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microscope optimization

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006660
EISBN: 978-1-62708-213-6
... microscope and describes transmission Kikuchi diffraction. It begins with a discussion on the origins of EBSD and the collection of EBSD patterns. This is followed by sections providing information on EBSD spatial resolution and system operation of EBSD. Various factors pertinent to perform an EBSD...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006684
EISBN: 978-1-62708-213-6
... Abstract The reflected light microscope is the most commonly used tool to study the microstructure of metals, composites, ceramics, minerals, and polymers. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright...
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.a0003833
EISBN: 978-1-62708-183-2
... Abstract This article discusses the corrosion of chromium electrodeposits and the ways for optimizing corrosion resistance. It describes processing steps and conditions for hard chromium plating. The steps include pretreatment, electroplating, and posttreatment. The article also provides...
Series: ASM Handbook
Volume: 22A
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.hb.v22a.a0005427
EISBN: 978-1-62708-196-2
... microstructures to mechanical properties, linking material properties to performance prediction, and model validation and integration into the engineering process. The article discusses the benefits of the VAC system in process selection, process optimization, and improving the component design criteria...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001284
EISBN: 978-1-62708-170-2
... the overall growth process and the kinetics that define the rates at which the various processes occur. The article provides information on the reactor systems and hardware, MOCVD starting materials, engineering considerations that optimize growth, and the growth parameters for a variety of Group III...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005680
EISBN: 978-1-62708-198-6
... used in medical device applications, including pacemaker and nitinol microscopic forceps. fabrication joint design laser welding medical devices microjoining microresistance spot welding nitinol microscopic forceps pacemaker radioactive seed implant MICROJOINING METHODS are commonly...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
... Abstract This article focuses on laboratory atomic force microscopes (AFMs) used in ambient air and liquid environments. It begins with a discussion on the origin of AFM and development trends occurring in AFM. This is followed by a section on the general principles of AFM and a comprehensive...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... Abstract This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages of...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... Abstract Microstructural analysis is the combined characterization of the morphology, elemental composition, and crystallography of microstructural features through the use of a microscope. This article reviews three types of the most commonly used electron microscopies in metallurgical studies...
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.a0003842
EISBN: 978-1-62708-183-2
... information on high-temperature applications, wear properties, and the microscopic analyses of advanced ceramics. microscopic analysis advanced ceramics ceramic matrix composites high-temperature oxidation mechanical properties oxide ceramics wear properties CERAMICS are generally stable to...
Series: ASM Handbook
Volume: 22A
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.hb.v22a.a0005430
EISBN: 978-1-62708-196-2
... experimental methods are not based on Fick's law and require a microscopic model of the atomic jump processes to deduce a diffusion coefficient. Table 2 Direct and indirect methods for measuring diffusion coefficients Method Δ x D , m 2 /s Direct Lathe sectioning, grinding 0.1–250 μm...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... general features of ductile and brittle fracture modes. fractography fracture modes scanning electron microscopy specimen preparation THE SCANNING ELECTRON MICROSCOPE has unique capabilities for analyzing surfaces. A beam of electrons moves in an x - y pattern across a conductive specimen...
Series: ASM Handbook
Volume: 14A
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v14a.a0009013
EISBN: 978-1-62708-185-6
... tools can be useful in solving the type of problems listed above. Among them are reviewing tool and die design rules, using finite-element analysis, physical modeling, and metallography, including optical and scanning electron microscopes. To get information about a specific thermomechanical...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001230
EISBN: 978-1-62708-170-2
... optimize the microscopic process interactions ( Ref 8 , 9 ). Whenever possible, the finishing methods outlined in this chapter are described in terms of the four input elements, key or governing microscopic interactions, characteristic macroscopic variables, and technical and economic outputs. In this...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006683
EISBN: 978-1-62708-213-6
... silicon sample (Ref 13). The bar graph was obtained in an ion microscope using an O 2 + primary ion beam and a double-focusing mass spectrometer. The spectrum shows the presence of silicon isotopes 28 Si + , 29 Si + , and 30 Si + and thus demonstrates the isotopic sensitivity of SIMS. Also shown are...
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0009014
EISBN: 978-1-62708-187-0
.... permanent mold aluminum casting casting simulation sand mold aluminum casting casting design cost drivers structured team approach shape optimization rigging system design DESIGN is the critical first step in the development of cost effective, high quality castings. Designing a successful casting...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003244
EISBN: 978-1-62708-199-3
..., and etching (optional). THREE DISTINCT OPERATIONS are involved in determining the microstructure of metals with the use of a light optical microscope: preparation of a section surface; development of the structure on that surface, usually by chemical etching; and...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006063
EISBN: 978-1-62708-172-6
... environments for coating failure analysis. chromatography differential scanning calorimetry electrochemical impedance spectroscopy Fourier transform infrared spectroscopy laboratory corrosion testing microscopic visual examination scanning electron microscopy-energy dispersive X-ray spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
..., acuity, and fidelity that help to define our current usage of the term focused . The population of FIB instrumentation has grown steadily, and it now represents a substantial fraction of the wider “charged particle beam” family that includes scanning electron microscopes (SEMs) and transmission...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... information about the surface material and explain device performance. Through these analytical methods, the physical morphology and the chemical properties of surfaces can be characterized to develop components and processes to optimize device performance. The first step in surface characterization is to...