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optical emission spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006640
EISBN: 978-1-62708-213-6
... Abstract This article is a detailed account of optical emission spectroscopy (OES) for elemental analysis. It begins with a discussion on the historical background of OES and development trends in OES methods. This is followed by a description of the general principles and optical systems...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001728
EISBN: 978-1-62708-178-8
... Abstract This article discusses the general principles, optical systems, and emission sources of optical emission spectroscopy for elemental analysis. Changes in the energy of the valence or outer shell electrons result in the atomic lines used in emission spectroscopy. Each possible...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006647
EISBN: 978-1-62708-213-6
... the use of a flame as an excitation source, combined with a prism as a dispersive system, to separate spectral lines, giving rise to the flame spectroscopy technique ( Ref 2 ). However, it was only in the 1960s that the first inductively coupled plasma optical emission spectrometer (ICP-OES), operating...
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Published: 01 October 2014
Fig. 7 Glow discharge optical emission spectroscopy (GDOES) concentration profile of carbon and nitrogen in the compound layer of low-alloyed steel after plasma nitriding. Source: Ref 12 More
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Published: 01 June 2016
Fig. 2 Concentration depth profile (glow discharge optical emission spectroscopy) of a nitrided case. Aluminum alloy 5083; T N = 480 °C (900 °F); t N = 3 h More
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Published: 01 June 2016
Fig. 8 Glow discharge optical emission spectroscopy concentration depth profiles. (a) Aluminum alloy 360.0 nitrided at 470 °C (880 °F); t N,eff = 5 h. (b) Aluminum alloy 5083 nitrided at 470 °C (880 °F); t N,eff = 4 h More
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Published: 15 December 2019
Fig. 12 Examples of calibration curves in spark optical emission spectroscopy using the ratio method. Source: Ref 8 . Reprinted with permission of Elsevier More
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Published: 15 December 2019
Fig. 14 Glow discharge-optical emission spectroscopy quantitative depth profile of a ~0.5 μm oxide layer on a low-alloy steel. Note that the scale factors for chromium, manganese, silicon, and carbon are expanded. Source: Ref 8 . Reprinted with permission of Elsevier More
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
... covers the operating principles, applications, advantages, and disadvantages of optical emission spectroscopy (OES), inductively coupled plasma optical emission spectroscopy (ICP-OES), X-ray spectroscopy, and ion chromatography (IC). In addition, information on combustion analysis and inert gas fusion...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... Abstract This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... Abstract The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold...
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Published: 15 December 2019
-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES, optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy More
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Published: 01 January 1994
spectroscopy). GDOES (GDMS), glow discharge optical emission spectroscopy (glow discharge mass spectroscopy). RBS (ISS), Rutherford backscattering spectroscopy (ion scattering spectroscopy). Source: Ref 3 More
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Published: 15 January 2021
Fig. 2 Schematic diagram of inductively coupled plasma optical emission spectroscopy system. RF, radio frequency. Source: Ref 3 More
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Published: 15 January 2021
Fig. 2 Example of burn marks left behind after arc/spark optical emission spectroscopy, illustrating how this technique is destructive to the surface. Courtesy of J. Sampson, NASA More
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Published: 30 September 2014
Fig. 22 Comparison of (a) simulated carbon profile with optical emission spectroscopy (OES) measurements, and dishing magnitudes after (b) case hardening and (c) blank hardening for different cutting strategies with coordinate measurements. Source: Ref 83 More
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Published: 01 November 2010
Fig. 6 Results from the simulation of nitriding and comparison with experimental data obtained by glow discharge optical emission spectroscopy (GD-OES) analysis. Carbon and nitrogen profiles in mass percent. Nitrided surface at origin of x -axis. Source: Ref 24 More
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Published: 01 October 2014
Fig. 15 (a) Micrograph of low-temperature nitrocarburized austenitic stainless steel AISI 316 in an atmosphere of (partly) decomposed urea (in situ activation). The sample was heated to 490 °C (910 °F) in 45 min and thereafter immediately cooled. (b) Glow discharge optical emission More
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Published: 31 December 2017
Fig. 10 Wear indicators measured for eight of the whole fleet. The sampling numbers do not represent constant time intervals. (a) Iron concentration based on rotating disc electrode optical emission spectroscopy (RDE-OES). (b) Wear particle concentration (WPC) and (c) D L / D S values More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy, SSMS, spark source mass spectrometry; TEM, transmission electron microscopy; XPS, x-ray photoelectron...