, University of Paris, France...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006647
EISBN: 978-1-62708-213-6
.../ac00251a020 17. Morishige Y. and Kimura A. , Ionization Interference in Inductively Coupled Plasma-Optical Emission Spectroscopy , Ind. Mater. , 2008 , p 106 – 111 18. Blades M.W. and Horlick G. , Interference from Easily Ionizable Element Matrices in Inductively...