This article discusses several purposes and types of materials characterization techniques. Some of the factors to be considered when selecting appropriate characterization methods are described. The article also presents the scope and organization of this volume.

Optical metallography, one of the most common materials characterization techniques, uses visible light to magnify structural features of interest. This article discusses the use of optical methods to evaluate micro and macrostructure and relate it to process conditions and material behavior. It covers the steps involved in sample preparation, including sectioning, mounting, grinding, polishing, and etching, and presents several examples of macro and microanalysis on various metals and alloys.

Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics, electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can be solved, at least in part, with AEM.

This article is a comprehensive collection of engineering property data in tabulated form for ceramics and glasses. Data are provided for physical and mechanical properties of ceramic materials and color of ceramics fired under oxidizing and reducing conditions. The article also lists the materials characterization techniques for ceramics and glasses.

Rutherford backscattering spectrometry (RBS) is a major materials characterization technique that can provide information in a short analysis time. It is used for quantitative compositional analysis of thin films, layered structures, or bulk materials and to measure surface impurities of heavy elements on substrates of lighter elements. This article focuses on RBS and its principles, such as collision kinematics, scattering cross section, and energy loss. It describes the channeling effect and the operation of the RBS equipment. The article also provides information on the applications of RBS.

This article is a compilation of definitions of terms related to materials characterization techniques.

This article provides a general introduction of materials characterization and describes the principles and applications of a limited number of techniques that are most commonly used to characterize the composition and structure of metals used in engineering systems. It briefly describes the classification of materials characterization methods including, bulk elemental characterization, bulk structural characterization, microstructural characterization, and surface characterization. Further, the article reviews the selection of materials characterization methods most commonly used with metals.

This article briefly discusses popular techniques for metals characterization. It begins with a description of the most common techniques for determining chemical composition of metals, namely X-ray fluorescence, optical emission spectroscopy, inductively coupled plasma optical emission spectroscopy, high-temperature combustion, and inert gas fusion. This is followed by a section on techniques for determining the atomic structure of crystals, namely X-ray diffraction, neutron diffraction, and electron diffraction. Types of electron microscopies most commonly used for microstructural analysis of metals, such as scanning electron microscopy, electron probe microanalysis, and transmission electron microscopy, are then reviewed. The article contains tables listing analytical methods used for characterization of metals and alloys and surface analysis techniques. It ends by discussing the objective of metallography.

This article is a comprehensive collection of engineering tables providing information on the mechanical properties of and the techniques for processing and characterizing polymeric materials, such as thermosets, thermoset-matrix unidirectional advanced composites, and unreinforced and carbon-and glass-reinforced engineering thermoplastics. Values are also provided for chemical resistance ratings for selected plastics and metals, and hardness of selected elastomers.

This article provides an overview of how this volume is organized and structured. It describes the methods for analyzing the materials in simplified terms and emphasizes the most common applications and limitations of each method.

This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification, fabrication methods, sample preparation, bulk/elemental characterization methods, microstructural characterization methods, surface characterization methods, and electronic characterization methods.

This article introduces various analytical techniques commonly used in the characterization of organic solids and liquids and discusses the challenges in performing the analysis, with examples. Some general advice in approaching a material analysis is also provided.

This article reviews nondestructive testing (NDT) and inspection techniques, namely liquid penetrant, magnetic particle, ultrasonics, X-ray, eddy current, visual and radiography that are commonly used to detect and evaluate flaws or leaks in an engineering system. This article compares the merits and limitations of these techniques and describes the various uses of NDT, including leak detection, metrology, structure or microstructure characterization, stress-strain response determination, and rapid identification of metals and alloys.

Identification of alloys using quantitative chemical analysis is an essential step during a metallurgical failure analysis process. There are several methods available for quantitative analysis of metal alloys, and the analyst should carefully approach selection of the method used. The choice of appropriate analytical techniques is determined by the specific chemical information required, the condition of the sample, and any limitations imposed by interested parties. This article discusses some of the commonly used quantitative chemical analysis techniques for metals. The discussion covers the operating principles, applications, advantages, and disadvantages of optical emission spectroscopy (OES), inductively coupled plasma optical emission spectroscopy (ICP-OES), X-ray spectroscopy, and ion chromatography (IC). In addition, information on combustion analysis and inert gas fusion analysis is provided.

Additive manufacturing (AM) is the process of joining materials to make parts from three-dimensional (3D) model data, usually layer upon layer, as opposed to subtractive manufacturing and formative manufacturing methodologies. This article discusses various defects in AM components, such as porosity, inclusions, cracking, and residual stress, that can be avoided by using vendor recommended process parameters and approved materials. It describes the development of process-structure-property-performance modeling. The article explains the practical considerations in nondestructive evaluation for additively manufactured metallic parts. It also examines nondestructive testing (NDT) inspection and characterization methods for each of the manufacturing stages in their natural order. The article provides information on various inspection techniques for completed AM manufactured parts. The various electromagnetic and eddy current techniques that can be used to detect changes to nearsurface geometric anomalies or other defects are also discussed. These include ultrasonic techniques, radiographic techniques, and neutron imaging.

This article is an overview of the division Surface Analysis of this volume. The division covers various developed surface-analysis techniques, such as scanning probe and atomic force microscopy. The division focuses on the analysis of surface layers that are less than 100 nm. A quick reference summary of surface-analysis methods is presented in this article.

This article reviews the planning of fatigue experiments, including the structure of a test plan, randomization, and nuisance variables. The statistical characterization of the S/N (stress/life) or e/N (strain/life) response of a single material tested under a single condition is discussed. The techniques for defining a mean fatigue curve and evaluating scatter or variability about that mean are explained. The article presents the standard techniques for statistical characterization of the fatigue strength or fatigue limit of a single material by use of the Probit method, the up-and-down (staircase) method, and two-point procedures. Stress-level selection methods are also presented. The article discusses the comparison of the fatigue behavior of two or more materials for data generated at a single stress or strain level. Treatments to compare data generated over a range of stress or strain levels are included. The article also summarizes the consolidation of fatigue data generated at different conditions.

This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important attributes are listed for preliminary insight into the strengths and limitations of these techniques for chemical characterization of surfaces. The article describes the basic theory behind each of the different techniques, the types of data produced from each, and some typical applications. Also discussed are the different types of samples that can be analyzed and the special sample-handling procedures that must be implemented when preparing to do failure analysis using these surface-sensitive techniques. Data obtained from different material defects are presented for each of the techniques. The examples presented highlight the typical data sets and strengths of each technique.

Microstructural analysis of specialized types of magnetic materials is centered on the examination of optical, electron, and scanning probe metallographic techniques unique to magnetic materials. This article provides a comprehensive overview of magnetic materials, their characteristics and sample preparation procedures. It reviews the methods pertaining to the microstructural examination of bulk magnetic materials, including microscopy techniques specified to magnetic materials characterization, with specific examples. The techniques used in the study of magnetic domain structures (microstructure) include the magneto-optical Kerr method, the Faraday method, the Bitter technique, scanning electron microscopy (magnetic contrast Types I and II), scanning electron microscopy with polarization analysis, Lorentz transmission electron microscopy, and magnetic force microscopy. The article also illustrates the microstructure of different types of soft magnetic material and permanent magnets.