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microanalysis

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... Abstract Electron probe microanalysis (EPMA) makes it possible to combine structural and compositional analysis in one operation. This article describes the basic concepts of microanalysis and the processing of EPMA that involves the measurement of the characteristic X-rays emitted from...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001772
EISBN: 978-1-62708-178-8
... and operation, mass spectra and their interpretation, and applications of AP microanalysis. electric field field ion microscopy field ionization point defects quantitative analysis sample preparation semiconductors spatial resolution stress time-of-flight mass spectrometry Overview...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... Abstract This article is a detailed account of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... Abstract This article discusses the capabilities and limitations of various material characterization methods that assist in the selection of a proper analytical tool for analyzing particulate materials. Commonly used methods are microanalysis, surface analysis, and bulk analysis...
Image
Published: 01 January 1994
Fig. 2 Depth of information (depth resolution) and lateral resolution of surface and microanalysis techniques. AES, Auger electron spectroscopy. EPMA, electron probe microanalysis. ESCA, electron spectroscopy for chemical analysis. FIM-AP, field ion microscopy - atom probe. ISS, ion scattering More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
... Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. It provides...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
... beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001754
EISBN: 978-1-62708-178-8
... behavior. It covers the steps involved in sample preparation, including sectioning, mounting, grinding, polishing, and etching, and presents several examples of macro and microanalysis on various metals and alloys. macroanalysis metallographic sectioning microanalysis optical metallography...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... Abstract This article focuses on the visual or macroscopic examination of damaged materials and interpretation of damage and fracture features. Analytical tools available for evaluations of corrosion and wear damage features include energy dispersive spectroscopy, electron probe microanalysis...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... and during the X-ray microanalysis are reviewed. The article also provides information on the sample preparation procedure and the materials applications of the SEM. compositional contrast electron channeling pattern instrumental design material applications orientation contrast sample preparation...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003720
EISBN: 978-1-62708-177-1
..., and fatigue fracture with illustrations. It discusses microanalysis with a focus on the method of light microscopy and includes information of scanning electron microscope in fractography. The article also explains the characteristics of solidification, transformation, deformation structures...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents...
Image
Published: 31 October 2011
Fig. 3 Comparison of weld-metal dilution determined from geometric measurements and direct chemical composition measurements made by electron probe microanalysis (EPMA). Source: Ref 1 More
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Published: 01 December 1998
Fig. 23 Combined TEM imaging, electron diffraction identification, and elemental microanalysis of P, σ, and μ intermetallic phases of alloy 22 weld metal. Source: Ref 3 More
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Published: 01 December 2004
Fig. 29 Secondary electron microscopy image of dendrites and eutectic from an Al-12.7Si cast specimen. Silicon microsegregation between the dendrites of solid solution and eutectic revealed by electron probe microanalysis More
Image
Published: 01 January 2002
Fig. 6 Schematic of a complete energy-dispersive x-ray spectrometer used in electron-probe x-ray microanalysis. Various pulse processing functions and the multichannel analyzer are shown. FET, field effect transistor More
Image
Published: 31 October 2011
Fig. 28 Example of microsegregation in a weld of a niobium-bearing nickel-base superalloy. (a) Micrograph showing position of composition trace. (b) Corresponding electron probe microanalysis results showing niobium microsegregation. Source: Ref 33 , 42 More
Image
Published: 01 December 2004
Fig. 30 Microstructure at a midthickness location. Direct-chill semicontinuous cast 610 × 1372 mm (24 × 54 in.) 2124 alloy ingot. Etchant: (a) 0.5% HF. (b) Copper and magnesium microsegregation (revealed by electron probe microanalysis) across the dendrites. Source: Ref 4 More