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microanalysis

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Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001768
EISBN: 978-1-62708-178-8
... Beam energy: 20 keV Element Certified wt% EDS wt% Relative error, % WDS wt% Relative error, % Copper 76.75 77.7 1.2 76.9 0.2 Zinc 23.26 23.6 1.5 23.5 1.0 Source: Ref 5 X-ray microanalysis of reaction zone at the aluminum wire/steel screw interface shown...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001772
EISBN: 978-1-62708-178-8
..., instrument design and operation, mass spectra and their interpretation, and applications of AP microanalysis. electric field field ion microscopy field ionization point defects quantitative analysis sample preparation semiconductors spatial resolution stress time-of-flight mass spectrometry...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... of the principles of electron-excited X-ray microanalysis. It begins by discussing the physical basis of electron-excited X-ray microanalysis and the advantages and limitations of energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry for electron probe microanalysis. Key concepts...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
...Abstract Abstract This article discusses the capabilities and limitations of various material characterization methods that assist in the selection of a proper analytical tool for analyzing particulate materials. Commonly used methods are microanalysis, surface analysis, and bulk analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
..., namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis detection...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
...: Identification and mapping of light elements (atomic numbers 3 to ∼9) that are difficult to detect using SEM or electron probe microanalysis (EPMA) Elemental characterization of surface contaminants Depth profiling of elemental compositions within ∼1 μm of the surface (this is particularly widely used...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
..., electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
... microanalysis, Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... contrast. Special instrumentation and accessory equipment used at elevated pressures and during the X-ray microanalysis are reviewed. The article also provides information on the sample preparation procedure and the materials applications of the SEM. References References 1. Goldstein J.I...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003720
EISBN: 978-1-62708-177-1
... describes the macroscopic analysis of steel fracture surfaces with emphasis on ductile, brittle, and fatigue fracture with illustrations. It discusses microanalysis with a focus on the method of light microscopy and includes information of scanning electron microscope in fractography. The article also...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... in metallurgical studies, namely scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy. It briefly describes the operating principles, instrumentation which includes energy dispersive X-ray detectors, spatial resolution, typical use of the techniques, elemental analysis...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003253
EISBN: 978-1-62708-199-3
...Abstract Abstract This article describes the operation and capabilities of surface analysis methods of metals, including scanning electron microscopy, electron probe microanalysis, transmission electron microscopy, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... instrument. This is followed by a discussion on the advantages and disadvantages of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001754
EISBN: 978-1-62708-178-8
... and material behavior. It covers the steps involved in sample preparation, including sectioning, mounting, grinding, polishing, and etching, and presents several examples of macro and microanalysis on various metals and alloys. macroanalysis metallographic sectioning microanalysis optical...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006675
EISBN: 978-1-62708-213-6
... techniques (not already covered in Division 2, “Spectroscopy,” or Division 9, “Microscopy and Microanalysis,” in this Volume) are covered in this division. Some methods/techniques that have not been included in this division include: Glow discharge optical emission spectroscopy, a surface-sensitive...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
.../inert fusion analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003249
EISBN: 978-1-62708-199-3
... analysis (LECO) X-ray diffraction (XRD) Macrophotography (b) Micro Scanning electron microscopy (SEM) Electron probe microanalysis (EPMA) Transmission electron microscopy (TEM) Transmission electron microscopy (TEM) Scanning electron microscopy (SEM) (a) Metallography (MET) (b) Scanning electron...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
..., and semiconductors is divided into bulk/elemental analysis, microanalysis/structure, and surface analysis. Each of these categories is then further subdivided so that the user can follow the flow to exactly the kinds of information or analyses that he needs. Under each category only the most commonly used techniques...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
.... Method Elemental analysis Speciation Isotopic or mass analysis Qualitative analysis (identification of constituents) Semiquantitative analysis (order of magnitude) Quantitative analysis (precision of +20% relative standard deviation) Macroanalysis or bulk analysis Microanalysis (≤10 μm) Surface...