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neutron imaging

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Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006465
EISBN: 978-1-62708-190-0
... electromagnetic and eddy current techniques that can be used to detect changes to nearsurface geometric anomalies or other defects are also discussed. These include ultrasonic techniques, radiographic techniques, and neutron imaging. additive manufacturing cracking eddy current technique electromagnetic...
Book Chapter

Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003238
EISBN: 978-1-62708-199-3
... of radiation in radiographic inspection, including X-rays and gamma rays. It deals with the characteristics that differentiate neutron radiography from X-ray or gamma-ray radiography. The geometric principles of shadow formation, image conversion, variation of attenuation with test-piece thickness, and many...
Series: ASM Handbook Archive
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0000615
EISBN: 978-1-62708-181-8
... Abstract This article is an atlas of fractographs that helps in understanding the causes and mechanisms of fracture of iron-base superalloys and in identifying and interpreting the morphology of fracture surfaces. The fractographs illustrate the neutron irradiation effect, fracture mode...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
...) image. Glossary of Terms / 675 interference of waves. The process whereby groups) that give the resin the property of stituents, the numbers of neutrons in the two or more waves of the same frequency combining with or exchanging ions be- nuclei of isotones are the same. See also or wavelength combine...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
..., results in image degradation. Such errors wavelength is minimized. See also achro- emission, absorbance, and conductivity) may be chromatic, spherical, astigmatic, matic and apochromatic lens. and (2) the concentration or mass of the sub- comatic, distortion, or curvature of eld stance being measured...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006457
EISBN: 978-1-62708-190-0
... to the inspection of bonded structures, including visual inspection, ultrasonic inspection, X-ray radiography, and neutron radiography. The evaluation and correlation of inspection results are also discussed. The article concludes with information on the effects of ultrasonic wave interference in the ultrasonic...
Image
Published: 15 December 2019
Fig. 1 Flow charts of common techniques for characterization of glasses and ceramics. AAS, atomic absorption spectrometry; AES, Auger electron spectroscopy; EPMA, electron probe x-ray microanalysis; FTIR, Fourier transform infrared spectroscopy; IA, image analysis; IC, ion chromatography; ICP More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... electron microscopy CBED convergent-beam electron diffraction DRS diffuse reflectance spectroscopy EDS energy-dispersive spectroscopy EELS electron energy loss spectroscopy ENAA epithermal neutron activation analysis EPMA electron probe x-ray microanalysis...
Series: ASM Handbook
Volume: 22B
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.hb.v22b.a0005532
EISBN: 978-1-62708-197-9
... figure measurement and electron backscatter diffraction (EBSD). The article describes the process considerations for pole figure measurement, including X-ray diffraction, neutron diffraction, stereographic projection, equal area projection, graphing pole figures, typical textures, and orientation...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
... Abstract This article provides a brief introduction to neutron diffraction as well as its state-of-the-art capabilities. The discussion covers the general principles of the neutron, neutron-scattering theory, generation of neutrons, types of incident radiation, and purposes of single-crystal...
Image
Published: 15 December 2019
resonance; FTIR: Fourier transform infrared spectroscopy; GC: gas chromatography; GC/MS: gas chromatography/mass spectrometry; IA: image analysis; IC: ion chromatography; ICP-MS: inductively coupled plasma mass spectrometry; LC: liquid chromatography; LC/MS: liquid chromatography/mass spectrometry; LEISS More
Image
Published: 15 December 2019
-ray microanalysis; ESR: electron spin resonance; FTIR: Fourier transform infrared spectroscopy; GC, gas chromatography; GC/MS: gas chromatography/mass spectrometry; IA: image analysis; IC: ion chromatography; ICP-MS, inductively coupled plasma mass spectrometry; LC: liquid chromatography; LC/MS More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... by using transmission electron microscopy (TEM) with image analysis to obtain the average diameter and length of the nanotubes. The carbon nanotube loading is also important and affects the mechanical properties as well; therefore, the residual mass of the nanotubes left after combustion...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001482
EISBN: 978-1-62708-173-3
... topography image There are several uncertainties in the modeling of free surface deformation of the weld pool. Most common for weld modeling is the paucity of temperature-dependent thermophysical property data. For the free surface deformation problem in particular, the nature of the surface tension...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001763
EISBN: 978-1-62708-178-8
..., desmearing parameters, and the types of scattering curves are illustrated. ceramics ferrous metals metallic glass nonferrous metals polymers small-angle neutron scattering small-angle X-ray diffraction Overview Introduction Small-angle x-ray scattering (SAXS) and small-angle neutron...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 24A
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.hb.v24A.a0007023
EISBN: 978-1-62708-439-0
... technique Acoustic emission testing Time-of-flight diffraction Nonlinear acoustic Eddy current testing … X-ray backscatter Radiographic testing … Neutron imaging Magnetic particle inspection … X-ray synchrotron Penetrant testing … Process-compensated resonance testing...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... 300 Å 1 nm to 10 μm 100 nm to 5 μm 0.5–1 μm (bulk); 1 nm (thin) 0.5 cm to 20 μm 1 μm with microfocus 1–4 mm 0.5–10 nm (with EELS); 3–30 nm (with EDS) Down to 10 μm with microbeam 5 mm to 75 μm (5 μm possible) Imaging capability Yes Yes Yes In SEM, EPMA, STEM Available Not normally...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., electron probe x-ray microanalysis; FTIR, Fourier transform infrared spectroscopy; IA, image analysis; IC, ion chromatography; ICP-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES...