The electron backscatter diffraction (EBSD) technique has proven to be very useful in the measurement of crystallographic textures, orientation relationships between phases, and both plastic and elastic strains. This article focuses on backscatter diffraction in a scanning electron microscope and describes transmission Kikuchi diffraction. It begins with a discussion on the origins of EBSD and the collection of EBSD patterns. This is followed by sections providing information on EBSD spatial resolution and system operation of EBSD. Various factors pertinent to perform an EBSD experiment are then covered. The article further describes the processes involved in sample preparation that are critical to the success or usefulness of an EBSD experiment. It also discusses the applications of EBSD to bulk samples and the development of EBSD indexing methods.

The reflected light microscope is the most commonly used tool to study the microstructure of metals, composites, ceramics, minerals, and polymers. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright-field illumination, dark-field illumination, polarized light illumination, or differential interference contract, generally by the Nomarski technique. This article concentrates on how to reveal microstructure properly to enable the proper identification of the phases and constituents and, if needed, measuring the amount, size, and spacing of constituents, using the light optical microscope. The discussion covers the examination of microstructures using different illumination methods and includes a comparison between light optical images and scanning electron microscopy images of microstructure.

This article discusses the corrosion of chromium electrodeposits and the ways for optimizing corrosion resistance. It describes processing steps and conditions for hard chromium plating. The steps include pretreatment, electroplating, and posttreatment. The article also provides information on duplex coatings and applications of chromium electrodeposits.

Integrated computational materials engineering refers to the use of computer simulations that integrate mathematical models of complex metallurgical processes with computer models used in component and process design. This article outlines an example of a computer-aided engineering tool, such as virtual aluminum castings (VAC), developed and implemented for quickly developing durable cast aluminum power train components. It describes the procedures for the model development of the VAC system. These procedures include linking the manufacturing process to microstructure, linking microstructures to mechanical properties, linking material properties to performance prediction, and model validation and integration into the engineering process. The article discusses the benefits of the VAC system in process selection, process optimization, and improving the component design criteria.

This article describes the vapor-phase growth techniques applied to the epitaxial deposition of semiconductor films and discusses the fundamental processes involved in metal-organic chemical vapor deposition (MOCVD). It reviews the thermodynamics that determine the driving force behind the overall growth process and the kinetics that define the rates at which the various processes occur. The article provides information on the reactor systems and hardware, MOCVD starting materials, engineering considerations that optimize growth, and the growth parameters for a variety of Group III-V, II-VI, and IV semiconductors.

Microjoining methods are commonly used to fabricate medical components and devices. This article describes key challenges involved during microjoining of medical device components. The primary mechanisms used in microjoining for medical device applications include microresistance spot welding (MRSW) and laser welding. The article illustrates the fundamental principles involved in MRSW and laser welding. Most multicomponent medical devices implement microjoining techniques to join various forms of materials and geometries. The article presents examples of various microjoining methods used in medical device applications, including pacemaker and nitinol microscopic forceps.

This article focuses on laboratory atomic force microscopes (AFMs) used in ambient air and liquid environments. It begins with a discussion on the origin of AFM and development trends occurring in AFM. This is followed by a section on the general principles of AFM and a comprehensive list of AFM scanning modes. There is a brief description of how each mode works and what types of applications can be made with each mode. Some of the processes involved in preparation of samples (bulk materials and those placed on a substrate) scanned in an AFM are then presented. The article provides information on the factors applicable to the accuracy and precision of AFM measurements. It ends by discussing the applications for AFMs in the fields of science, technology, and engineering.

This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents the details of SEM-based techniques and specialized SEM instruments. It ends with example applications of various SEM modes.

Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection threshold and precision, limitations, sample requirements, and the capabilities of related techniques.

This article examines the high-temperature oxidation of silica-forming ceramics under constant temperature and cyclic conditions. The effects of water vapor, impurities, and molten salts are discussed. The article describes the oxidation and corrosion of silica-forming composites, oxide ceramics, non-silica forming nitrides, carbides, and borides. The performance of environmental barrier coatings by material type is also discussed. The article also explains the effects of oxidation and corrosion on the mechanical properties of ceramic-matrix composites. It concludes with information on high-temperature applications, wear properties, and the microscopic analyses of advanced ceramics.

Diffusion is the process by which molecules, atoms, ions, point defects, or other particle types migrate from a region of higher concentration to one of lower concentration. This article focuses on the diffusivity data and modeling of lattice diffusion in solid-state materials, presenting their diffusion equations. It discusses different methods for evaluating the diffusivity of a material, including the measurement of diffusion coefficients, composition profiles, and layer growth widths. The article reviews the various types of direct and indirect diffusion experiments to extract tracer, intrinsic, and chemical diffusivities. It provides information on the applications of single-phase and multiphase diffusion.

Scanning electron microscopy (SEM) has unique capabilities for analyzing fracture surfaces. This article discusses the basic principles and practice of SEM, with an emphasis on its applications in fractography. The topics include an introduction to SEM instrumentation, imaging and analytical capabilities, specimen preparation, and the interpretation of fracture features. SEM can be subdivided into four systems, namely, illuminating/imaging, information, display, and vacuum systems. The article also describes the major criteria and techniques of SEM specimen preparation, and the general features of ductile and brittle fracture modes.

Thermomechanical are used to gain insight into the causes of problems that arise during a given thermomechanical process. This article provides examples to demonstrate how significant the parameters were selected for specific tests. It examines the types of problems that can occur during a thermomechanical process. The article provides information on the thermophysical properties, which include specific heat, coefficient of thermal expansion, thermal conductivity/diffusivity, and density. It concludes with examples that illustrate how the various considerations in testing are successfully used to solve practical thermomechanical processing problems.

This article focuses on the various technology drivers for finishing methods, namely, tolerance, consistency, surface quality, and productivity. Every finishing method may be viewed as a manufacturing system consisting of four input categories: machine tool, processing tool, work material, and operational factors. The article provides a classification of finishing as a surface generation process and addresses the characteristics of the generated surfaces and the methods used to measure them. It describes the thermomechanical interactions occurring between the processing tool and the work material in the presence of machine tool and operational factors.

This article focuses on the principles and applications of high-sputter-rate dynamic secondary ion mass spectroscopy (SIMS) for depth profiling and bulk impurity analysis. It begins with an overview of various factors pertinent to sputtering. This is followed by a discussion on the effects of ion implantation and electronic excitation on the charge of the sputtered species. The design and operation of the various instrumental components of SIMS is then reviewed. Details on a depth-profiling analysis of SIMS, the quantitative analysis of SIMS data, and the static mode of operation of time-of-flight SIMS are covered. Instrumental features required for secondary ion imaging are presented and the differences between quadrupole and high-resolution magnetic mass filters are described. The article also reviews the optimum method for analysis of nonmetallic samples and high detection sensitivity of SIMS. It ends with a discussion on a variety of examples of SIMS applications.

This article focuses on casting design in general and on sand and permanent mold aluminum casting in particular. It examines the casting design process from a variety of design and processing perspectives. Excessive design iterations can adversely impact the casting design. The article summarizes several strategies for improving the traditional casting design process. It also proposes some possible approaches for implementing these strategies. The article presents a vision for the development of comprehensive casting design guidelines along with specific development objectives.

This article describes the methods and equipments involved in the preparation of specimens for examination by light optical microscopy, scanning electron microscopy, electron microprobe analysis for microindentation hardness testing, and for quantification of microstructural parameters, either manually or by the use of image analyzers. Preparation of metallographic specimens generally requires five major operations: sectioning, mounting, grinding, chemical polishing, and etching. The article provides information on the principles of technique selection in mechanical polishing, and describes the procedures, advantages, and disadvantages of electrolytic and chemical polishing. It also provides a detailed account of procedures, precautions, and composition for preparation and handling of etchants.

This article provides an overview of common analytical tools used as part of the process of providing practical information regarding the causes of a coating problem or failure. The common analytical tools include Fourier transform infrared spectroscopy, differential scanning calorimetry, scanning electron microscopy-energy dispersive X-ray spectroscopy, chromatography, and electrochemical impedance spectroscopy. Test cabinets and standard test environments for laboratory analysis are reviewed. The article describes non-standard simulation testing and case studies of simulated environments for coating failure analysis.

This article is intended to provide the reader with a good understanding of the underlying science, technology, and the most common applications of focused ion beam (FIB) instruments. It begins with a survey of the various types of FIB instruments and their configurations, discusses the essential components, and explains their function only to the extent that it helps the operator obtain the desired results. An explanation of how the components of ion optical column shape and steer the ion beam to the desired target locations is then provided. The article also reviews the many diverse accessories and options that enable the instrument to realize its full potential across all of the varied applications. This is followed by a detailed analysis of the physical processes associated with the ion beam interacting with the sample. Finally, a complete survey of the most prominent FIB applications is presented.

This article focuses on the modes of operation, physical basis, sample requirements, properties characterized, advantages, and limitations of common characterization methods that are used to evaluate the physical morphology and chemical properties of component surfaces for medical devices. The methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive x-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, x-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy.