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multiple-wavelength reflectometry

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Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001295
EISBN: 978-1-62708-170-2
... of thicknesses and optical constants for multiple films and extended wavelength ranges. MEASURING THE THICKNESS of thin films can be accomplished in many ways, but this article will focus on the optical method of single-wavelength ellipsometry (SWE) and two multiple-wavelength methods of reflectometry...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
...Common x-ray sources and properties Table 1 Common x-ray sources and properties Anode Wavelength Kα 1 , Å Applications Fluorescence from sample Mo 0.70930 Heavy absorbing samples, high penetration depth Y, Sr, Rb Cu 1.54056 Standard powder analysis, high-resolution...