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Published: 01 January 2003
Fig. 10 Optical micrograph (a) and scanning electron micrograph (b) showing a cleavage fracture surface produced by cracking a zinc single crystal in liquid mercury More
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Published: 01 January 1986
Fig. 47 Optical micrograph of stainless steel tube showing a band of precipitates and cracks formed during stress-rupture testing. Arrows A and B indicate representative locations of subsequently prepared TEM specimens. More
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Published: 01 January 1986
Fig. 48 Dark-field transmission electron micrograph from specimen region containing a band of precipitate particles (region A in Fig. 47 ). Phases are identified using SAD. More
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Published: 01 January 1986
Fig. 53 TEM micrograph of a grain boundary in Al-4.7Cu aged 30 min at 250 °C (480 °F). The boundary has bowed between the two large θ (CuAl 2 ) precipitates. The dark spots indicate the probe positions during x-ray microanalysis. More
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Published: 01 January 1986
Fig. 63 Bright-field/weak-beam micrograph pair showing a dislocation tangle in deformed aluminum. Note the improved resolution of the details of the dislocation tangle in the weak-beam image (right side). The diffraction vector is g = (220) for each micrograph. More
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Published: 01 January 1986
Fig. 70 Centered dark-field micrograph of deformation twins imaged with 1 1 1 twin reflection. Thin foil TEM specimen More
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Published: 01 January 1986
Fig. 78 Typical longitudinal cross-section TEM micrograph of a subsurface region in an OFHC copper wear specimen showing the cells examined in a typical analysis. S.D., sliding direction More
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Published: 01 January 1986
Fig. 83 Invariant phase field determination using AEM. (a) Bright-field micrograph of an Ni-Cr-Mo alloy in a three-phase field region showing P, σ, and γ (austenite) phases. (b) The compositions of the three phases define the entire three-phase field triangle. More
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Published: 01 January 1986
Fig. 104 Dark-field micrograph of TiN precipitates in Ti-6Al-4V implanted with 2 × 10 17 N/cm 2 at 75 keV. Source: Ref 102 More
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Published: 01 January 1986
Fig. 32 SEM micrograph of a longitudinal section at a quenched interface showing two pearlite colonies (A and B) growing into austenite in a Fe-0.8C alloy. Electropolished surface prepared for SACP analysis. Original magnification, 1700× More
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Published: 01 January 1986
Fig. 37 Scanning electron micrograph of bridgewire showing corrosion and corrosion product. More
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